Showing results: 1711 - 1725 of 5300 items found.
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Rohde & Schwarz GmbH & Co. KG
For demanding computational tasks, Rohde & Schwarz offers the versatile, flexible equipment you need for everyday use – from the system controller and switch unit to the test chamber. All feature excellent EMC shielding, reliable test results and modular solutions.
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NorCom 2020-WL -
NorCom Systems Inc.
The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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1630-2 -
Fluke Corporation
The 1630-2 FC clamp measures earth ground loop resistances for multi-grounded systems using the dual-clamp jaw. This test technique eliminates the dangerous and time-consuming activity of disconnecting parallel grounds, as well as the process of finding suitable locations for auxiliary test stakes.
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698 -
Electronic Specialties Inc.
Unit is designed for use with digital multimeters,lab scopes or graphing meters. With 1000 Amp capabiltiy, this instrument can be used to test starting and charging systems. It can even be used to test relative compression when used with your lab scope or graphing meter.
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KATC-V2 -
TESCO
Knopp’s KATC-V2 is a highly accurate state-of-the-art voltage transformer comparator that is compatible with all older generation Knopp comparators, and is designed to be a direct, plug-in replacement with additional test set cables to fit in the existing Knopp Voltage Transformer Test Systems.
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781887-01 -
NI
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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SCR ELEKTRONIKS
SCR ELEKTRONIKS focuses on designing a solution around the end use at her customer. Instead of offering a standard instrument for a specific task, we have an approach of customizing the test bench to target the specific goals of the process or test procedure. Our measurement instruments, test modules, electrical power systems & software libraries are developed with this vision, thereby reducing the test system’s time-to-deploy. Cord Grip Test Apparatus for testing effectiveness of the retention in flexible cables.
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ScanExpress DFT Analyzer -
Corelis, Inc.
Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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SPEA S.p.A.
SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of Bench-top Xenon Lamp Test Chamber, Bench-top Xenon lamp aging test chamber, Bench-top xenon lamp weathering test chamber ,Xenon Lamp Test Chamber, Xenon Test Chamber manufacturers Small, simple and economic xenon test chamber. It uses a low power air-cooling xenon lamp to produce enough big irradiance energy in a small space. Moreover, through a special catoptrical system to ensure every exposure sample get the homogeneous irradiance distribution.
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Teledyne Defense Electronics
The Emergency Interseat Sequencing System (EISS) was designed an qualified for the F-15K Fighter and has since been installed in the F-15SG and F-15SA configurations of the F-15. The system consists of Thermal Batteries with Initiators, a Digital Interseat Sequencer, Mode Selector, and customer provided cabling Electro-Explosive Devices (EEDs). The system is operated from either thermal battery and aircraft 28Vdc for redundancy. A separate field Test Set (EESSTS) performs both complete system continuity tests and an operational test of the total system installed in the aircraft. The sequencer is programmable and could be used in any escape system.Based on the initiation point, Forward or Aft Seat Handle, Internal or External Canopy Jettison Handles, and the Mode Selector setting, the Sequencer provides firing pulses to the EEDs to support canopy removal, ejection seat inertial reel activation(s) and ejection seat catapult firing(s). Sensing capabilities are provided to determine system state, canopy gone, seat gone, so as to provide the optimum escape timing.
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PITC -
Bemco Inc.
The PITC, with a temperature range of -70 C to +177 C, was first introduced in the late 1950s by Bemcos Conrad/Missimer Division. Today, the modernized version of this system is the ideal solution where short run or infrequent tests are required, test specimens are unusual in size or shape, initial capital costs must be held low, or test needs are frequently changed.
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40-682A-002 -
Pickering Interfaces Ltd.
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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40-681A-001 -
Pickering Interfaces Ltd.
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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40-683A-001 -
Pickering Interfaces Ltd.
The 40-683A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 125mA current and 100V voltage handling. The 40-683A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.