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Showing recent results 4351 - 4365 of 4656 products found.

  • Stimulus Induced Fault Testing

    SIFT - FA Instruments

    SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

  • Strength Meter

    NOVOTEST IPSM-U+T+D (Pulse Velocity Tester) - NovoTest

    The pulse velocity tester IPSM-U+T+D allows to measure the strength and homogeneity of the concrete, bricks and other materials under the composition and surface sounding in products and designs for construction projects, inspection of buildings and structures, according to ASTM C597-16 (Standard Test Method for Pulse Velocity Through Concrete).  Has the determining of the depth of cracks by the surface sounding probe function and also flaw detection mode (A-scan).

  • Signal Level Meters

    GAO Tek Inc.

    GAOTek offers a wide range of high performance and inexpensive TV and CATV signal level strength meters. TV signal strength meters and testers are required when installing or maintaining analog TV and digital TV systems and closed CCTV systems. The devices can effectively and accurately measure the analog channels and digital channels signal strength and are the preferred choice of TV installation technicians.

  • Software

    ITS Lite - BAUR Prüf- und Messtechnik GmbH

    The BAUR software ITS Lite is used to read, design and archive measurement logs of the DPA 75 C, DTA 100 C, DTA 100 C, DTL C BAUR oil testers. Automatic archiving of measurement logs in PDF format and as text file (*.txt) Structured storage and allocation of measurement logs Customised layout of measurement logs Fast and uncomplicated access to measurement data

  • Software

    TFT Test Systems - Materials Development Corporation

    Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.

  • Software - IDEAL Data CENTER

    IDC - IDEAL NETWORKS

    IDEAL Data CENTER (IDC) is the test result management software for LanTEK III cable certifiers from IDEAL Networks. IDC allows data cable installation professionals to easily download, manage, edit and print pdf reports. IDC offers a simple user interface with time saving features including; Microsoft ribbon toolbars; 4 button clicks to import data from the tester and 3 simple steps to create a professional report. IDC is the fastest management software from IDEAL Networks.

  • Surface Analysis

    Bruker AXS GmbH

    Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surface Analysis

    Bruker Corporation

    Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surface Analysis

    Bruker Daltonics

    Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surface Analysis

    Bruker Nano Analytics

    Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.

  • Surge / DC Hi-Pot Consoles

    HC Model - PJ Electronics, Inc.

    (Surge / Hi-Pot Consoles) - Now available in High Voltage models - 35,40 & 50KV. The HC Model offers Surge / DC Hi-Pot testing capabilities! The "HC" Model has all of the features of our "C" Model plus a DC Hi-Pot Tester. DC Hi-Pot includes dual LED panel meters that display direct read out of current and voltage, with overcurrent safety trip and the capability of ascertaining Polarization Index (PI) Test results.

  • DiodeTester

    FECPLS500 - Frothingham Electronics Corporation

    The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.

  • Dimensional Calibration

    Alliance Calibration

    123 BLOCKS ANGLE BLOCKS BALL BAR BORE GAGE CALIPERS CHAMFER GAGES CMM'S COATING THICKNESS GAGES CYLINDER PLUGS DEPTH GAGES GAGE BLOCKS GO-NO-GO GAGES HARDNESS TESTERS HEIGHT GAGES INDICATORS LENGTH STANDARDS LEVELS MICROMETERS OPTICAL COMPARATORS PARALLELS PIN GAGES PROFILOMETERS RADIUS GAGES ROUGHNESS SPLINES THREAD RINGS THREAD PLUGS

  • DIGITAL LC METER

    LC200 - GME Technology

    The LC200 Digital Capacitance and Inductance Tester features a large 3.5 digit LCD display and 12 total ranges (7 ranges for capacitors and 5 ranges for inductors), also supplied with yellow rubber holster and test leads. Highly accurate with Auto-Zero adjusts and overloads indication. It is a very handy piece of test equipment for general trouble shooting and component testing.

  • DUT Prototype Board

    DPB8800 - Applied Test Resources

    The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.