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Silicon
atomic number 14 tetravalent metalloid chemical element.
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Networking Solutions
Bluetooth Solutions
Quickly introduce Bluetooth connectivity into sports and fitness, consumer electronics, beacons and smart home applications with easy-to-use and innovative Bluetooth SoCs, modules and software from Silicon Labs.
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Blackbody System
IR-564/301
Infrared Systems Development Corp.
The IR-564 extends the temperature range of the IR-563 to 1200 º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Networking Solutions
Wi-Fi® Modules
Silicon Labs' all-inclusive Wi-Fi module are targeted for applications where excellent RF performance, low power consumption and easy application development together with fast time to market are key requirements.
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Avalanche Photodiodes
Si APDs
Silicon avalanche photodiodes are used in the wavelength range between 250 nm and 1100 nm. The avalanche effect of these photodiodes makes them well suited for the detection of extremely weak light intensities.
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Absolute Contamination Standards (ACS)
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Digital Isolators
Silicon Labs' CMOS digital isolator products enable lower cost, smaller size, higher performance, lower power, and more reliable isolated circuits than competing optocoupler solutions. The Si80xx, Si83xx, Si86xx, Si87xx, and Si88xx families of one to six-channel bi- and unidirectional digital isolators support isolation voltage ratings up to 5 kV. With a broad product portfolio, a proven track record of industry innovation and an unwavering commitment to engineering excellence Silicon Labs isolation technology is ready to meet your isolation needs.
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Digital Solutions
Digital ST60 Thermopile (Preliminary)
A single channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. The small active area size is 0.61mm x 0.61mm.
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Manual Contactless Wafer Detector
HS-NCS-300
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Test Engineering Services
AllianceATE Consulting Group, Inc
Test and product engineering services to both large corporations and small companies who needs support in their silicon development cycle.. Full Service Test Support - Design to Test Automation - Yield Analysis.......
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Digital Solutions
Digital ST60 Dual Thermopile (Preliminary)
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 0.61mm x 0.61mm.
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Digital Solutions
Digital ST120 Dual Thermopile (Preliminary)
A two channel silicon- based thermopile in a TO-5 package that includes integrated electronics which incorporate an industry standard digital SMBus interface. Each small active area size is 1.2mm x 1.2mm.
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Spectral Response (Spectral Sensitivity) Measurement
It is used to measure the spectral response (spectral sensitivity) of photoelectric conversion devices (photodetectors / sensors) such as silicon photodiodes and CCD · CMOS image sensors . Measurement in the broadband wavelength region can be performed with low stray light.
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330 System
NSX
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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FAST SDD and C2 Window
EDS (SEM) Applications
Amptek is pleased to offer our improved line of silicon drift detectors (SDDs) for energy dispersive spectroscopy (EDS) use within scanning electron microscopes (SEMs). Using our proprietary Patented “C-Series” silicon nitride (Si3N4) X-ray windows, the low-energy response of our FAST SDD® extends down to beryllium (Be). The FAST SDD® with its high intrinsic efficiency is ideal for EDS, which is also known as energy dispersive X-ray spectroscopy (EDX or XEDS) and energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA).
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DC Input Single
DC input/single transistor output photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon phototransistor. This type is suitable for applications such as I/O interfaces and signal transmission circuits.
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Cameras
Active Silicon offers a range of autofocus-zoom block cameras. Camera features include multiple output options, compact size, global shutter, powerful zoom and our own range of Harrier cost-effective block cameras.
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Electron Microscope Analyzer
QUANTAX FlatQUAD
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Embedded Systems Projects
Precision Development Consulting Inc
Module Controller in Track System for silicon wafers, Static Headstack Tester, DOS Device Driver, LED Wafer Prober
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SiC Schottky Barrier Diode
We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.We are also employing a new material (silicon carbide: SiC) for products with even higher efficiency.
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3-5 Watt Power Amplifiers
CCM1095 and CCM2096
The CCM1095 and CCM2096 are power amplifiers that use current efficient Silicon Carbide output semi-conductors to achieve +35 to +38 dBm output power. An internal sequencing circuit is included to provide for safe operation of the output power device.
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Advanced Packaging & TSV
FilmTek 2000M TSV
Scientific Computing International
Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.
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Low Input Current
Low input current and transistor output photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon phototransistor. This type features a fast response while operating on a low input current.
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Single Channel Detectors
Teledyne Princeton Instruments
Single channel detectors are used with IsoPlane, SpectraPro and TriVista spectrometers, enabling efficient operation from UV to IR. These include three photomultiplier tubes, two silicon detectors, plus InGaAs, PbS, InSb, HgCdTe and infrared detectors.
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Manual Four Point Probe Sheet Resistance/resistivity Measurement
RT70V series
• Combinational measurement system by Measurement tester(RT-70V) & Stage.• Thickness input with easy JOG dial operation (RT-70V Tester)• Tester self-test function/Auto change-over measurement range function• Thickness & Temperature correction function for Silicon sample
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DC Input Darlington
DC input/Darlington transistor output photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon Darlington connected phototransistor. This type can operate on a low-current DC input because of its Darlington configuration.
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Force Sensor Elements
TE Connectivity (TE) enables OEMs to measure force using MEMS-based technology load cells. The same proprietary piezoresistive silicon strain gage technology used to measure pressure can also be configured into a reliable, low-cost package to measure force.
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Pressure Sensor
Through state-of-the-art silicon MEMS(Micro Electronics Mechanical System) process and assembly technology, Fujikura produces various types of piezo-resistive pressure sensor such as sensing elements, integrated sensors and modules. The products feature high-accuracy, high-reliability and cost-effectiveness.
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Semiconductor Functional Verification Tools
Trek5
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Meters For Contact Angle And Surface Tension + Semiconductor Technology, Micro Scriber
SURFTENS HL Automatic
Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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MIPI Total Display IP Solution
DSI
The Arasan MIPI Display Serial Interface (DSI) Controller IP provides both device and host functionality. Additionally, the DSI Controller provides a high-speed serial interface between an application processor and display and follows a rigorous verification methodology to ensure interoperability of our DSI digital controller with our D-PHY analog IP. Arasan’s DSI solutions are MIPI standards-compliant and are designed to accelerate integration, lower risk and accelerate time to market for developers of display applications. Arasan’s expertise is backed by our unique silicon proven design discipline and product development process that ensures fast silicon success with our analog and digital IP.
