Showing results: 4756 - 4770 of 8519 items found.
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Aero Nav Laboratories, Inc.
Pneumatic and hydraulic testing is performed to demonstrate operating pressure, pressure drop, volume and flow parameters, as well as performance characteristics, of fluid system components and assemblies.
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Prexa MS -
Tokyo Electron Ltd.
The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Model CRX-4K -
Lake Shore Cryotronics, Inc.
The Model CRX-4K is a versatile cryogen-free micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter.
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Model TTPX -
Lake Shore Cryotronics, Inc.
The Model TTPX is a versatile cryogenic micromanipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter.
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Model FWPX -
Lake Shore Cryotronics, Inc.
The Model FWPX is a versatile cryogenic micro-manipulated probe station used for nondestructive testing of devices on full and partial wafers up to 102 mm (4 in) in diameter.
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HIGHVOLT Prüftechnik Dresden GmbH
AC resonant test system is used for factory testing of middle, high and ultra-high voltage cables, capacitors, generators, motors, power transformers and gas-insulated switchgears.
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Audio-Capture -
WavCapture
The Audio Capture is a PC based multifunction audio testing system that is ideal for designing, verification and quality check of audio components such as loudspeakers, acoustics and audio electronics.
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TetraTek Products, Inc.
Automated test equipment, precision positioning robots, stepper motor, and servo motor mechanisms in support of testing and repetitive manufacturing from TetraTek Products, Inc.
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Labodam
Labodam temperature and humidity test chambers are designed to simulate constant climactic conditions for testing a wide variety of products for their quality, performance, shelf life, and stability.
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2670A -
Shenzhen Chuangxin Instruments Co., Ltd.
0-5KV AC withstand voltage tester Features: High voltage,small current, high accuracy. Leakage current, testing time, continuous arbitrarily, well-adapted.
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UDEYRAJ ELECTRICALS PRIVATE LIMITED
Compact and rugged BDV testers for AC dielectric withstand / breakdown testing of Safety glooves and boots. Panel mounted controls and indicators with easy to follow legend.
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HDGC-3915 -
HD Power Test Equipment Co.ltd
Battery Internal Resistance Tester is designed using the advanced AC discharge measurement method to test accurately voltage and resistance of battery. It is strictly designed to evaluate battery performance, state and life-time, which maintain all stationary power systems including Uninterruptible Power System. Battery Internal Resistance Tester can proceed the measurement in a group and in a single section of battery. With accurate testing of resistance and voltage, it gives an indication of battery capacity and technical status. The measurement data can be read on the instrument display directly. And it can also be uploaded to PC simply by using the USB drive. With the analyzing software, you could not only keep a record of the testing result but also have detailed analyzing for the status of batteries in different testing conditions.
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16814 -
Ultra-Tech Enterprises, Inc.,
The MU Locomotive Trainline/Cable Test System (MU Test System) can perform shorts testing, continuity testing, and ground-leakage testing on each of the 27 pin Multi-Unit Trainlines normally found on Freight Locomotives. The MU Test System is comprised of two identical tester units. Each unit is installed in a rugged, water resistant Pelican case. Each unit contains an MU cable receptacle that mates with a 27 pin MU jumper cable. A snap-on vinyl pouch on the outside cover of each unit provides storage for the battery charger/power adapter and the chassis test lead. The enclosure cover hinges separate from the test unit as the cover is opened; this removes the cover completely to allow free access to the MU cable receptacle and the control panel.
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CA9808 -
UC Instruments, Corp.
The UC INSTRUEMNTS CA9808 4 Channel 24.5 ~ 29.0 Gb/s (100Gb/s) Pulse Pattern Generator and Error Detector is a high performance, flexible and cost effective four channel Pulse Pattern Generator and Error Detector that can operate from 24.5 Gb/s to 29 Gb/s each Channel. 4 channel 29.0 Gb/s make it total up to over more than 100 Gb/s testing capacity. It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer.