Showing results: 166 - 180 of 671 items found.
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Barth Electronics, Inc
Barth Electronics, Inc. offers complete ESD Testing to the semiconductor industry. Nothing is outsourced – all testing is performed at our factory in Boulder City, Nevada.
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Sonix Inc.
Sonix offers powerful microscopy analysis software to enhance packaged semiconductor imaging, accelerate production and adapt systems based on the ECHO platform to customer-specific requirements.
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ARC Technologies
ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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PIMACS CO., LTD.
ACS is an on-line chemical concentration monitoring system that can provide for keeping an uniform chemical condition by an real time measurement of chemical concentration monitoring in the manufacturing process of display and semiconductor as well as in the control industry of high-quality chemical solution control industry. The close examination and measurement of manufacturing process is an essential to produce an integrated, high quality semiconductor and FPD. The uniform and safety of input chemical on the process of cleaning and etching are directly influence on the product quality.
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Quantum Composers
We offer a full line of complete laser micro-machining heads for semiconductor applications. These systems feature an integrated DPSS Jewel ND:Yag laser incorporated into a uni-body all-in-one form factor. They also have a robust mechanical and optical design for manufacturing and repair applications. Our three models of micromachining heads are diverse enough to adjust to a variety of applications including: ablation, semiconductor FA, TFT/LCD, CF and cell LCM, and OLED repair.
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EMC Partner AG
Electrostatic discharge is a triboelectric effect caused by separation of dissimilar materials. Personal ESD generates voltages up to 30kV. Energy content is low but can damage semiconductor circuits.
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5800 -
Ametek Process Instruments
The 5800 is ideal for high-purity gas production, semiconductor gases, and the production, storage and transmission of olefins. It is suitable for use in industries including hydrocarbon processing, industrial gas and semiconductors.
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Tokyo Seimitsu Co., Ltd.
CMPs remove unevenness on wafer surfaces that occur during the production process. Applications are growing due to the increase of layers in semiconductor devices and the growing variety of wiring materials.
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KoCoS Messtechnik AG
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
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FT 1030 -
PhysTech GmbH
The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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IntelliJet® -
Nordson Corporation
The IntelliJet® Jetting System with patented ReadiSet® Jet Cartridge delivers cutting-edge reliability and micro dot dispensing for manufacturing advanced semiconductor and mobile electronics packages
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Echo -
Onto Innovation
The Echo system is a comprehensive in-line metal film metrology tool for single and multi-layer metal film measurements in leading-edge logic, memory, advanced packaging, and specialty semiconductor devices.
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DENKEN Co., Ltd.
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Test Tooling Solutions Group
Hand socket lid is normally used to run evaluation tests on semiconductor devices prior to High Volume Manufacturing mode. It can also be used as a trouble shooting tool at bench test.
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MOS Capacitance-Time Measurement and Analysis -
Materials Development Corporation
The Capacitance-Time transient resulting from an MOS device pulsed into deep depletion reveals important information about bulk properties of the semiconductor and about damage or contaminants introduced during processing.