Showing results: 781 - 795 of 5329 items found.
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36XX -
FETservice, Inc
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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SBExpress-RM5 -
SANBlaze Technology, Inc.
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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InstrumentStudio -
NI
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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HBM-TS10-A -
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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OTS -
Optik Elektronik Gerätetechnik GmbH
The optics test stations of the OTS series enable the computer-based, software-controlled measurement of optical parameters of individual lenses (including cylindrical lenses) and optical systems. Measured variables are, for example, focal length, MTF, focal length, radius, contact dimension, centering, wedge angle and deflection angle. The optional software module LensTest enables the measurement of the center thickness of lenses and air gaps in complete lenses as well as the measurement of the centering error of individual surfaces.
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KRD14 series -
CME Technology Co. Ltd.
KRD14 series pneumatic shock response spectrum tester is used to measure and determine the shock resistance of electrical and electronic products or packaging, and to evaluate the reliability and structural integrity of the test product in a shock environment. The shock response spectrum is the total result of a series of single-degree-of-freedom linear systems with different natural frequencies subjected to the same shock excitation response. When a product is subjected to an impact, the maximum value of its impact response means that the product has a maximum stress. Therefore, the shock response spectrum tester can better simulate the shock wave and shock energy suffered in the real environment.
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HW Test
H+W (Pylon) 1280 Point Test SystemUp to eight positions for 160 Point Wiring Blocks.
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TPT69700A -
Matco Tools
*Helps locate air leaks in turbo system components by plugging the output side of the turbo and the intake inlet*Air is applied through one adapter to show the presence of leaks within the system*Six pairs of stepped adapters to fit most turbo systems on cars and light trucks
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Camp Creek Technologies, Inc.
Camp Creek Technologies, Inc. is a manufacturer of electronic equipment for the power industry. The company was founded in 2004 by Glen Singletary following 30 years of experience in the power industry, working for Duke Energy. Most of those years were in or in support of Instrumentation and Control at McGuire Nuclear Station.
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MPM-210HMPM-211, 212, 213, 215 -
Santec Corporation
Our MPM-210H is ideal for IL, WDL and PDL measurement of multi-port optical components including Dense Wavelength Division Multiplexing (DWDM), Arrayed Waveguide Gratings（AWG) , Wavelength Selective Switches (WSS) and more. When combined with our TSL-Series laser equipped with a power monitor output, the MPM-210H allows the user to complete real-time high precision IL measurements.
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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STARS HDEET -
HORIBA, Ltd.
STARS HDEET is a Heavy-Duty Engine Emission Test application available as an optional extension to STARS Automation. It provides efficient test cycle execution, emissions equipment control, results calculation and reporting, in compliance with the different legislative standards. Its flexible design offers a wide range of customization while addressing the various requirements for research and development, conformity of production, and certification testing.
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ROTO-PUSH -
Foerster Instruments, Incorporated
The ROTO-PUSH test station, which is integrated in production lines, serves to test cylindrical components for cracks in the liner surface. The testing configuration has to be rotated for automatic crack testing. After the test, the test pieces are sorted and separated. The continuous test run ensures a high testing rate, which increases profitability.
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KRD15 series -
CME Technology Co. Ltd.
KRD15 series is the state-of-the-art shock response spectrum tester that adopts compressed gas energy to provide impact energy, push the shock hammer to impact the resonance plate, and generate high energy shock. Comparing to traditional pendulum shock response spectrum tester, this machine has the advantages of high energy, stable performance, high reliability, good repeatability, easy adjustment, safety and environmental protection. It is mainly applied in the industries of aerospace, aviation and ships.
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QT-8000 Series -
PowerTECH Co,Ltd.
Tester is applicable to regularDC/AC parameter testing and IC device performance testing. Main application: Power Management; Digital Consumer Products; Communication& Interface; Automotive; Energy Conservation electronics; Standard Linear Circuit; Memory; CPU Chips; Special Customized IC and Wafer Test.
