Showing results: 181 - 195 of 535 items found.
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Matrix -
Marvin Test Solutions, Inc.
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Q-Card
Tests corner impact and card bending resistanceDesigned to test for MasterCard CQM and ANSI N322 requirementsEasy to useRepeatable resultsSmall footprint design for benchtop useAdjustable jaws allow use with various card thicknessesSuper heavy duty custom CNC design
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VECTOR Electronics and Technology, Inc.
Extender boards are designed to bring a circuit card completely out of a card cage or enclosure so that it can be tested or debugged. This provides access to both sides of the test board.
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PrecisionWoRx -
Onto Innovation
The PrecisionWoRx VX4 System gives test facilities and probe card manufacturers the ability to confidently test tighter pitches and smaller probe tips. The system can be easily configured to specific requirements for a variety of probe card technologies. For processes using cards with very small probe tips, the system’s high-resolution optics deliver a detailed field-of-view for high accuracy and repeatability.
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PXP-400A -
Teledyne LeCroy
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Type-39A -
ELMA Electronic, Inc.
Elma’s all-new CompacFrame platform accelerates the development and test of 3U plug-in-cards (PICs) designed according to VITA 48.8, Air Flow Through Cooling standard. The 3U card cage in the platform is tilted upwards by 5° for easier card access.
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MS 1117 -
Meltronics Systemtech
This system is used to test COMED (Combined Map Electronic Display) IFU cards. This ATE checks the LRU Status and card status and identify faulty component in the individual UUT. On fault, this suggests the possible component failure as diagnostic report, for repairing the cards.
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MS 1111 -
Meltronics Systemtech
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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EXC-1394PCI -
Excalibur Systems, Inc.
The EXC-1394PCI card for the PCI bus is an intelligent test and simulation card for interfacing to an IEEE-1394 data bus. It implements a 1394b PHY layer, operating at 100, 200, or 400 Mbps.
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EMVeriCard -
FIME SAS
EMVeriCard is an EMVCo qualified tool to test contact smart cards. The tool helps to enhance global interoperability of smart cards and prepare for certification testing for Level 1 electrical and protocol requirements according to EMVCo Common Core Definition (CCD) test plan.
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MS 1123 -
Meltronics Systemtech
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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F9 Systems, Inc.
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for logic card characterization. The card includes a HM-ZD male right angle connector segment for access to the Zone 2 connectors of a switch fabric or node card. Edge-launch SMA connectors are utilized for ease of test cable attachment. SMT pads are included on the receive pairs.
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Spectro 2 -
COMPRION GmbH
# SO/SWP terminal simulator for Smart Card testing# Test Cases for ISO, SWP and HCI# ISO/SWP/HCI/USB trace function for ensuring interoperability between a real Smart Card and a handset
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