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Showing results 4471 - 4485 of 4568 products found.

  • Twin columns automated force test stand 48" travel - 5000 lb

    705TN - Com-Ten Industries

    The advanced 705TN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.

  • Twin columns automated force test stand 48" travel - 20,000 lb

    720TN - Com-Ten Industries

    The advanced 720TN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.

  • Twin columns automated force test stand 36" travel - 10,000 lb

    710SN - Com-Ten Industries

    The advanced 710SN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.

  • Voltage Breakdown Testing Machine

    DRK218 - Shandong Drick Instruments Co., Ltd.

    DRK218 breakdown voltage tester is controlled by the computer, through a new smart digital integrated circuits developed by my company and software control system to make the step-up rate is truly uniform, accurate, and be able to accurately measure the leakage current data. Real-time rendering test curve accurate judgment and it can save, analyze and print test data.

  • LED Analyser

    Feasa - Intrinsic Quality,Inc

    Each LED Analyser allows for simultaneous measurement of up to 20 different light sources as it measures Color and Intensity – Brightness Test. Light from the LEDs is transferred by Plastic Optical Fibers and transported to the LED Analyser board for accurate measurement and analysis. The Feasa Analyser has been engineered to test LED’s and other lighting devices such as LCD Displays automatically. Intrinsic Quality offers a LED tester demo unit that can be tried out for two weeks free of charge. Currently available for purchase, call to order:

  • Bluehill HV

    Instron

    Bluehill® HV Software is specifically designed for the Instron® HDT and Vicat testers, both of the previous and current generations. Bluehill® HV enhances the ease of use of the testing system. The user can run tests, edit methods, analyze results or configure the system with a few clicks. The simplicity of the software allows the user to run tests with minimal effort increasing the laboratory efficiency and throughput.

  • CEAST VisualMELT Software

    Instron

    VisualMELT Software is designed to control all the functions of the Modular Melt Flow Systems, from single-weight to multiple-weight tests. The software enables the user to manage all optional equipment, including the load cell, the automatic cutting device, and the motorized weight lifter. When working with a multi-weight tester, it is possible to set up and control single-weight or multi-weight tests, as well as define the order and number of weights to be applied.

  • Impedance Meter, Audio, 200Ω, 2KΩ and 20KΩ scales

    72-6948 - Tenma

    Audio impedance tester with 2000 count display.*3 test ranges (200/2K/20Kohm) allow testing of home theatre and commercial sound systems*Convenient portable battery operation*Rotary switch for range selection*Zero adjustment knob*Timer function provides continuous hands free operation*12-month limited warranty *view Terms & Conditions for details

  • C++ Test Aider

    Testwell CTA++ - Verifysoft Technology GmbH

    Testwell CTA++ is a tool for unit testing C++ classes, libraries and subsystems. The tool is easy to use and provides very powerful features helping the tester to build the testing environments and running the tests on C++ code. Testwell CTA++ is used for building testing environments, test beds, for the code under test (C++ classes, libraries, subsystems, APIs) and then executing the tests with the test bed.

  • DC Hipot test set

    ZGF Series - Wuhan Nanrui Electric Co,. Ltd

    The new generation portable ZGF DC Hipot test sets also named DC high voltage generator, it is based on the latest national electric standard DL/T848.1-2004 "The technical specification of DC hipot tester". ZGF DC hipot test sets are mainly used in the electric power sector, mining, metallurgy, steel and other power companies for DC hipot testing on MOA, power cables, transformers, generators and other electrical equipment.

  • Protection Relay Test Set

    NR Series - Wuhan Nanrui Electric Co,. Ltd

    NR Series Protection Relay Test Set is based on "microprocessor-based relay test device technology (discussion paper)" issued by Electric Power Department , and adopted varies views of the users, summarized the current strengths and weaknesses of the domestic similar products , and also have a full usage of modern advanced microelectronic technology and devices to achieve a new type of smart relay protection tester.

  • Electrical Testing Kit

    TTK-EL - Triplett

    Model 9007, DMM (PN 9007). Model 9310-A, AC/DC Clamp-On (PN 9310). Plug-Bug 2, GFCI Receptical Tester (PN 9610). Sniff-It 2, AC Voltage Detector (PN 9601). Professional AutoLoader Multi-Bit Screwdriver (PN TPAL-001). Breaker Sniff-It, Circuit Breaker identifier (PN 9650). Blow-Molded Carrying Case with Foam Insert.

  • Maintenance Test Kit

    TTK-MT - Triplett

    Model 9045, True RMS DMM w/ Temp, Capac. & Resistance (PN 9045). Model 9310-A, AC/DC Clamp-On (PN 9310). TDR, Cable Length Meter / Fault Finder (PN 3271). Plug-Bug 2, GFCI Receptical Tester (PN 9610). Sniff-It 2, AC Voltage Detector (PN 9601). Professional AutoLoader Multi-Bit Screwdriver (PN TPAL-001). Breaker Sniff-It, Circuit Breaker identifier (PN 9650). Blow-Molded Carrying Case with Foam Insert.

  • H/L Voltage Clamp Meters

    MEWOI Electronics Co.,ltd

    High Voltage Current Transformation Ratio Tester breaks traditional structure, specially designed for high and low voltage first and secondary loop current, variable ratio, and current leakage test; apply the latest CT technology and mask digital integration technology, composed of special high-voltage clamp, low voltage clamp, host, high voltage insulation rod and monitoring software, etc; its wireless transmission test data can penetrate multiple building obstacles with a straight-line distance of 30 meters.

  • Post Silicon Validation Solutions

    Test Evolution Corporation

    Post-silicon validation (PSV) of first silicon tends to be an ad hoc process, stitching together protocol testers from various manufacturers to create test cases and debug issues. While IC’s are getting to market, the process is far from ideal. Leveraging the tools and methodology of pre-silicon verification into post-silicon validation is a key enabler to higher productivity. Test IP-based PSV is a paradigm shift from the way post-silicon validation is currently done. Individual protocol testers, scopes, miscellaneous equipment from various vendors, and on-chip logic are cobbled together in an attempt to create meaningful stimulus, response checking, and debugging.The problems with these ad hoc solutions:Protocol boxes from multiple vendors generally do not work together well. Each has its own driver software, programming model and debugging tools.Tool flows from pre-silicon to post-silicon to production and back are nonexistent. This makes writing tests challenging and thus generally limited in robustness. Also, debugging suspected problems is difficult across more than one interface.