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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Test Products & Platforms
Save yourself months of work on test specifications, component ordering, assembly and trial-and-error operation.
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Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Regenerative Battery Pack Test System
17020E
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Differential Probes < 1.5GHz
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point
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Sharp Point Tester
UI-T04
Sharp Point Tester is used to test if test object point is sharp or not. Sharp Point Tester in textile, footwear is commonly used to test ornament point sharpness. It is one of necessary safety testers widely used in toy, textile and other industries. Sharp point test standard includes EN71-1, BS7909, ASTM F963 4.9, 16CFR1500.48 and etc. This toy safety tester is purchased with sharp edge tester by most customers. Conact us for Sharp Point Tester price.
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High Voltage Test Equipment
A hipot test is conducted by ensuring no current flows from one point to another on a circuit. A hipot test will take two conductors that should be isolated from one another and passes a high voltage between the two points. The current which flows between these points is then measured. If too much current flows, this would indicate that the points are not well isolated and the test will fail.
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Differential Probes 4-6 GHz
Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point. Dx10/Dx20/Dx00A-AT 4-6 GHz differential probes are a general purpose probing solution with high input dynamic range and offset.
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Testability analysis
Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Solidifying Point Tester (-30℃)
K591
Chongqing Kailian Yongrun Industrial Co.,Ltd.
To test the solidifying point of petroleum products.
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Solidifying Point Tester (-70℃)
K591A
Chongqing Kailian Yongrun Industrial Co.,Ltd.
To test the solidifying point of petroleum products.
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Test adapter LRP-LR (Type D, 4 mm)
MA-LPL02D
Hachmann Innovative Elektronik
Our test adapter MA-LPL02D connects LR measuring devices to standardized LRP string parts and capacitive test points. An insulating tube with great dielectric strength shields the user from static energized test points without automatic earthing.
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Low Voltage Test System
CKT T1
The CKT T1 is a compact size solid-state test system featuring 128 test points.
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Melting Point Testers
These melting point testers are designed to accurately test the melting point of medium used in thermometers, for educational purposes, for quality control, automated process and more.
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Melting Point Testers
These melting point testers are designed to accurately test the melting point of medium used in thermometers, for educational purposes, for quality control, automated process and more.
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Speedometer Test Bench
TPS 25 EURO | VP 640005
Maschinenbau Haldenwang GmbH & Co. KG.
The test lane-compatible TPS 25 EURO is ideal for evaluating deviations in the speedometer speed in two-wheeled vehicles up to 1.5 t. The speedometer test can be carried out with up to ten freely selectable test points. The distance can also be measured with optionally up to ten freely selectable test points.
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Breakout Box
T1000-62HD
Our most expansive breakout box, using dual High Density 62 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 124 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity.
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LCR Meter
TH2817CX
Changzhou Tonghui Electronic Co., Ltd.
*Freq: 50HZ-100HZ, 10 frequency points*Test Accuracy: 0.1%*Test Speed: Max. 50ms
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Breakout Box
T1000-15
T1000-15 breakout box with dual 15 pin D-Sub connectors for signal capture or monitoring. Dual connectors provide a total of 30 test points plus a ground jack. All test points use standard size 4mm banana jacks. Test points may be connected using shorting banana cable to allow signal continuity. Ideal for continuity measurements, isolation testing, and signal capture.
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Automatic Transformer Test System
TH2832XA
Changzhou Tonghui Electronic Co., Ltd.
■ Number of Test PIN: 24 ■ Frequency: 20Hz-200kHz, 15025 points