Showing results: 4546 - 4560 of 8449 items found.
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Dynamic Test Solutions
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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iScope -
Sercel Group
Scope is the first cost effective downhole monitoring system designed to retrieve pressure and temperature data during well testing operations.
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LS3 -
Calmet Smart Calibration Devices
Stationary three phase system class 0.01% for automatic testing of single electricity meter. It allows to test all type of meters
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Vectria Technologies Ltd.
Unmatched performance In-Circuit RF Probes covering up to 18GHz. These are must tools for any in-circuit RF and Microwave testing and troubleshooting.
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Maccor, Inc.
Compact bench top temperature provides a simple and economical solution for integrating temperature dependent testing with a Maccor Automated Test System.
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Labodam
Labodam salt spray test chambers are reliable instruments for testing the corrosion resistivity of products with painted, organic, or inorganic film surface.
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Fluke Networks
Companies expect their twisted pair cabling to work flawlessly, but corners cut during design, installation and testing result in network downtime which translates to wasted resources and lost revenue. This can be avoided by cable installers that are capable of certifying cabling installations to industry standards and network technicians who can find faults quickly. From 100BASE-T to tomorrow's advanced twisted pair technology, Fluke Networks is the industry's most trusted partner for cabling certification.
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Chipkin Automation Systems
CAS Modbus Scanner is a utility to retrieve coils, inputs, holding registers, and input registers from a Modbus enabled device. Values retrieved from the device can be viewed in many different formats including Binary, HEX, Uint16, Int16, Uint32, Int32, and Float32. This utility can also discover Modbus devices on your network if you do not know their address. It works by testing every address, function, length, offset to check for exceptions or responses.
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Photron Ltd.
Conventional high-speed cameras have been utilized for nearly eighty years and are widely accepted worldwide through continuous technological development to visualize fast occurring phenomena. In recent years, demand for using polarization in structural dynamics and high-speed object detection has been increased due to the advancement of robotics, clear film production and new materials testing technologies. On the other hand, traditional high-speed cameras lack any polarization sensitivity.
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MacArtney A/S
MacArtney offers an extensive range of service solutions and packages to product and system clients around the world. From accurate sensor calibration performed by highly trained oceanographic specialists, through advanced hydrostatic pressure testing and expert workshop services to complete training and service programmes for operators of MacArtney CORMAC and MERMAC winch and handling systems - MacArtney has a solution that can sustain and increase the value, efficiency, performance and lifetime of your specific system.
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SG-2000S -
Jinge Testing Machine Co.,Ltd
Handheld XRF Analyzer, Metal analyzer, ROSH analyzerThis is a portable analyzer specially designed for production site and field environment, which is featured with small size, light weight, easy operation and super long standby, etc. It's widely applied in such fields as alloy steel, geological surveying, mining and metallurgy, metal recycling, and precious metal testing, and can also be applied in quantitative analysis of all elements from Magnesium (Mg) to Uranium (U).
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LogicTouch -
SV Probe, Inc.
The shrinking of IC die geometries and the growing complexity of device designs are making the task of on-wafer testing increasingly more difficult. SV TCL''s LogicTouchTM is suited perfectly for these types of advanced designs, a fine pitch technology utilizing a MEMS-style probe targeted for pad-limited devices such as High-Volume SoCs, Microcontrollers, DSPs and 3D Packages. LogicTouch is also ideal for the latest device applications including TSV (Through-Silicon Via) and Copper Pillar (Cu-Pillar).
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UI9611 -
Lisun Electronics Inc.
Measure parameters: Open voltage UGS (th), internal resistance RDS, Transconductance gm, Withstand voltage V (BR) DS• Test range: UGS (th) 0.1-9.9V; RDS 0.001-9.999Ω gm; 0.10-10.00s; V (BR) DS 50-650V• Test current range: 0.1A-5A adjustable, comply with different working situation• Automatic selecting, out of limit alarming, advance the work efficiency• The technique of testing RDS under the big-current, is advanced technique
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Corelis, Inc.
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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Corelis, Inc.
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.