Showing results: 1321 - 1335 of 2458 items found.
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Extech 380562 -
Extech Instruments Corporation
Compact and precise, the Extech 380562 Milliohm Meter has 7 ranges and measures down to 0.01mΩ using 4-wire Kelvin clip test leads. Measurements are displayed on the unit's large 0.8", 1999-count LCD. Built-in comparator for Hi/Lo/Go resistance testing or selection. Complete with 4-wire cables with Kelvin clip connectors and power cord.
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N7564A -
Keysight Technologies
A series of multiport ECal that cascade-able up to 36-ports which makes it possible to calibrate a wide frequency range from DC up to 20 GHz without making numerous connections during calibration process. Ideal for multiport measurement application with VNA in such as high-volume PA/FEM, massive MIMO antenna or high-speed digital interconnect test applications
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EMX-1434 -
AMETEK VTI Instruments
* 4-Channel, 204.8 Ksa/s per channel, 24-Bit DACs* -115 dB spurious free dynamic range* Integrated 2-Channel 64-bit tachometer* Integrated 4-Channel DIO* Tight synchronization with DSA analyzers* Ideal for rotational measurement, and stimulus-response applications such as vibration test* Output modes including Sine, Burst Sine, Chirp, Burst-random and continuous random
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ESR -
Rohde & Schwarz GmbH & Co. KG
The R&S®ESR is an EMI test receiver build to measure electromagnetic disturbances using conventional stepped scans or ultrafast FFT based time domain scans. It also functions as a powerful signal and spectrum analyzer. The receiver features real-time spectrum analysis with a wide range of diagnostic tools for detailed analysis of disturbance signals and their history.
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783588-01 -
NI
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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781813-01 -
NI
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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N7562A -
Keysight Technologies
A series of multiport ECal that cascade-able up to 36-ports which makes it possible to calibrate a wide frequency range from DC up to 9 GHz without making numerous connections during calibration process. Ideal for multiport measurement application with VNA in such as high-volume PA/FEM, massive MIMO antenna or high-speed digital interconnect test applications
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Instron
These three zone resistance wire wound furnaces are of split construction to facilitate fast and easy loading of a pre-assembled specimen train. The case is constructed from stainless steel with aluminium and hardened insulation board end plates. The optional front cut-out allows the use of side-entry high-temperature extensometry. Adjustable stainless steel latches keep the furnace halves locked together during use, but are then easily opened once testing is complete. The furnace is available with optional heavy duty brackets or mountings, which attach to a wide range of testing systems. An extensive range of standard controllers is available to suit most test regimes. Custom variants can be specified should the standard range not include a suitable unit.
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Amida Technology, Inc.
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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iBA -
Kaelus
Passive Intermodulation (PIM) occurs when multiple RF signals encounter defects in materials or workmanship in an RF path. These defects behave like a mixer causing noise to be generated at mathematical combinations of the original carrier frequencies. PIM interference that falls in the receive band of a wireless system elevates the noise floor resulting in high dropped call rates, call blocking, slow data transmission speeds and decreased system capacity.Kaelus is the industry leader in Passive Intermodulation test solutions. Since 1996 Kaelus has supplied RF equipment manufacturers around the world with precision IEC compliant test equipment to perform this critical test. From initial product design through high-volume manufacturing, Kaelus offers a wide range of PIM test solutions that enable equipment manufacturers to quickly and confidently verify the performance of their products.
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SCR ELEKTRONIKS
SCR ELEKTRONIKS have developed primary and secondary Current injection test trolley for Switchgear manufacturers for testing of ACB , MCB , MCCB. It is low Voltage high Current source with control circuitry, digital read out for test current and trip time measurement. We can select different links of CT range as per the required test Current.
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M9380A -
Keysight Technologies
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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Electromechanica, Inc.
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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40-137-201 -
Pickering Interfaces Ltd.
These Power Relay Modules are suitable for applications requiring power relay switching with high density. The feature 2A current and voltage to 110VDC/250VAC, they are configured as Single Pole Single Throw (SPST). Connections are made via front panel mounted 37 or 78-pin D-Type connector.Along with this 39 x SPST version, the range also includes a 32 x SPST, 2A version and a 16 x SPST, 5A version - go to Also in the Range above to learn more.Typical applications will be found in Automotive Test, Aerospace Test and Power Cell Test applications.
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40-137-101 -
Pickering Interfaces Ltd.
These Power Relay Modules are suitable for applications requiring power relay switching with high density. This version features 2A current and voltage to 110VDC/250VAC, they are configured as Single Pole Single Throw (SPST). Connections are made via front panel mounted 37 or 78-pin D-Type connector.Along with this 32 x SPST version, the range also includes a 39 x SPST, 2A version and a 16 x SPST, 5A version - go to Also in the Range above to learn more.Typical applications will be found in Automotive Test, Aerospace Test and Power Cell Test applications.