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Showing results: 856 - 870 of 17123 items found.

  • EUV Lithography Systems

    ASML

    Using extreme ultraviolet (EUV) light, our NXE and EXE systems deliver high-resolution lithography and make mass production of the world’s most advanced microchips possible

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  • SOI Bonding Systems

    EV Group

    An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.

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  • Light Metering System

    Isolight - Peripheral Vision, Inc.

    Peripheral Vision has developed the Isolight and Isolight Color light metering systems. The Isolight combines four photopic light sensors, a 100-LED chaser display, a flexible chart holding system, and multiple mounting options. The Isolight Color replaces the Isolight's luminance-only sensors with four full-color RGB sensors for measuring both illumination color and brightness. Both the Isolight and Isolight Color will greatly accelerate image quality testing and enhance the accuracy of your measurements.

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  • Iifrasound Monitoring System

    INFRASONITUS - BioAge s.r.l.

    The infrasonic signal, acquired by a suitable microphone, is filtered by an active low-pass filter of the fifth order with a cut-off frequency at 20 Hz, with low noise, then it is sampled and acquired by a 16-bit ADC with a speed of 50 samples. / sec. The amplification factor can be set to 0.1 / 0.5 / 1/10.The infrasonic monitoring system includes a complete diagnostic functionality that performs an exhaustive functional test without the use of other tools: this function is extremely useful when the system is installed on the volcano at high altitudes.

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  • Real-Time Location System

    RTLS - Kathrein group

    The new real-time location system „RTLS“ combines high localisation accuracy in an industrial environment with unique technical features which allow a broad use of the system in different applications. It is possible to use RTLS in complex environments for different applications. Tracking and Digitising Production and Logistics Processes manufacturing progress and a transparent material flow.The real-time data about the location and status of the objects available with the RTLS form the basis for networking the parties involved and the logistics processes in their value-added chain.

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  • Multi-Sensor Measuring System

    iNEXIV VMA-2520 - Nikon Metrology, Inc.

    The iNEXIV VMA-2520 is a new multi-sensor measuring system that's lightweight and compact enough to be used in the factory on the bench top, with fast, fully automatic and high accuracy features that make it ideally suited for a wide variety of industrial measuring, inspection and quality control applications. The iNEXIV is designed to measure 3D workpieces, is touch probe ready, integrates the latest imaging processing software and incorporates a new 10x optical zoom system and Laser Auto Focus option.

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  • Detection And Navigation System

    Ice Navigator™ - Rutter

    sigma S6 Ice Navigator™ is a radar-based system that provides enhanced ice detection, tracking and analysis. The system can identify open water leads, ice bergs and ridges in ice fields. Ice Drift Analysis (IDA) is now an optional feature of Ice Navigator that gives operators unprecedented visibility and information on the movement of ice floes within X-band radar coverage. Capital expenditure and costs typically associated with activities in ice-threatened areas, can be dramatically offset.

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  • High-performance PXI System

    M5000 Series - Keysight Technologies

    The M5000 Series forms the backbone for the Keysight Quantum Control System (QCS) – complete digital solution that eliminates the need to design custom control solutions. Analog LOs and mixers in traditional hardware used for quantum control require frequent calibration, introduce leakage noise, and contribute to slow drifts in the performance of the system. The Keysight M5000 Series fully eliminates the need for these components leading to enhanced ease-of-use, unrivaled noise performance, and improved long-term stability.

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  • Temperature Forcing System

    Wewon Environmental Chambers Co, Ltd.

    Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibration testing machine, xenon lamp aging tester, ultraviolet weather testing equipment, tensile testing machine and various IP protection level test equipment. The system characteristic of Wewon Tech thermal stream temperature test system as below technical parameters mentioned.https://www.wewontech.com/temperature-forcing-system/

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  • Memory Test System

    T5230 - Advantest Corp.

    T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.

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  • DC Power System

    24v/48v - Shenzhen Setec Power Co., Ltd.

    1. 24v/48v DC Power System has two parts, one is PFC adjust; the other is DC/DC transformation.All technology make the wide input voltage range(85v-290v).

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  • Dimensional Measurement System

    MICROLINE AF - VIEW Micro-Metrology

    The VIEW MicroLine® is a high-performance critical dimensional measurement system for wafers, masks, MEMS and other micro-fabricated devices in situations which do not require fully automated operation.

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  • System Information Gatherer

    SIGAR API - SpringSource, Inc.

    Hyperic's System Information Gatherer (SIGAR) is a cross-platform API for collecting software inventory data. SIGAR is core of HQ's auto-discovery functionality, and you can use it to extend auto-discovery behavior.

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  • Upright Microscope Systems

    Prior Scientific Inc.

    Below you can see examples of an upright microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications.

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  • Universal Imaging System

    HORIBA, Ltd.

    Laboratory 29 megapixel full spectrum imaging camera package for fingerprint work. A complete digital imaging system providing image capture, image enhancement, and image comparison.

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