Showing results: 1 - 15 of 63 items found.
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Smiths Interconnect
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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UWE Electronics
We differentiated the spring contact probes by center and application, for the purpose of clarity. Please choose in the left navigation bar!
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Nidec-Read Corporation
MEMS Spring Probe is developed by NIDEC-READ original ultra-fine 3D processing technology and enables our customer to supply advanced and innovative test solutions at PCB & semiconductor testing market.
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MicroContact AG
MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
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Leeno Industrial Inc.
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
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FEINMETALL GmbH
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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Equip-Test Kft.
Made for flat contacts - fully customizable - great contacting.
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SV Probe, Inc.
Wafer Level Chip Scale Package is fast becoming popular because of its small form factor utilized in such applications as Wifi, Bluetooth and GPS units. The WLCSP is also very cost-effective with a simplified manufacturing process that eliminates the need for the final or package test step..
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Teledyne LeCroy
Long spring ground for ZD differential probe Qty 2
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MicroContact AG
Frequently, manual test adapters are required for the functional and IC test. In order to contact the test subject, spring contact probes are often installed in the adapter, but the pitch of the spring contact probes is approx. 1.27 mm and thus too great for certain applications.
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Petracarbon Pte Ltd
Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.