Showing results: 286 - 300 of 5362 items found.
-
T5830/T5830ES -
Advantest Corp.
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
-
ETS-200T -
Teradyne, Inc.
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
-
TestStation LX -
Teradyne, Inc.
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
-
Tokyo Seimitsu Co., Ltd.
The automated testing equipment automatically performs charge and discharge of energy devices such as the rechargeable batteries(cells, modules, packs) that are installed in PHV/ EV and mobile devices, while measuring the voltage, current, temperature, and impedance.
-
1000 Series ATE -
Circuit Check, Inc.
The Circuit Check 1000 Series ATE provides a configurable standard platform that can utilize multiple mass interconnect interfaces while providing ease of maintenance and the ability to accept a wide variety of test fixture solutions. With the 1000 Series ATE, test procedures become automatic, with test steps and go/no-go limits easily programmable.
-
300 Series Benchtop ATE -
Circuit Check, Inc.
The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
-
T5503HS2 -
Advantest Corp.
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
-
T5835 -
Advantest Corp.
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
-
L. A. B. Equipment, Inc.
Accurately measure the fragility of products and evaluate how they respond to specific shock inputs.
-
-
Shanghai Guantu Technology Co., Ltd.
1. Safety protection: traffic light indication status, emergency stop and interlocking of the test product door2. Equipped with a computer, set the TOV power supply parameters through the software interface, and automatically test3. Equipped with alarm function, equipped with emergency brake switch, equipped with safety cover and door switch4. The computer interface displays real-time voltage and current data5. Automatically draw voltage and current waveforms, and can save the waveforms as BMP format pictures, which is convenient for editing experiment reports.6. Automatically record test time, test current, test voltage, etc., and save the recorded data to files7. Installation method: cabinet installation.
-
Chroma ATE Inc.
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
-
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.
-
52xx / 5300 -
TOPTEST GmbH
We develop and manufacture test adapters for your existing interface including documentation and test program
-
CVCT-S20 -
Vasavi Electronics
Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software . Any semi-skilled and unskilled person can be engaged for actual testing purpose. Can Select test frequency, pin number, parameters, test conditions, limits for each test. Test any pin to any other pin any defined parameter.Test Parameters :-> Inductance-> Capacitance-> AC Resistance, -> DC Resistance, -> Impedance, -> Leakage Inductance,-> Transformation Ratio & Winding PolaritySPECIFICATIONS :Measurement Frequencies : 50 Hz, 100 Hz, 500 Hz, 800 Hz; 1 KHz, 2 KHz, 5 KHz, 10 KHz. Measurement Voltage: 0.1 V – 1.0 V RMS adjustable under program control.