Showing results: 7966 - 7980 of 14470 items found.
-
CA9806 -
UC Instruments, Corp.
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
-
MM513 -
McGan Technology
McGan Technology’s MM513 electrosurgical insulation defect detector is a compact, hand held, battery operated unit that tests the integrity, such as pinholes, cracks or defects, of the insulation of electrosurgical instrument in order to prevent inadvertent tissue burns which may occur during electrosurgical instrument procedures. The integrity of the insulation of electrosurgical instruments can occur over time, through normal surgical use, through the accidental contact with a sharp instrument or the rubbing of the insulation to the point of abrading it. The insulation failure provides an alternate pathway for the current to leave the instrument’s electrode usually beyond the sight of the surgeon which will result in the unintended tissue burn. Using an electrosurgical test equipment maintenance program can greatly reduce the number of these inadvertent burns during electrosurgical procedures.
-
PTE-100 -
SEICA SpA
The PTE-100 gives test personnel access to electrical signals for probing, voltage injection, isolation checks, voltage/current and time/frequency measurements, and it offers the ability to analyze hot and loaded circuits, verifying missing, corrupted or present valid signals. Furthermore, the PTE-100 offers the ability to make electrical verification activities more efficient, repeatable and safe, by introducing software controlled test sequences to reduce human errors and guide diagnostic resolution. Break Out Boxes are commonly made in-house and are often specific to a particular project. They are simply designed to multiplex connections between two units and use external instrumentation for signal injection or measurement. The end result is a multitude of tools, difficult to maintain, with limited transportability, providing costly and inefficient operations at the factory or in the field.
-
5980 Series -
Instron
5980 Floor Model Testing Systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 100, 150, 250, 400 and 600 kN; and several variations are available to accommodate requirements for both extended travel and extra wide test space.
-
Teledyne Defense Electronics
Teledyne e2v HiRel provides microelectronics packaging and products with a full range of packaging solutions from COTS to MIL-PRF-38534 compliant (Class H & K) qualifications. HiRel provides a one stop solution for your microelectronic assembly, evaluation, test and screening requirements. Our MCM packaging technology enable our customers to meet size, weight, power and cost (SWaPC) requirements without a sacrifice in performance. Our numerous certifications including AS9100, ISO 9001, and MIL-PRF-38534 Class H accreditation, all of which are integral factors in our company-wide initiative to deliver high-reliability microelectronic devices that meet our customers' stringent requirements. We are a DOD Trusted Source for Microelectronics Packaging, Assembly, and Test.
-
N4375E -
Keysight Technologies
The new N4375E single-Mode LCA is based on the latest 5222A series network analyzers with 2-port or 4-port configuration. This LCA is the ideal measurement solution for electro-optical components up 26.5GHz electro-optical components, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications. The N4375D is traceable to international standards and provides guaranteed specifications for electro-optical responsively S-parameter measurements in a turn-key solution. In combination with N4691B electronic calibration kit you get fastest setup of your test, so you can focus on developing your components. The new N4375D replaces the industry standard 8703A/B series and supports specified modulation frequencies up to 26.5 GHz at 1310nm and 1550nm source wavelength or individual wavelength with external optical input.
-
UX400 -
VeEX Inc.
The VeEX UX400 is the smallest multi-service transport test solution to offer test capabilities ranging from DS1/E1 all the way up to 6x 100G traffic generation, supporting the latest 100G/40G optical pluggable form factors (CFP4, CFP2, CFP, QSFP28, QSFP+, no adapters required). Its modular architecture allows for up to six independent test modules and up to twelve concurrent tests or combinations of tests, including legacy PDH/DSn, SDH/SONET, OTN, Ethernet, Fibre Channel, CPRI/OBSAI, C/DWDM spectrum analysis and more. The platform's software architecture has been developed so that multiple users or scripts are able to access and operate different test modules at the same time, maximizing the use of resources. A battery backup option is available for the portable UX400 platform. Test modules can also operate in a standard 19" rack – the UX400R, when portability or battery operation is not needed.
-
IST Engineering, INC.
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
-
93-970-301 -
Pickering Interfaces Ltd.
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
93-005-236 -
Pickering Interfaces Ltd.
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
93-006-222 -
Pickering Interfaces Ltd.
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
93-006-401 -
Pickering Interfaces Ltd.
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
93-015-103 -
Pickering Interfaces Ltd.
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
93-012-103 -
Pickering Interfaces Ltd.
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
MICRONICS JAPAN CO.LTD.
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
