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Showing recent results 1411 - 1425 of 4775 products found.

  • Digital Insulation Testers

    Bestone Industrial Ltd.

    This professional Voltage Insulation tester is designed with voltage overload protection and high voltage indicator to safely measure voltage in 50V, 100V, 250V, 500V,1000V and 2500V. It has a dual display when measuring under Insulation Resistance, it simultaneously show the selected voltage range and insulation resistance measured reading. These measurements can be use to evaluate insulation integrity. This troubleshooting tool is a quality control measure at the time a piece of electrical equipment is produced and an installation requirement to help ensure specifications are met and to verify proper hookup. It also use as a periodic preventive maintenance task.

  • HIPOT Insulation Testers

    Laycock Systems

    Crown high voltage, transformer type hipot insulation testers are safe, easy to use for quick, positive determination of grounds, shorts, and broken wires in motors, transformers and other low voltage equipment or wiring systems. A turn of the selector switch gives a selection of seven voltages; 500, 1080, 1250, 1500, 1750, 2000 or 2500 volts calibrated to +/- 5% accuracy; NEMA recommendation for insulation test is twice normal voltage plus 1000 volts. Since this instrument has a capacity of 2500 volts, it readily accommodates all normal requirements.

  • MEMS Device-Oriented Testers

    SPEA S.p.A.

    Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.

  • PAUL Aerospace Tester

    KT-6000 - Konrad Technologies GmbH

    We developed our standard Aerospace Test System KT-6000 "PAUL" to meet the specific requirements of the aerospace industry. The system is designed against the backdrop of its usability as a complete system tester, which can be adapted to the respective test requirements of various devices under test (DUT) using different test unit adapters (TUA). Besides standard ATE functionality, the system supports the integration of test equipment for*Acceptance Test Procedures (ATP)*Highly accelerated life testing (HALT)*Environmental Stress Screening (ESS)*High Accelerated Stress Screening (HASS)

  • Pendulum Impact Testers

    Qualitest International Inc.

    Qualitest offers Charpy / Izod Impact Testers with capacities up to 750J meeting and exceeding ASTM E23, ISO, DIN, JIS, standard requirements. The key benefits of this line of top technology models are price competitiveness, extremely high precision and durability, automatic motorized lifting of the pendulum hammer to optimize cycle times, flexibility, efficiency for low/high temperature testing, and much more. Optionally we offer temperature chambers, automated sample handling, centering device, Charpy sample preparation and broaching machines for preparation of notched bar specimens.

  • Pitot Static Tester

    ADSE 643 - ATEQ Aviation

    The ADSE 643 caters fully for all aircraft types and the different electrical power supplies.It can be used for testing high performance civil and military aircraft, fixed and rotary wing.This Pitot Static tester is designed primarily for flightline use to cover the testing of all barometric and manometric pressure instrument systems.The ease of use and portability enables all checks to be carried out easily on the flight deck or in the cockpit, by a single operator.The test set is housed in an anodized metal and rugged case.An attached case contains the pressure hoses and electrical cables.

  • Smart Card Testers

    CT1000 - SPEA S.p.A.

    The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.

  • Coefficient Friction Tester

    32-76 - Testing Machines, Inc.

    Testing Machines Inc., is globally recognized as the leading supplier of Coefficient of friction instrumentation. Our NEW 32-76 coefficient of friction tester uses advanced digital force signaling and high speed data acquisition software providing unmatched precision and repeatability in COF testing. Improved features include a color touchscreen display and intuitive software user interface for easy navigation and test method storage. Based on the horizontal plane method, coefficient of friction and Slip properties aid in the evaluation of chemicals and additives used to create, monitor or minimize the degree of friction between two contacting test specimens or surfaces.

  • Film Shrink Tester

    Hanatek Instruments

    The Hanatek FST Film Shrink Tester is used to measure the effect of temperature on plastic films. The application of heat causes certain plastic films to rapidly contract; this effect can be used to seal and pack many items from food to consumer goods. The shrink effect is due to internal forces locked into the film during manufacture being released by heating, it is also known as linear thermal shrink or free shrink. The amount of shrinkage is dependent on the film type, thickness and sealing temperature. Testing the percentage shrink of a film ensures that it is suitable for a particular packaging application and establishes the correct temperature for that application.

  • In-Circuit Tester Integration

    Corelis

    The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.

  • Millivolt Drop Tester

    SCR ELEKTRONIKS

    The SCR ELEKTRONIKS Millivolt Drop Tester is an industry acclaimed product. MVDT has a specially built constant current source (current generator) up to 400A (depending on model) and a dedicated PLC to store test parameters (in automatic models), perform test procedure, make the millivolt drop & junction resistance measurements and store test results, that can be retrieved later or downloaded to PC. PC based TestWare can display the test results & export those to Office, HTML, Printer or PDF. The manual models consist of the constant current source, digital ammeter and a digital millivolt meter with 3 ranges.

  • Phase Noise Testers

    7000 Series - Berkeley Nucleonics Corporation

    The 7000 series is an integrated solution that offers an indispensable set of measurement functions for evaluating VHF to microwave frequency signal sources such as crystal oscillators, PLL synthesizers, clocks, phase-locked or free-running VCO's, DROs, SAW, or Yig oscillators, and others. The flexible instrument comprises a two-channel, cross-correlation system with two internal, tunable references sources that also allows measurements with externally sourced references. We offer three platform options for the 7000 Series Phase Noise Testers: the 7070 5 MHz-to-7 GHz, the 7300 5 MHz-to-26 GHz, and the 7340 from 5 MHz-to-40 GHz.

  • Small-Signal Discrete Tester

    4100-D - Aemulus Corporation Sdn. Bhd.

    Fastest discrete tester in the industryUnmatchable test time of <40ms for transistors and <20ms for diodesTrue multi-site testing, up to unmatchable 127 simultaneous sites with >95% efficiency Modular and highly scalable design, don’t pay for what you don’t need (for now) Seamless extension of test resources and test sites, add-on whenever you need Flexible tester-handler configuration – index-parallel, test-time division, multi-sites on single handler, etc Independent test flows running on one screen for independent tester-handler operation Industry’s leading discrete vectorization (AVEC-D) to optimize test time and eliminate O/S latency

  • Downloading Multifunction Tester

    ET4500 - Martindale Electric Co. Ltd

    The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.

    can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.

    Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.

  • Handheld Network Tester

    T-BERD/MTS-5882 - Viavi Solutions Inc.

    The T-BERD/MTS-5882 is extremely versatile, enabling the cell site technician to address all key tests with one, lightweight, handheld tester; including: Fiber Inspection: Dirty fiber connections are the #1 cause of network downtime. Microwave back-haul: The majority of microwave backhaul links around the world are still microwave. Enhanced Cable Diagnostics: Environmental factors can damage the CAT X shielded twisted pair cable connecting the microwave antenna. Fronthaul: Avoid dangerous tower climbs with CPRI testing including BERT, PIM detection, MIMO diversity, RET, and VSWR. Backhaul: In addition to packet testing across error-prone microwave hops.