Showing results: 1096 - 1110 of 1454 items found.
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E36154AGVX -
Keysight Technologies
The Keysight E36154AGVX consists of a Keysight E36154A DC power supply, a Keysight E36150ADVU Scope View and arbitrary waveform generation (AWG) capabilities, and a Keysight E36150ATMU Automotive Standards Testing Capabilities with Enhanced Programming Speed, ISO Preset Library, Playback Simulation and E-Logging features. The E36154A includes single-output and auto-range capabilities, 30V, 80 A, 800 W, and LAN and USB interfaces.
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LE-270GR -
LINEEYE Co., Ltd.
LE-270GR is a Communication Data Logger, which has acceleration sensor and a connector for GPS antenna. It has logger mode with which you can records CAN/LIN communication logs in the SD/SDHC card for long hours and remote mode with which you can monitor data or GPS data on the PC at real time by connecting the analyzer with PC. It also has simulation mode with which you can repeatedly transmit CAN/LIN data which is registered in advance and selected on PC. It has galvanic-isolated two CAN transceivers and two LIN transceivers. Thus you can measure 2 channels of CAN/LIN communication lines and can simultaneously register GPS positioning data, acceleration data, and voltage data of 4 external signals.
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DT-JT -
Lisun Electronics Inc.
The machine wills automatic stop positioning after sample reach up to the sated height position. According to the different size to choice the test distance between tests arms, electric pulse width. The release mechanism of machine are flexible and reliable, to ensure the sample without any external influence during the release of instant and free fall way, and make sure it meet sample’s dropping requirements. It is according to GB4757.5-84), GB/T4857.5-92, GB/T2423.5, IEC68-2-27, JISZ0202-87, ISO2248-19, ISO2248-1985(E, ASTMD5276-1998 and ISTA3A. This series drop test bench for measuring the main simulation packages in the transportation, loading and unloading process under drop impact influence, identification package impact strength and packaging design.
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ACUTRONIC Switzerland Ltd
When a device under test needs to be stimulated with simultaneous movements around three axes, then a product from the ACUTRONIC three-axis motion simulator range is the right choice. Independent motion simulation in three axes makes them very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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Hilkar
Test Laboratory Reactors are designed for high voltage and high power test laboratories. They are designed to withstand the most extreme electrical service conditions during test periods. Design techniques are implemented in accordance with the most demanding service conditions. These reactors are used for various purposes in test laboratories such as current limiting and synthetic testing of circuit breakers, capacitor testing, artificial line simulation etc.
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M+P International
m+p VibControl provides coupled and uncoupled multi-axis vibration testing (MIMO) in a closed control loop. Test modes include random, sine, shock and time domain replication (road load simulation). Multi-axis motions are characteristic of field environments. The more a vibration test can replicate the field environment, the more realistically it can induce a vibration stress loading equivalent to that experienced by the product in the field.
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Pickering Interfaces Ltd.
Our PXI Millivolt Thermocouple Simulator modules provide 32, 24, 16 or 8 channels of accurate low sources. They are ideal for the simulation of thermocouples and can be used for sensor emulation in ECU testing. The channels can be operated with one of three voltage ranges covering most thermocouple types. We can also supply connection solutions allowing the easy integration of the Thermocouple Simulator into your test system.
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PEC N.V.
In combination with the extended range of PEC test equipment, LifeTest supports the many specific functionalities required in battery testing labs. Drive cycle simulations (FUDS, DST…), thermal performance tests, high speed pulse tests (HPPT), life cycle tests, accelerated ageing tests and internal resistance measurement tests can be easily configured, scheduled, executed and reported from a single platform.
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PCITS -
Silicon Control Inc.
The CPCI850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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PCF850 -
Silicon Control Inc.
The PCF850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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OneSpin Solutions GmbH
ASIC synthesis verification from RTL code to final netlist.Systematic design errors, introduced by automated design refinement tools, such as ASIC synthesis, can be hard to detect, and damaging if they make it into the final device. Formal Equivalency Checking (EC) has become a standard part of the ASIC development flow, replacing almost all gate level simulation with a rigorous consistency check between pre- and post-synthesized code.
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Sanwood Environmental Chambers Co ., Ltd.
Cover temperature,humidity, thermal shock with rapid temperature change rate, vibration testing. The simulation product detects whether the adaptability and characteristics of the product itself have changed under the combined conditions of temperature and humidity in the climate environment (high and low temperature operation & storage, temperature cycle, high temperature and high humidity, low temperature and low humidity, condensation experiment. etc.).
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40-592A-113 -
Pickering Interfaces Ltd.
The 40-592A FIBO (Fault Insertion Break-Out) Matrix Module is a large-scale high density switching matrix based on the Pickering BRIC format. The fault insertion BRICs are designed for applications requiring the simulation of a variety of faults in complex, high pin count, applications involving sensors and control units. Typical faults that can be simulated are open-circuits, short circuits to ground or battery, or short-circuits between input/output lines.
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40-592A-104 -
Pickering Interfaces Ltd.
The 40-592A FIBO (Fault Insertion Break-Out) Matrix Module is a large-scale high density switching matrix based on the Pickering BRIC format. The fault insertion BRICs are designed for applications requiring the simulation of a variety of faults in complex, high pin count, applications involving sensors and control units. Typical faults that can be simulated are open-circuits, short circuits to ground or battery, or short-circuits between input/output lines.
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40-592A-107 -
Pickering Interfaces Ltd.
The 40-592A FIBO (Fault Insertion Break-Out) Matrix Module is a large-scale high density switching matrix based on the Pickering BRIC format. The fault insertion BRICs are designed for applications requiring the simulation of a variety of faults in complex, high pin count, applications involving sensors and control units. Typical faults that can be simulated are open-circuits, short circuits to ground or battery, or short-circuits between input/output lines.
