Showing results: 5056 - 5070 of 5310 items found.
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Extech CT70-AC -
Extech Instruments Corporation
Circuit and wiring issues can introduce shock hazards (from grounding issues) and can compromise performance of machinery and equipment, from poor ground impedance, lack of sufficient voltage under load, and/or high ground-to-neutral voltage. The Extech CT70 is a GFCI and AC Circuit Analyzer which covers outlet load handling and outlet tester functions. Complete with an AC test cord (standard North American 3-prong plug).
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SIFT -
FA Instruments
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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720TN -
Com-Ten Industries
The advanced 720TN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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TFT Test Systems -
Materials Development Corporation
Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.
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702SN -
Com-Ten Industries
The advanced 702SN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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710TN -
Com-Ten Industries
The advanced 710TN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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710SN -
Com-Ten Industries
The advanced 710SN Series Universal Test Systems are ball screw driven test stands, excellent for affordable, precision tensile and compression testing of a wide variety of materials, products or ASTM standards. These variable speed testers have increased speed ranges and include adjustable travel limit switches. With the unique dual testing area, users can setup for two tests, tensile and/or compression, without having to switch out fixtures.
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LD-LGST-A10 -
Labodam
Gel Strength Test SystemLD-LGST-A10is mainly used to measure the gel strength of gelatine under the stipulated environment. It has traveling accuracy ± 0.3 % and Test range up to 5 to 1000 g Bloom. It consists of Jelly Strength Tester, Constant Temperature Bath and Refrigerator. Sampling depth can be present arbitrarily in 1 to 60 mm. It consists four kinds of sampling measurement modes: single-step, maintaining, circulating and automatic.
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InterWorking Labs, Inc.
The Maxwell Pro TCP Test Suite is used by design engineers, quality assurance engineers and testers to find and fix bugs in their TCP stack or engine. The tests help ensure that the TCP stack is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the TCP protocol.
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SeeTestAutomation -
Experitest Ltd.
Records on real devices and on emulators Objects identified by Native / Web properties Same test runs on different devices (e.g. android test runs on iOS) Support for responsive website and UI testing Plug in for: HP UFT (QTP), WebDriver (Selenium), JUnit, Microsoft Visual Studio and Python. Plug in for: HP Quality Center (ALM), Jenkins and other continuous integration environments. Mobile device connectivity: local (USB to tester PC) or remote (onsite Cloud)
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YAV90084A -
6TL Engineering
4x 8-Bit 1KOhm reostat 4x 8-Bit 40 Ohm reostat 2x 8-Bit 5 MOhm reostat 10x Electronic Potentiometer 8-bit resolution -256 steps- with build-in selft test. 10x Voltage to current source 0(4)..20mA 10x Analog Outputs (Buffer for voltage or frequency) 36-Ch Test Point voltage divider 2xCAN Bus Channels Terminators tester Expandable with NI PXI-6723 and PXI-6345.
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(T1/E1/T3/E3/OC-3/OC-12/STM-1/STM-4) -
GL Communications Inc.
Almost all T1 E1 T3 E3 Testers can be accommodated into rack-based units. Multiple rack units can be stacked together for greater scalability. Shown below is a rack based tProbe™ T1 E1 / T3 E3 Analyzer unit, and a Channelized T3 E3 Analyzer unit supporting 6 T3s (6 * 672 DS0s). Such customized rack serves the purpose of handling multiple communications lines and test complex functionalities.
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Test Spectrum, Inc.
Test Spectrum can provide generic Probe Cards, Probe Interface Boards (PIB), and loadboards. Choose from existing configurations already designed, or a generic test board for your specific tester configuration can be designed quickly.Teradyne J750 Probe Card and PIB; Teradyne Integra Flex PIB; Teradyne Ultra Flex PIB; Teradyne Catalyst PIB; Credence Quartet PIB (Probe Interface Board); Advantest 93K 1024 PIB
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IP750 -
Teradyne, Inc.
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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SL113XA | SL100XA Series -
Keysight Technologies
The cell is the basis of any battery system and directly influences its function, performance and safety. Therefore, it is essential to test and characterize the cell at an early development stage. For this purpose, Keysight offers reliable test systems for precise and reproducible measurement results. The Cell Level Series (SL1002A, SL1004A, SL1007A, SL1132A and SL1133A) — also known as Battery Cell Tester — emulates sink and source for battery cells for automotive and industrial applications.