Showing results: 61 - 75 of 95 items found.
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NX Hipot+ -
Dynalab Test Systems, Inc.
* 50 to 1500VDC Hipot Testing * 50 to 1000VAC (optional) * Expandable to 1024 test points * 5Mohm to 1Gohm Insulation Resistance * Simple 4-button user interface * Tests for continuity and shorts * Tests a variety of components * Precision resistance measurements * Continuous high speed scanning for real time complete status information of harness assembly progress * Keyed security access and control * Built for rough industrial environments * 2 serial ports for connection to printers and scanners * Standalone operation * Uses a high capacity memory card * Available from 64 to 1024 test points * Networkable
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RA 19 -
Kepco, Inc.
The 1U high rack adapter will mount four of the low profile 50W, 100W and 150W (Series HSF-1UR or HSF-1U) power supplies. Each plug-in power supply is equipped with a power on/off, indicator LEDs and voltage test points. The RA 19-1U provides access to the DIP switches and rack keying without disassembling the rack. It also provides a redundant scheme with modules 1 and 3 being powered from one a-c input and modules 2 and 4 from a second a-c input. Module numbering is left to right facing the front panel.
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ETF-SERIES -
Envisys Technologies
Precise Temperature Accuracies with Reliable Test Results Temperature Limits: -40/-60 °C to 30 °C Temperature Accuracies: ±2-3°C Temperature Rate of Change: 20-25 deg /min (Non-linear) Maintenance Free Access to The System Self-Sufficient System Compact with small footprints suitable for any space constraint laboratories Low decibel system Suitable for testing electronic chips / devices Environmentally friendly refrigerants Efficient heating Microprocessor based single set point PID temperature controller with data logging Flexible hose up to 2.5-3.0m Interchangeable heads according to chip size. Inbuilt electrical control panel with switchgear system
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Testing House, Inc.
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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JRE 0814-A -
JRE Test, LLC
Testing tall devices? The 0814-A stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure is ideal for testing IEEE 802.11 a,b,g devices such as; WLAN, VoIP, access points and other RF devices.
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TA-14VG -
Tech-Aid Products
The TA-14VG test fixture is based on the requirements for the Integrated Test Procedure for the VG-14A assembly as shown in the OEM maintenance manual. The panel also contains a test point breakout for the units main connector as well as one for the VG-401 base. The VG-401 breakouts provide an in series connection that will allow easy access to the gyro's signals and also provides a way to monitor rotor current. The panel also contains a variac to allow for line voltage adjustment.
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WLAN Test Toolkit -
NI
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Q1 Test, Inc.
In-circuit-testing (ICT) is usually used on mature products, especially in subcontract manufacturing. It uses a bed-of-nails test fixture to connect with multiple test points on the PCB’s bottom side. With sufficient access points, ICT can transmit test signals into and out of PCBs at high speed to apply evaluation of components and circuits.
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Eclypse International
A testing procedure designed to thoroughly test the electrical characteristics of a wire or cable, may require additional test points to connect the end points of all conductive paths. The changing and alteration of Test Adapter Cables (TACs) would become obsolete when having access to one or several expansion units. Increased testing efficiency alleviates the long, drawn out down times of the disabled aircraft while improving product readiness. Additional time can be spent on troubleshooting and problem identification and will not require the user to unhook and connect TACs to different matrices. Adding additional expansion units will save the user time, money, and effort.
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Huntron
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Test Coach Corporation
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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IST Engineering, INC.
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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WiCheck -
Alethea Communications Technologies Pvt Ltd
Use Alethea’s Distributed Architecture based WiCheck Solutions to test performance, scale, functionality, stability and interoperability of your Wi-Fi access points and networks using field like scenarios and real applications.
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JFW Industries
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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6TL Engineering
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
