Showing results: 2221 - 2235 of 2458 items found.
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MPI-525 -
Sonel S.A.
Possible measurementsShort-circuit loop measurement:*impedance measurement with 23 A current (44 A phase-to-phase) - short-circuit resistor R=10,*measurement range: 95...440 V, frequency 45...65 Hz,Short-circuit loop measurement with resolution 0,01, in distribution network without tiggering RCD (In30 mA):*automatic calculation of short-circuit, detection of phase voltage and phase-to-phase voltage,*additional UNI-Schuko plug for automatic measurement, AGT adapter for 3 phase network measurement.Testing of general and selective RCD with the rated differential current of 10,30,100,300,500 and 1000 mA. (Type AC, A and B).Measurement of insulation resistance:*with test voltage 250 V, 500 V, 1000 V, 2500 V,*measurement range up to 10G,*automatic discharging after measurement,*automatic measurement of all resistences in 3,4,5-wire cables using optional adapter AUTO-ISO,*acoustic signals in 5 sec intervals for insulation resistance characteristic,*elapsing T1, T2, T3 times (0...600 s) form measurement of absorption coefficients (DAR, PI or Ab1, Ab2)*safety measurement - protection against overvoltage.Measurement of earthing resistance.Bi-directional testing of PE wire continuity using 200 mA current.*Autocalibration of test leads.
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CNG-EbNo -
Noisecom
The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
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PAWS Developer's Studio -
Spherea Technology Ltd.
We can provide and fully support PAWS (Professional ATLAS WorkStation), the leading ATLAS development system used by most of the US and European military ATLAS based ATS. The PAWS suite includes full development systems as well as runtime only versions for executing previously developed TPS on an installed base of workshop systems.PAWS Developer's Studio gives you the power to compile, modify, debug, document, and simulate the operation of ATLAS test programs in a modern Windows environment. It offers the visual development capabilities prevalent in the marketplace today specifically tailored for ATLAS TPS development. A full range of the most commonly used ATLAS subsets is supported. A PAWS Toolkit can modify the ATLAS subset to meet the particular ATE (Test Station) configuration. Its output is ready to be executed on the associated debugging PAWS run time system.
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Environment Associates Inc.
Environment Associates can provide everything you need for cyclic durability testing and performance fixturing. Services include mechanical cycling to a position or load, fatigue cycling to a fixed load, rotational torque cycling, and simple push/pull cycling. EA can design your fixture with electro-dynamic, air, or hydraulic assistance to mechanically move your part. All of our fixtures can be manufactured to withstand a wide range of temperature, humidity and vibration inputs. If required, forces can be monitored electronically, using a wide variety of inputs (i.e. strain gages, load cells, rotational transducers, thermocouples, shunts, and more). EA can create holding and check fixtures to perform “pre” and “post” evaluation for dimensional issues that may occur during testing. EA can provide fixtures for single tests run internally for EA test labs and can manufacture fixtures to be purchased directly by the customer for their internal use.
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6310 IN -
Standard Electric Works Co., Ltd
● 2 Lines × 16 Characters LCD● Microprocessor-controlled● Tests insulation resistance up to 20 TΩ● 4 Insulation test voltages: 1000V, 2500V, 5000V, 10000V● AC / DC Voltmeter (30~600V)● Short-circuit current up to 5mA● PI (Polarization Index) indication● DAR (Dielectric Absorption Ratio) indication● Auto-ranging on all insulation ranges● Optical USB to RS-232 data transmission● Well isolated from contact● Well protected from surges● 2 built-in optical LEDs for data transfer● Visual and audio warning of external voltage presence (≥30Vac or ≥30Vdc)● Auto-hold function to freeze reading● Overload protection● Adjustable testing duration: 1~30 minutes● Internal memory for data storage● Displays testing duration for insulation measurement● Auto-off function● 200 measurement results can be saved in memory and recalled on
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6305A IN -
Standard Electric Works Co., Ltd
● 2 Lines × 16 Characters LCD● Microprocessor-controlled● Tests insulation resistance up to 10 TΩ● 4 Insulation test voltages: 500V, 1000V, 2500V, 5000V● AC / DC Voltmeter (30~600V)● Short-circuit current up to 5mA● PI (Polarization Index) indication● DAR (Dielectric Absorption Ratio) indication● Auto-ranging on all insulation ranges● Optical USB to RS-232 data transmission● Well isolated from contact● Well protected from surges● 2 built-in optical LEDs for data transfer● Visual and audio warning of external voltage presence (≥30Vac or ≥30Vdc)● Auto-hold function to freeze reading● Overload protection● Adjustable testing duration: 1~30 minutes● Internal memory for data storage● Displays testing duration for insulation measurement● Auto-off function● 200 measurement results can be saved in memory and recalled on
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6305 IN -
Standard Electric Works Co., Ltd
● High contrast OLED display● Microprocessor-controlled● Tests insulation resistance up to 10 TΩ● 4 Insulation test voltages: 500V, 1000V, 2500V, 5000V● AC / DC Voltmeter (30~600V)● Short-circuit current up to 5mA● PI (Polarization Index) indication● DAR (Dielectric Absorption Ratio) indication● Auto-ranging on all insulation ranges● Optical USB to RS-232 data transmission● Well isolated from contact● Well protected from surges● 2 built-in optical LEDs for data transfer● Visual and audio warning of external voltage presence (≥30Vac or ≥30Vdc)● Auto-hold function to freeze reading● Overload protection● Adjustable testing duration: 1~30 minutes● Internal memory for data storage● Displays testing duration for insulation measurement● Auto-off function● 200 measurement results can be saved in memory and recalled on display
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6304 IN -
Standard Electric Works Co., Ltd
● 2 Lines × 16 Characters LCD● Microprocessor-controlled● Tests insulation resistance up to 10 TΩ● 4 Insulation test voltages: 500V, 1000V, 2500V, 5000V● AC / DC Voltmeter (30~600V)● Short-circuit current up to 1.9mA● PI (Polarization Index) indication● DAR (Dielectric Absorption Ratio) indication● Auto-ranging on all insulation ranges● Optical USB to RS-232 data transmission● Well isolated from contact● Well protected from surges● 2 built-in optical LEDs for data transfer● Visual and audio warning of external voltage presence (≥30Vac or ≥30Vdc)● Auto-hold function to freeze reading● Overload protection● Adjustable testing duration: 1~30 minutes● Internal memory for data storage● Displays testing duration for insulation measurement● Auto-off function● 200 measurement results can be saved in memory and recalled on display
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783762-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783761-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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783761-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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S95090B -
Keysight Technologies
The S95090B spectrum analyzer (SA) measurement software adds high-performance microwave spectrum analysis to PXI VNAs. With fast stepped-FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The S95090B software uses the PXI network analyzer's test and reference receivers to complete simultaneous spectrum measurements. Multi-channel SA measurements leverage the PXI VNA's internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The S95090B spectrum analyzer software application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy. Optional external attenuators should be connected with the VNA’s test ports to avoid receiver compression when measuring large signals.
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AIM GmbH
AIM’s ARINC825 cards can work either with full functionality as an active CAN node for testing and simulating or in listening only mode for monitoring and recording purposes of Avionic CAN bus (ARINC825) applications on up to 4 electrically isolated CAN bus nodes concurrently. All nodes are in conformance with the ISO11898-1/-2 standard. They are accessible by software separately and can be used as 4 independent CAN bus nodes. An onboard IRIG-B time decoder allows users to accurately synchronize single or multiple modules to a common time source. All supported signals are available through front I/O and rear I/O interface. ARINC825 cards consist of FPGA based CAN interface controllers as well as a FPGA based 32-bit microcontroller core and a separate processor for IRIG-B synchronization with high resolution time stamping. All nodes are operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s with the intelligence to process scheduling of CAN frames in real time onboard to significantly off-load the host processor.For embedded applications the AMC825-4 PMC module is available in a conduction cooled version. Using AIM’s family of PCI, CPCI (3U and 6U) and VMEbus carrier cards for PMC our clients have off the shelf solutions in a broad range of card formats. ARINC825 (CAN bus) modules are delivered with an Application Programming Interface (API) and Driver Software compatible with Windows, Linux and VxWorks.An ARINC825 Resource Component is available for AIM’s PBA.pro™ databus test and analysis tool including Tx and Rx simulation capabilities, a Chronological Bus Monitor and support for decoding of payload data within CAN messages. This allows to implement a powerful ARINC825 (CAN bus) analyzer or a complete test system in conjunction with other AIM avionics databus interfaces and PBA.pro™ supported 3rd party hardware.
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Accel-RF Corporation
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
