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Si
atomic number 14 tetravalent metalloid chemical element.
- TEAM SOLUTIONS, INC.
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4-port Serial Interface, Modular, With/without Optical Isolation, 3.3V/5V, With 9-pin Connectors
APCI-7500-3/4C
*This model has 4x 9-pin D-Sub male connectors on 2 brackets*RS232, RS422, RS485, 20 mA Current Loop*Modular structure through SI modules*With or without optical isolation*Mode configuration free for each port*128-byte FIFO-buffer, common interrupt*Transfer rate programmable up to 115,200 Baud*Option: up to 1 MBaud for RS485 and RS422*Automatic direction recognition for RS48*Mode: configurable RS232, RS422, RS485, 20 mA Current Loop (active, passive) with or without isolation (SI modules)
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Si Detectors & Spectrometers
Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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16-element Si photodiode array
S12362-321
The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Ultra-Low Noise 2 kHz Photoreceiver w/ Si-PIN Photodiode
PWPR-2K-SI
Picowatt Photoreceiver series PWPR-2K with switchable gain (10 to the 9th V/A, 10 to the 10th V/A) and a bandwidth from DC to 2 kHz is the perfect choice for cw-measurements, time resolved signal acquisitions and highly sensitive modulated measurements. Si and InGaAs models cover the wavelength range from 320 to 1700 nm.
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Coating Thickness Meter
SI-1101
Coating Thickness Gauge SI 1101 is a highly intelligent and precise instrument used to quickly and accurately measure thickness of coating or plating on almost all kinds of metal surface. It not only indicates thickness of coating or plating but also automatically identifies the base material. It is applicable to measure non-magnetic painting, ceramic, enamel, plastic, rubber coating on magnetic base materials such as iron and steel , non- ferrous metal plating such as nickel & chromium, anticorrosive coating, non- conductive painting, plastic coating and anodic oxide film on non-magnetic conductive devices .
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Coating Thickness Meter
SI-1100
Coating Thickness Gauge SI 1100 is a highly intelligent and precise instrument used to quickly and accurately measure thickness of coating or plating on almost all kinds of metal surface. It not only indicates thickness of coating or plating but also automatically identifies the base material. It is applicable to measure non-magnetic painting, ceramic, enamel, plastic, rubber coating on magnetic base materials such as iron and steel , non- ferrous metal plating such as nickel & chromium, anticorrosive coating, non- conductive painting, plastic coating and anodic oxide film on non-magnetic conductive devices .
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Coating Thickness Meter
SI-1098
Coating Thickness Gauge SI 1098 is a highly intelligent and precise instrument used to quickly and accurately measure thickness of coating or plating on almost all kinds of metal surface. Technology – Magnetic Induction – (enables measurement of non magnetic coatings on magnetic substrates such as Steel, Mild Steel, Cast Iron &Magnetic Stainless Steel). Example coatings:- Paint,Zinc / Galvanising, Chrome, Copper, Enamel, Rubber, Paint, Varnish, Powder Coating, Plastic etc.
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Coating Thickness Meter
SI-1099
Coating Thickness Gauge SI 1099 is a highly intelligent and precise instrument used to quickly and accurately measure thickness of coating or plating on almost all kinds of metal surface. Technology – Magnetic Induction – (enables measurement of non magnetic coatings on magnetic substrates such as Steel, Mild Steel, Cast Iron &Magnetic Stainless Steel). Example coatings:- Paint,Zinc / Galvanising, Chrome, Copper, Enamel, Rubber, Paint, Varnish, Powder Coating, Plastic etc.
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High Voltage DC Load ISSRs
Series SI
Series SI relays are designed to switch high voltage (high power) DC loads. These devices feature the latest generation of High Voltage IGBT Technology as well as an innovative isolated driver to ensure fast power turn on and OFF. The relays feature triggered control input to avoid linear control risks and fast switching times. The relays also offer an LED for status.Available options include:SI60DC100 100A, 0-500 Vdc Load; 4.5-32 Vdc Control
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Seismometers
SI value, the so called “velocity response spectrum”, is one of the standards to express an earthquake''s destructive power against structures. SW-74SI is an advanced model equipped with alarm output to 10-step and SI value output.
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Single Port Serial Interface
APCI-7300-3
*PCI interface to the 32-bit data bus. *Asynchronous communication adapter, 1-port serial interface*1 socket for SI modules*Modular structure through SI modules*Configurable as: RS232, RS422, RS485, with or without isolation, or 20 mA Current Loop (active, passive) with isolation*Addressing through software
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Silicon Analysis in Petroleum and Bio Fuels
Signal
Signal complies with ASTM D7757 and delivers quantitative analysis of silicon (Si) from gasoline to ethanol, and toluene. Silicon contamination continues to impact fuel quality, resulting in costly engine failures and catalyst fouling. Powered by MWDXRF, Signal provides exceptional Si analysis and is an ideal solution for demanding petroleum and industrial environments.
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UV Calibration
By determining a calibration factor, which in the case of UV detectors are usually currents, can be converted into a measurand based on SI units.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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Test Pressure Gauge with Pump
We make available for our valued clients SI 3000/4000 series Test Gauges/Master GAUGES. These are made from high qualityberyllium copper bourdon tube, and provide precision movement and knife edge pointer with anti parallax. further, the range for SI 4000 series test gauges is ±0.5% FSD, while for master gauges it is ±0.25% FSD. Clients can avail these gauges at industry leading prices.
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Potentiostats
AMETEK SI offers a range of bipotentiostats, single and multi channel potentiostats and galvanostats through both the Princeton Applied Research and Solartron Analytical brands.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Fiber Optic Power Meters
FOD 1202Si
The FOD 1202 & FOD 1202Si triple wavelength power meters are reliable, rugged and hand-held test product. InGaAs & Si Version with triple wavelength calibration
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Fiber Optic Power Meters
FOD 1202H
The FOD 1202 & FOD 1202Si triple wavelength power meters are reliable, rugged and hand-held test product. InGaAs & Si Version with triple wavelength calibration
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Fiber Optic Power Meters
FOD 1202
The FOD 1202 & FOD 1202Si triple wavelength power meters are reliable, rugged and hand-held test product. InGaAs & Si Version with triple wavelength calibration
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IV Tester System
PET-CC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Lux Meters
Lux meter is used for measuring illuminances in work places.The lux is the SI unit of illuminance and luminous emittance. It is used in photometry as a measure of the apparent intensity of light hitting or passing through a surface.
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Magnetic Susceptibility Meter
SM-20
The SM-20 magnetic susceptibility meter is very useful tool for a number of geological and geophysical applications where the unique sensitivity of 10-6 SI units together with its small, shirt-pocket size and low weight are appreciated.
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AAA Solar simulator
SS50AAA-PLC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Photodiodes
Avalanche
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Avalanche Photodiodes
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Avalanche Photodiodes
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Wafer Flatness Measurement System
FLA-200
*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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DVB Analyzer
DVB Inspector
DVB Inspector is an open-source DVB analyzer, written in java. It can show the logical structure of the DVB SI and PSI data. It also shows bit rate usage data. DVB Inspector can be used to analyse contents; MPEG Video structure, teletext, DVB subtitles, DSM-CC Object carousels.
