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Showing results: 361 - 375 of 683 items found.

  • 30 A, 10 MHz Current Probe - AC/DC, 30 A rms, 50 A Peak Pulse, 3 Meter Cable

    CP030-3M - Teledyne LeCroy

    Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.

  • Bulk Current Monitoring Probe

    MP-50 - FRANKONIA GmbH

    The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.

  • Flying Prober Test

    QTOUCH1202C - Qmax Test Technologies Pvt. Ltd.

    he Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.The V-I signature test shall be in-built in the Prober system with “ Best fit Curve “ algorithm .Provision for adding various external Test & Measurement instruments like GPIB / USB / PXI Instruments is available.

  • Combination Board Tester

    V250 / V250PXI - Qmax Test Technologies Pvt. Ltd.

    V250 / V250PXI is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.

  • FCB Probe Card

    MPI Probe Card Technology

    The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.

  • 6TL24 Combinational Base Test Platform

    H71002400 - 6TL Engineering

    The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.

  • CAD / BOM Translation Software

    ProntoTEST-FIXTURE - Unisoft Corp.

    In minutes the Unisoft ProntoTEST-FIXTURE software translates CAD and Bill of Materials (BOM) files into real reference designators, netlists, X/Y component pin geometries, values, tolerances, part numbers, etc. This data is then used by Test Engineers to program their ATE (Agilent/Hewlett Packard "board & board x/y", Teradyne "ipl", Genrad ".ckt"), MDA, and flying probe test equipment and design the "Bed of Nails" test fixtures.

  • Partial Discharge Detector

    APD-ANNUNCIATOR - Amperis sl

    The APD-ANNUNCIATOR is a remote partial discharge detection equipment inside any energized cabinet. The probe is installed in the unit under test, instantly reporting its status. This equipment gives a great benefit because it avoids long term damage to the switching equipment.

  • Photonics Test Solutions

    Chroma ATE Inc.

    Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.

  • Logic Analyzer Probe

    FS2512 - FuturePlus Systems

    The FS2512 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs.

  • Ultrasonic Immersion Probes

    SONOSCAN I - SONOTEC GmbH

    The SONOSCAN immersion transducers for Non-destructive Testing (NDT) are mainly used to test metals and plastics for the smallest material defects. For example, binding defects, welding defects or cracks and pores in metal parts can be detected. The powerful, robust ultrasonic probes can be connected to all common ultrasonic testing devices. Due to variable designs and sizes, the immersion probes guarantee optimal use. In addition to ultrasonic standard pobes, we also offer customized transducers according to your individual specifications.

  • Automated Bare Board Tester with Built-In Camera

    QTOUCH2404C - Qmax Test Technologies Pvt. Ltd.

    Qtouch2404C – Automated Bare Board Tester with in-built camera is designed to make automatic image capturing and probing of bare PCBs. It is designed to move on X,Y,Z directions making it possible to probe every test point. Flying Probe Tester is designed for testing high density fine pitched Single Sided / Double Sided and Multilayer PCBs for continuity and isolation using moving probes fixture –less technology.

  • Digital Megohmmeter Test Kit

    STME-RT1000F - Statclean Technology (S) Pte Ltd

    This is a Resistance-Resistivity-Humidity-Temperature Test Kit. It is easy to operate, compact, lightweight, portable meter designed to measure temperature, humidity, and electrical resistance/resistivity. It has both internal and external test probes. The meter will measure resistivity, resistance between two points, and resistance to ground according to EOS/ESDAssociation Standards, -S4.1, S6.1, S7.1, S11.11, and European Standard CECC-EN 1000/15.

  • Handheld Digital Multimeter, AC/DC Voltage, Continuity, Diode, Resistance, Temperature, 3.5, 2000

    72-13435 - Tenma

    *Clear LCD Display*Equipped with comfortable protective cover, test probe holder*2m drop test, precision protection*Auto Power Off*Auto Backlight Off*Loud Buzzer Sound*Knobs shift smoothly, in-line with ergonomics*Powered by AAA 1.5V x 2 batteries*12-month limited warranty *view Terms & Conditions for details

  • Automatic Semiconductor Probe Assembly

    Insight Scientific

    This is the fully automatic semiconductor probe assembly and test equipment. It features ultra high precision in assembly process and the intelligent inspection of the finished products. This product is one of the most technologically advanced equipment by international standards in this industry and been exported to North America.Key Features: ● Assembly Precision:15um ● UPH:720 ● Visual Inspection included ● Spring Force Test

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