Showing results: 781 - 795 of 1019 items found.
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AR438 -
6TL Engineering
AR438 module helps with interconnection, power supply and load switching, monophasic and triphasic, adding the current measurement capability up to 10A.Enable input helps for a safe relay disconnection. It is a quick electrical -hardware- disconnection of the relays and is designed to be an auxiliary safety element, so that loads cannot reach the device under test.
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RA 19 -
Kepco, Inc.
The 1U high rack adapter will mount four of the low profile 50W, 100W and 150W (Series HSF-1UR or HSF-1U) power supplies. Each plug-in power supply is equipped with a power on/off, indicator LEDs and voltage test points. The RA 19-1U provides access to the DIP switches and rack keying without disassembling the rack. It also provides a redundant scheme with modules 1 and 3 being powered from one a-c input and modules 2 and 4 from a second a-c input. Module numbering is left to right facing the front panel.
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MPK-203x -
MEGABRAS srl
The MPK-203x high-current micro-ohmmeter is a portable, microprocessor-controlled instrument. Has optimized filters and protections for measurements in electrical substations. Can be used to accurately measure very low contact resistances of high voltage circuit-breakers and switches, busbars, etc., with test currents up to 200A. It employs the 4 terminals-method (U/I measuring principle) to avoid errors caused by test leads and their contact resistances.
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PST-2 -
Rexus Corp.
This product is a simple tester for switching power supply. It makes it easy to test the power supply output.
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PST-1 -
Rexus Corp.
This product is a simple tester for switching power supply. It makes it easyto test the power supply output.
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PCI EmbeddedComputer Systems
The 3U power test module is an ideal solution for evaluating heat dissipation in a rugged conduction cooled VPX cage or chassis. This card is a thermal load in the chassis to evaluate the heat dissipation. The chassis can be monitored with temp sensing probes and or FLIR imaging. Different wattages are selected by setting dip switches. The +5 and 3.3V loads are on the top of the module. The +12V and -12V loads are on the bottom side of the module.
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MPK-254 -
MEGABRAS srl
The MPK-254 digital very low resistance ohmmeter is a portable, microprocessor-controlled instrument used to accurately measure resistances of switches and circuit breaker contacts, transformer and motor windings, wire and cable samples, joints in busbars, etc., using test currents from 1 mA up to 5 A.
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Pacific Instruments, Inc.
Series 6000 digital I/O modules record signals from frequency counters, flow meters, encoders, discrete transducers, IRIG time, etc. which are often part of the test environment. These digital signals are time aligned and recorded alongside the system’s analog measurements. High density digital inputs provide an opportunity to easily include facility controls like switches, valve positions, relays, lights, etc. along with the test data. Series 6000 digital I/O modules also provide outputs generated by user command or automatically by Sequence, Alarms or DSP. User generated outputs are accomplished in software while sequencers can be programmed prior to a test and initiated by program or hardware control. Alarm conditions preprogrammed on the analog side can automatically generate digital outputs which are typically connected to facility control systems or PLCs. A DSP adds powerful real-time processing and is appropriate for PID control loops, derived parameter calculations and a variety of other real-time operations.
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DP-cPCI-4305 -
Data Patterns Pvt. Ltd.
DP-cPCI-4305 is a 64-channel 1 Form A, high power relay module. This general purpose relay can be used for high power switching applications. Applications for this module include power routing, automatic test equipment, relay output for soft PLCs and bounce-free switching.
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Desco Industries, Inc.
Analog Compliance Verification Surface Resistance CheckerUse to test worksurfaces, shelving, carts, garments, chairs to ANSI/ESD S20.20 per ESD TR53Automatic Test Range Voltage Selection Per Compliance Verification ESD TR53Starts tests at 10 volts and automatically switches to 100 volts if the measurement is over 105 ohmsPortable Operation with 9 Volt Battery
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EM-6917B-1 | 30 MHz To 3 GHz -
Electro-Metrics Corp.
The EM-6917B-1, a hybrid combination of the industry standard biconical and log periodic antennas, delivers an unmatched combination of frequency coverage and high power handling capability. Featuring exceptionally broad frequency coverage of 26 MHz to 3 GHz, the EM-6917B-1 eliminates the need for adjustments or switching antennas in most test applications up to 3 GHz, and it does so without compromising power handling capability for transmit applications.
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EM-6917C-1 | 26 MHz – 1 GHz -
Electro-Metrics Corp.
The EM-6917C-1, a hybrid combination of the industry standard biconical and log periodic antennas, delivers an unmatched combination of frequency coverage and high power handling capability. Featuring exceptionally broad frequency coverage of 26 MHz to 1 GHz, the EM-6917C-1 eliminates the need for adjustments or switching antennas in most test applications up to 1 GHz, and it does so without compromising power handling capability for transmit applications.
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40-796-001 -
Pickering Interfaces Ltd.
The 40-795/796 Daisy Chain Switching Module is designed for telecom test applications. It allows production or verification testing of SONET/SDH transmission multiplexers switching 2MBit/s or 1.5MBit/s data over 100 or 120 balanced lines.
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40-664A-001 -
Pickering Interfaces Ltd.
The multiplexer is suitable for switching heavy loads or for slave switching large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of DC voltage at high current.
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40-682A-002 -
Pickering Interfaces Ltd.
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.