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Showing results: 2476 - 2490 of 3161 items found.

  • VPX, OpenVPX Rugged Platforms

    ADLINK Technology Inc.

    The Versatile Performance Switching (VPX) standard, also known as VITA 46, defines Eurocard form factor systems supporting switched fabrics over a new high speed connector. Intended for embedded systems that meet the extremely harsh environments of military applications where size, weight, and power (SWaP) are critical, ADLINK's VPX line of commercial off-the-shelf (COTS) products enable fast deployment with reduced development burden and costs compared to proprietary systems.

  • Memory Test System

    T5835 - Advantest Corp.

    The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.

  • JTAG Boundary-Scan Controller for PXI and PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot

    JT 37x7/PXI - JTAG Technologies Inc.

    High speed and performance JTAG Boundary-scan controller for PXI and PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘

  • PCI-8 AE Board

    Innerspec Technologies, Inc

    The PCI-8 is an 8-channel, PCI-based AE system on a board. Its 8 high-speed AE channels offer simultaneous AE data acquisition, waveform processing and data transfer. The board’s standard PCI form factor enables installation in standard PCs, as well as in any of Physical Acoustics’ specialized AE system chassis, while the PCI bus enables AE data transfer at speeds of up to 132 Mb/s, at a frequency range of 1 kHz to 400 kHz.

  • PXIe Vector Network Analyzer, 300 kHz to 20 GHz

    M9374A - Keysight Technologies

    Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration

  • Portable Pinhole Detector

    DZK-18 - Shanghai Dean Electrical Co., Ltd

    Online testing mode: round wireΦ0.05 -Φ5.0, flat wire B side Φ 3 - Φ 18Hand detection mode: round line diameter is not required, flat line width is not requiredTest length: 0-999 m to infinity (set by user)Detection speed: set by the userDefect short circuit current: 25±5uAResponse time: 5 ±1msWorking environment:0-40℃Relative humidity: 75% or lessOperating voltage: AC220V±5%Power consumption: <20W

  • NI-9775 , ±10 V, Up to 20 MS/s/ch, 14-Bit, 4-Channel C Series Digitizer Module

    784539-01 - NI

    The NI-9775 provides referenced single-ended analog inputs with two timing modes for applications such as fault detection in electrical transmission lines or structural failure events. You can use the NI-9775 to measure finite samples up to 20 MS/s/ch to capture fault detections or to measure continuously at up to 4 MS/s. You also can use the built-in analog reference trigger to assist with high speed phenomena. Additionally, the NI-9775 supports waveform streaming at a lower sample rate.

  • High Voltage Isolator for Logic Analyzers

    LX-08 - Link Instruments

    The LX-08 series of high voltage logic analyzer adapters provides a safe isolated method of measuring high voltage control signals with a low voltage logic analyzer. All inbound signals are optically isolated and attenuated to a safe level for the delicate inputs typically found on logic analyzers. The inputs on the LX-08 are capable of withstanding voltages up to +/- 300V AC/DC, higher voltage configurations are available upon request. Rather than probing with multiple neon screwdrivers, the LX-08 can provide simultaneous viewing of up to 8 circuits in the STANDALONE mode via the indicator array. Need to catch a transient event or map out a timing sequence? Just add a logic analyzer to the outputs of the LX-08 and turn it into a high voltage logic analyzer. High voltage signals that were hazardous for a logic analyzer can now be measured safely. Typical outputs of a high speed PLC sequencer can be precisely timed and measured from both sides of the control relay. With the built in user selectable AC filter circuit, an AC signal can be measured as DC events or AC cycles.

  • USB 3.0 Cameras With CCD

    xiD - XIMEA GmbH

    *Quality components - Sony "EXview HAD CCD II" sensors delivering 2.8, 6.1, 9.1 and 12 Mpix*Fastest - Highest speed using full 4 TAP readout potential*Industry standard interface - Compliant with USB 3.0 SuperSpeed specification*Versatile mini camera - Subtle 60 x 60 x 39 mm, 320 grams (1)*Power - Lowest power consumption starting at 3 Watt, bus powered with USB3 cable*Cool - Minimal heat dissipation with passive COOLing*Compatibility - USB 3.0 support for Windows 7 and 10, macOS, Linux, ARM and 30 Libraries*Connectivity and Synchronization - Programmable opto-isolated input and output, 3 status LEDs*Bandwidth potential - 5Gb/s interface 400Mpix/s data throughput*Software interfaces - GenICam / GenTL and highly optimized xiAPI SDK for Image Processing*High grade - Quality class of sensors is combined with specially selected IR filters *Easy deployment - Range of accessories and widest hardware and software interoperability*Highly Customizable - Available in Board level and with Peltier TE Cooling

  • USB PD Power Supply/Module ATS

    8000 Series - Chroma ATE Inc.

    The USB 3.1 specifications has three major features which are 10Gbit/s transmission speed, USB PD (Power Delivery) with support for 100 watt charging power, and the standard Type-C connector/cable that can be inserted with either side. It is expected to meet all kinds of data / video transfer applications. The advent of USB PD may consolidate the specifications of various power converters and the laptop, monitor, printer or Hub that implements USB PD is no longer a simple power-consuming device but able to supply power to other devices. The USB PD DRP (Dual role port) function allows the built-in USB PD module to deliver a maximum of 100 watts of power through the Type-C interface. To make sure the USB PD Type-C output power does not supply invalid voltage or poor power output characteristics with excessive noise that can damage the power consuming device and cause unsuccessful startup, each USB PD power supply or module has to be fully tested during production to ensure the product features meet the design specifications. This ensures high-quality products are provided to the market to gain acceptance.

  • Flash Solar Power Meter

    OAI

    OAI’s Flash Solar Power Meter is a versatile measurement tool used for measuring the irradiance (in Suns) from Flash Solar Simulators. Flash Solar Simulators are commonly used in the production of solar panels. Integrated into the solar cell production line, this meter calibrates the flash solar simulator allowing for constant and repeatable irradiance output. By sampling at speeds up to 4000 Hz, the flash pulse temporal profile can be recorded in the meter’s memory and downloaded to a USB 2.0 port on a PC for further analysis.

  • Simultaneous Wavelength Dispersive X-ray Fluorescence Spectrometer

    Simultix 15 - Rigaku Corp.

    Multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system, the Simultix 15 high-throughput WDXRF spectrometer. Analyze beryllium (Be) through uranium (U) in almost any sample matrix. The most important metrics for automated process control are precision, accuracy and sample throughput. With up to 30 (and optionally 40) discrete and optimized elemental channels and 4 kW (or optionally 3 kW) of X-ray tube power, Simultix 15 delivers unparalleled analytical speed and sensitivity.

  • Hysteresis Dynamometers

    HD Series - Magtrol Inc.

    16 Standard Models with Maximum Torque from 2.5 ozin to 500 lbin (18 mNm to 56.5 Nm)Hysteresis Braking System: Provides precise torque loading independent of shaft speedMotor Testing from No Load to Locked RotorAccuracy: 0.25% to 0.5% (Full Scale)Air Flow Sensor: For protection against overheating and operator errorStandard Torque Units: English, Metric and SIBase Plate: Available in long or short versionsCustom Dynamometers: for special torque and speed requirementsEasy Calibration

  • 10 Digit Rate/Batch Counter

    CS2-MC - Chuan Sheng Electronics Co., Ltd.

    The CS2-MC provides dual input(A/B phase) and display with high speed, counting, control and communication (Modbus RTU mode) of Pulse from encoder, proximity switch, photo switch or flow meter for counting, length and position control. There are 3 external control input (DI) in standard and the optional 4 Relay, 1 Analogue, and RS485 port available.The relays are also support N, C, R, E mode and Hi/Lo energized for batch / totalizer and position control.

  • Bipolar/FET/Diode Dual Head Production Test System

    36XX - FETservice, Inc

    Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.

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