Showing results: 226 - 240 of 671 items found.
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Del-Tron Precision, Inc.
Del-Tron’s new product line of Non-Magnetic ball slides provides the ideal solution for applications where magnetic interference cannot be tolerated. These lightweight Non-Magnetic ball slides are the perfect solution for medical, semiconductor, military and laser applications, just to name a few.
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Avalanche -
Laser Components IG, Inc.
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Laser Components IG, Inc.
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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GigaTest Labs
For popular high speed components like semiconductor packages, and test contactors, we have developed a custom test fixture which allows the use of high bandwidth microprobes to measure virtually any I/O pin, according to GigaTest's methodology and requirements.
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Z-Trak -
Teledyne DALSA
Z-Trak is a series of 3D profile sensors delivering high-resolution, real-time height measurements using laser triangulation. These lightweight IP67 rated profile sensors are ideal for in-line measurement, inspection, identification and guidance applications in automotive, electronics, semiconductor and factory automation.
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LT Laser Tools GmbH
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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UltraSort200 -
HenergySolar
The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
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GEN3000T -
Toray Engineering Co., Ltd.
GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Sonix Inc.
Sonix S-series ultrasonic NDT transducers are designed in-house to meet the demanding nondestructive testing requirements of semiconductor manufacturing. We offer the collaborative expertise to help customers choose the best ultrasonic NDT transducer for their application, based on three primary considerations.
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Sonix Inc.
Sonix S-series ultrasonic NDT transducers are designed in-house to meet the demanding nondestructive testing requirements of semiconductor manufacturing. We offer the collaborative expertise to help customers choose the best ultrasonic NDT transducer for their application, based on three primary considerations.
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HS-PSRT -
HenergySolar
It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
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Stand-Alone Metrology Family -
Nova Measuring Instruments Inc.
Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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ProPhotonix
ProPhotonix distributes Ushio ex OCLARO /Opnext, Osram, Panasonic, Sony, QSI and Ondax semiconductor laser diode products. Within this range we offer laser diodes with wide ranges of wavelengths and power outputs that suit the diverse needs of our customers.
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JetStep W2300 -
Onto Innovation
The JetStep W2300 System has been specifically designed to meet advanced packaging challenges head on. As resolution, overlay and many more technical specifications become tighter and more sophisticated for semiconductor advanced packaging processes, fulfilling lithography requirements becomes a challenge.
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E3640 -
Advantest Corp.
Ongoing semiconductor process shrinks are driving new demand for stable, highly precise measurement of pattern dimensions for photomask and wafer production. The E3640 satisfies these requirements with industry-leading precision measurement capabilities and upgraded functionality that enhances mask R&D and production efficiency.