Showing results: 316 - 330 of 367 items found.
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eBIRST -
Pickering Interfaces Ltd.
The eBIRST toolset consists of three different tools that support 200-pin LFH, 78-pin and 50-pin connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence. These tools work by measuring the path resistance at the switching system external connectors using four-wire measurements, quickly establishing whether the path is good, has increased resistance or has failed. Below are links to various eBIRST tool information:
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779370-01 -
NI
The PCI‑7813 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7813 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware-in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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779363-01 -
NI
The PCI‑7811 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7811 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
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WAW-F Series -
Jinan Testing Equipment IE Corporation
WAW-F series single space Servo-Hydraulic Testing System Computerized is suitable for testing tension, compression and other strengths of various metallic or nonmetallic materials with high strength. The ultra-large testing space & dual-action actuator with longer stroke enable it to test not only standard specimen, but also longer ones with long elongation every so often. Equipped with the electronics, computer &software packages, it is capable of controlling the test procedures by the predetermined programs. The Servo-Hydraulic Testing System Computerized can also display, record, process and print the test results. The test curves can be drawn automatically in real time. The Servo-Hydraulic Tester of Single Space is easy to operate and is versatile in the applications of metallurgy manufacturers such as steel mills & alloy, reinforced bar, aircraft industry, research institutes, laboratories, calibration institutes etc.
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TUV Rheinland Inc
The CB scheme is an international program promoting global harmonisation and the reduction of trade barriers. Originally implemented to coordinate the acceptance of product safety test results among laboratories and certification organisations worldwide, the CB scheme provides manufacturers multiple national safety certifications for their products with a single CB certificate.The CB scheme actually consists of one single audit and certification procedure to demonstrate the safety of your electrical products to the world's most important markets. Our experts can audit your goods and support you during international product homologation. The advantage of obtaining the CB certificate, the supplemental CB report and further country-specific documents is easier access to acquiring mandated national audit seals.
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Alliance Support Partners, Inc.
Signal quality problems caused by mismatched impedance can result in intermittent measurements and faulty diagnostics. This is most often observed when transporting a test program from one system to another, such as re-hosting it from an older generation system to a new one. The primary root cause of the impedance mismatch is the signal path from the UUT to the measurement instrument. The switching system technology often is responsible for much of the distortion. The Signal Buffer Module (SBM) is designed to receive a signal from the UUT with high impedance output and accurately reproduced it at the output for delivery to the measurement instrument. The SBM output matches the 50 ohm input impedance of most measurement instruments and result in significantly reduced signal distortion.
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Testek Solutions
A partnership with Testek Solutions fits into your business because we do business like youdo business. Our partnerships are built on open communication, process transparency, and trust – trust that is built on our proven engineering design process. We assign a dedicated team consisting of a program manager who will be your single-point-of-contact, an experienced project engineer to design and oversee all engineering on the project, and any supporting engineers and manufacturing team members necessary for every project. Each test stand goes through a series of stage gates including an initial review of requirements, preliminary design review, critical design review, final design and manufacturing review, and a quality review regardless of whether you request these reviews.
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9363-LN-100 -
King Design Industrial Co., Ltd.
This tester is designed to assess the damage made to product packaging and internal objects caused from transporting environment; to discover the packaging flaw and product’s early failure from a long-term cumulative vibration fatigue; avoid man-made transporting damage and improve product’s reliability and quality of delivered products. With the use of high-performance foot absorber, the resonance effect to floor caused by the bounce test may be waived; and can reduce the pile’s destruction to industrial plants. Two displays can make comparative display on both frequency and rpm at the same time; thus no need to switch in order to read these two values. The dual-control mode of time accumulator and counter can avoid human error resulting from the conversion. Easy to operate; no need for complicate training program.
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785360-01 -
NI
The PCIe‑7822 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7822 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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785359-01 -
NI
The PCIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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785361-01 -
NI
The PCIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PCIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware-in-the-loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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SLB-Series -
Eagle Eye Power Solutions
SMART Constant Current DC Load Banks are designed for acceptance testing, discharge testing, battery capacity testing, battery maintenance, engineering examination and other testing for DC power with load. The SMART technology allows a constant current discharge without the need for manual adjustment of current during the discharge test. Our SLB-Series load banks are portable, durable, economic, safe, easy-to-use and come complete with our DataView software, providing the user with a complete data management and analysis program.
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786469-01 -
NI
The FD-11605 can measure up to eight channels with a voltage input range of ±60 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11605 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages of up to 1000 V. The FD-11605 has an ingress protection rating of IP65/IP67 (dust-tight and water-resistant),can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11605 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11605 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11605 is ideal for test cell and outdoor environments.
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785639-01 -
NI
The FD-11603 can measure up to eight channels with a voltage input range of ±10 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11603 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages. The FD-11603 has an ingress protection rating up to IP67 (dust- and water-resistant), can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11603 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11603 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11603 is ideal for test cell and outdoor environments.
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ICT IDE and Sequencer -
Konrad Technologies GmbH
The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway