Showing results: 181 - 195 of 298 items found.
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Keysight Technologies
All three PXI-DMMs deliver market-leading speed at their price points, measuring up to 15,000 readings/s with a maximum single-reading rate of 66 µs. These fast reading speeds translate into higher test system throughput and lower cost of test. Advanced triggering, enhanced functionality, and a full suite of free software simplify system integration and operation.
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Compact SL -
SEICA SpA
This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test island. Cost reduction and high throughput guaranteed.
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Keysight Technologies
Ease system integration with Keysight System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.
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JW8506 -
Shanghai Joinwit optoelectronic Tech,co.,Ltd
JW8506-VOA Variable optical attenuator is JOINWIT specially designed for the current optical transceiver, optical network integration test. It is the test equipment with excellent performance. JW8506-VOA Variable optical attenuator through the design of high density,greatly saves equipment cover space,multi-channel independent optical attenuation provides a higher rate of test date throughput and test,the device also provides several communication interface,can support system integration with Joinwit testers. It is the ideal solution of 40G/100G optical module、optical network、optical attenuation sensitivity in optical transmission field and error rate.
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CI Systems Inc.
CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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DS8000-R -
Rigol Technologies Inc.
DS8000-R series digital oscilloscope is a compact mid-to-high-end digital oscilloscope based on RIGOL's UltraVision II platform. With a compact design, DS8000-R supports multi-machine system integration, suitable for rack installation. It also allows remote control, and meet the standards of industrial automation test systems.
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Di-Series™ -
Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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M9380A -
Keysight Technologies
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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PXIe-1149.1/4E -
Corelis, Inc.
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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Eastern-Optx
Eastern OptX now offers System Integration for all of our equipment along with other instruments including: RF, microwave, and Optical test equipment, power conditioning, distribution, and back-up, system controllers, and data recording devices. We also offer test solution development including mechanical design, rack layout, and custom control software. Eastern-OptX will help you to design and develop your test solution and deliver a completely assembled and tested system.
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Yokogawa Test&Measurement
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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6TL Engineering
Two pushers plate available for max. DUT areas: 450×450 and 500×650 mm 6tl precision servo pusher H7100 6000 is the recommended solution for PCB test systems combining Functional, In-Circuit, and Hipot Test in one fixture.It is available as a 19″ Rack atonomous module, including all drive, control and safety components for easy integration in automatic test systems using standard Mass Interconnection Receivers.
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Holzworth Instrumentation, Inc.
Holzworth's RF Synthesizers Modules were originally designed as the internal, tunable LO test sources for Holzworth phase noise analyzer products. Due to the need for easy integration, the HSM Series designs incorporate a long list of electrical and mechanical features to satisfy the demanding requirements of today's high performance communications systems and integrated test systems. FIELD PROVEN RELIABLITY with MTBFs exceeding 240kHrs.
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QuadTAP/CFM -
Corelis, Inc.
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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NI
The Software Platform Bundle provides the entire NI software portfolio for building any application. Develop applications in multiple environments, including LabVIEW Professional, LabWindows/CVI, and Measurement Studio. Extend the functionality of the LabVIEW development environment with all add-ons to perform code deployment, hardware integration, data analysis, and code validation. Build automated test systems with TestStand and real-time test systems with VeriStand.