Showing results: 556 - 570 of 627 items found.
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S930704B -
Keysight Technologies
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930713B -
Keysight Technologies
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930707B -
Keysight Technologies
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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S930700B -
Keysight Technologies
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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NA860 -
Axiomtek Co., Ltd.
The NA860 offers a perfect mixture of performance, flexibility, and durability with server-class dual LGA3647 socket Intel® Xeon® Scalable processors and Intel® C621 chipset (codename: Purley). It is robust and highly reliable for use in a wide range of network applications such as SDN, NGFW, IDS, IPS, UTM, etc. Designed with flexibility in mind, the 2U rackmount network computing system is capable of managing numerous connected computers through an integration of up to eight expandable NIC modules which support a maximum of 66 LAN ports. These NIC modules feature support for copper, fiber, bypass, 1G/10G/40G Ethernet speeds, and hardware acceleration. The NA860 comes with twelve high-capacity DDR4-2400 R-DIMM slots with up to 384GB non-buffer non-ECC/ECC memory. Moreover, there are two hot-swappable 2.5-inch SATA HDD trays, one mSATA slot and one optional 3.5-inch SATA HDD tray for sufficient storage. Two PCIe x8 expansion slots are available for add-in cards.
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TDS AND MRC -
AMPOL Technologies Ltd.
AMPOL's TDS and MRC-150 are complete legacy solutions that can record and analyze flight data from a number of sources. These solutions are especially useful in the air for flight-test and integration phases, as well as on the ground for pre-flight tests. The TDS is a complete solution for recording and analysis of telemetry data from multiple sources. Installed on a fighter jet's wingtip, in an air-to-air missile pod, the TDS's airborne unit is sealed and has a removable, solid-state Flash disk for storage of recorded data. The system can operate either autonomously, with no outside intervention, or manually, from the cockpit. The TDS solution also includes software for off-line data analysis at the ground station. The MRC-150 is a complete solution for recording and analysis of four MIL-STD-1553 buses and one H009 bus on-board an F-15 fighter jet. Installed in the aircraft's equipment bay, the MRC-150 can either be operated autonomously, with no outside intervention, or manually, via the cockpit. The MRC-150 has already been used in hundreds of flights since its debut in 1998.
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ATE -
Frontier Electronic Systems Corp.
The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.
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FAB101 -
Axiomtek Co., Ltd.
The FAB101 features one CPU card slot and thirteen 32bit/33MHz PCI slots, and built in a 24-pin ATX power connector and 8-pin connector for thermal detected board. Furthermore, the FAB101 delivers outstanding system performance through high-bandwidth interfaces such as Serial ATA and USB 2.0 high speed peripheral (optional function). It is designed for all of PICMG 1.3 single board computers, and is a perfect fit for AXIOMTEK's SHB100 & SHB110, which are built around the PICMG 1.3 form factor. We also have various 4U-high enclosures, AX6156E, AX6156LE, AX6156LLE, AX6156LLES, AX61400, AX61491, and AX6145, to house the FAB101 and any customer's industrial integrations flexibly.
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NI
Smart Cameras combine powerful onboard processors and imaging sensors into an all-in-one vision system. Smart Camera digital I/O includes optoisolated digital inputs, optoisolated digital outputs, a RS232 serial port, and Gigabit Ethernet ports. Smart Cameras also can include built-in digital I/O and industrial communication options for dynamic, real-time communication and integration with industrial automation devices including programmable logic controllers (PLCs), human machine interfaces (HMIs), robotics, sensors, and industrial machinery. You can configure Smart Cameras with the included Vision Builder for Automated Inspection (AI) software and program the camera with the LabVIEW Real-Time Module and the Vision Development Module.
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JW8302 -
Shanghai Joinwit optoelectronic Tech,co.,Ltd
JW8302 Duplex double test Insertion/Return Loss Test Station is a professional equipment to test CWDM device, multi-wavelength device, PLC, fiber optical patch cord and other passive optical devices. It is a new-generation precision optical instrument of JOINWIT who combined with so many years experience in optical passive detection. It equipped with VFL or 850 light source , supporting threshold determination, automatic multi-wavelength detection, system integration, secondary development, upper computer solution, etc. Double LC interface or other different interfaces can be tested simultaneously which is convenient for testing and improves efficiency; The VFL function could automatic on and off, no need to replace the connector.
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EA923 -
6TL Engineering
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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S960704B -
Keysight Technologies
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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PCI325 -
Vadatech Inc
The PCI325 is an RS-422 synchronous/asynchronous multiport serial adapter. The module can accept a clock input to synchronize the baud rate generators of each port to an external clock. All the protocol management overhead is taken care of in the hardware so that the host CPU is offloaded from managing the detailed serial protocol. An I/O breakout box may be connected to the high-density connectors of the PCI325 to provide multiple DB25, DB9, or other serial connectors for easy integration to your system or an octopus-style breakout cable may be used. The I/O breakout box may include many different status LEDs which can be tailored to your protocol/application. The PCI325 provides the breakout box with power so that it does not require any additional power cabling
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S95070B -
Keysight Technologies
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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785151-01 -
NI
The ISC‑1782 is a high-performance smart camera for machine vision and is powered by a 1.58 GHz dual-core Intel Celeron processor. The combination of the onboard processor with a CMOS image sensor provides an easily distributed all-in-one system. In addition to high-performance image acquisition and processing, you can use built-in digital I/O and industrial communication options for dynamic, real-time communication and integration with industrial automation devices including programmable logic controllers (PLCs), human machine interfaces (HMIs), robotics, sensors, and industrial machinery. You can configure NI Smart Cameras with the included Vision Builder for Automated Inspection (AI) software or program the camera with the LabVIEW Real‑Time Module and the Vision Development Module.
