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Showing results: 7771 - 7785 of 8504 items found.

  • Franklin Tester

    Model FT1 - Gopal Electronics

    The Franklin tester FT‐1 is designed to measure the surface insulation resistivity of electrical steel sheet according to the ASTM Standard A717 and IS:649. This test method is suitable for quality control in the application of insulation coating. For ease of testing FT‐1 automatically set 300 PSI pressure on the sample by the inbuilt hydraulic unit and it is capable to set the desired test temperature of the platform. Then the regulated supply of 0.5V gets on and the current flowing through the insulation get measured. The calculated insulation resistivity will be displayed on graphics LCD display and as well as on printed report via thermal printer.

  • Closed-Link Field Test Kit

    630 - The Eastern Specialty Company

    TESCO’s Closed-Link Field Test Kit (Catalog No. 630) with Power Factor has been designed to reduce the weight of field test equipment to the lowest possible limit when testing electric meters without potential links or with the links closed. The unit is protected within its ergonomic carrying case by a durable powder coated aluminum shell. The total weight of the meter test kit including leads, and digital reference standard is only 30 lbs! The test kit carrying case also incorporates ample storage space for the cable set and other tools.

  • DCA Equivalent-time Sampling Oscilloscopes

    Keysight Technologies

    Equivalent-time (sampling) oscilloscopes are also known as digital communication analyzers (DCA). They are designed to visualize and analyze the analog properties of high-speed signals used in data center and wireline telecom applications. The Keysight DCA platform features a wide variety of optical, electrical, and TDR/TDT modules, compliance applications, and a common FlexDCA user interface to ensure more efficient testing in both R&D and manufacturing. Due to an ultra-low jitter and low-noise acquisition system, the Keysight DCA series provides industry-leading measurement accuracy for high-speed digital designs including 400G/800G Ethernet and Fibre Channel.

  • NI-5781 , 40 MHz Bandwidth, RF Adapter Module for FlexRIO

    781267-01 - NI

    The NI‑5781 is an analog dual-input, dual-output FlexRIO adapter module optimized for interfacing with baseband to RF upconverters and downconverters. When you pair the NI‑5781 with a PXI FPGA Module for FlexRIO, the resulting NI‑5781R is an FPGA-enabled reconfigurable I/O (RIO) baseband transceiver that you can use to implement custom RF modulation and demodulation, channel emulation, bit error rate testing, or spectral monitoring and jamming. Additionally, you can use the low latency and high throughput of FPGA‑based processing for ultra‑high‑speed control and inline processing applications.

  • Electric Motor QC Systems

    Megger Group Ltd.

    Megger Baker Instruments designs and manufactures electric motor test systems for original equipment manufacturers (OEMs) that help ensure their motors, generators and coils meet or exceed the quality expectations OEMs set with their customers. Baker motor quality control (QC) systems include the Baker WinAST automated stator tester, the Baker HV WinAST and the Baker WinTATS traction armature test system. Each incorporates the most effective electric motor test processes into a single automated instrument and can be customized to meet the specific testing needs of a given manufacturer.

  • 4 Wire Earth Resistance & Resistivity Tester

    4236 ER - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● Earth resistivity (ρ) test.● Earth testing at 20Ω, 200Ω, 2kΩ.● Earth voltage measuring : 0-300V AC.● Automatic C spike check.● Automatic P spike check.● 2-Wire test, 3-Wire test, 4-Wire test.● LCM display.● Auto ranging.● Auto power OFF.● Data hold.● 200 measurement results can be saved in the memory and recalled on the display.● Interval between auxiliary earth spikes is 1.0~50.0m.● Optical USB to RS-232 data transmission.● The stored data can be transferred to a PC.● 2 optical LEDs are built-in for data transfer.

  • 3 Wire (Digital) Earth Resistance Tester

    ST-1520 - Standard Electric Works Co., Ltd

    ● Capable of measuring earth resistance and earth voltage.● 2mA measuring current permits the testing of earth resistance without tripping earth leakage current breakers in the circuit under test.● Auto power off function.● The timer operates automatically for about three to five minutes when the "PUSH BUTTON SWITCH" and "TIMER ON BUTTON" are pressed together. This will keep test "ON" for the duration of the timer.● Timer for test function (count 3-5 minutes).● Battery operated.● Data hold function.● Small and light weight.● Calibration performed with supplied test leads.

  • 18-Slot 3U PXI Express Chassis with AC - Up to 8 GB/s

    PXES-2780 - ADLINK Technology Inc.

    The ADLINK PXES-2780 is an 18-slot PXI Express chassis, compliant with PXI Express and cPCI Express specifications and offering one system slot, one system timing slot, ten hybrid peripheral slots, and six PXI Express peripheral slots for a wide variety of testing and measurement applications requiring enhanced bandwidth. The PXES-2780 provides a configurable PCIe switch fabric and is configurable in two-link, and four-link PXI express deployments, with 8 GB/s system bandwidth and up to 4 GB/s slot bandwidth for dedicated peripheral slots, thanks to PCIe gen2 signaling technology.

  • PMA Suite For The PSA/PSL-3000: 802.3at (30W) PSE's

    Sifos Technologies, Inc.

    *In-Depth System Testing of 802.3at and 802.3bt 2-Pair PSE's Using PSA-3000 or PSL-3000 instruments*Concurrently Analyze Up To 192 PSE Ports*Robust Emulation of Type-1, Type-2, and Type-3 (Class 4) PD's Including PoE LLDP*Assess PSE Power Administration Decisions*Assess PSE Power Management Behaviors*Static and Transient Reserve Capacity Analysis*Per-Port Variation and Uncertainty Analysis*Assess PSE Power Reliability Over Time*Colorful and Graphical Pop-Up Spreadsheet Reporting*Available to PSA-3000 and PSL-3000 as part of the Live PD Emulation license feature

  • Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's

    Sifos Technologies, Inc.

    The optional PSL-3424-QT feature license opens up two important productivity tools in the PSL-3424 platform.  PSL-3424 Quick Test is a fully automated PSE functional test covering between 2 and 8 PSE ports in a test cycle with average test times on the order of 10 seconds per port tested.   The Chained Data Test user interface allows rapid construction and verification of test setups used in “snaked data path” testing of PSE’s with user specified loads and optional LLDP power negotiation on each test port.

  • Systems for Measuring the Saturation Polarization σs and Js

    KOERZIMAT® 1.097 MS - Foerster Instruments, Incorporated

    The KOERZIMAT 1.097 measuring system by FOERSTER facilitates the accurate, automatic, and fast measurement of the weight-specific saturation polarization σs and volume-specific saturation polarization Js. The largely geometry-free measurement is particularly suitable for testing samples with complex shapes. The KOERZIMAT 1.097 MS is used for applications such as controlling the sintering level during hard metal sintering processes and determining the tungsten content dissolved in cobalt as well as the free iron, cobalt, and nickel content in powder / hard metals. The saturation polarization Js in Tesla can also be determined in soft magnetic components of magnetic circuits.

  • sbRIO-9222, Non-Enclosed, ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module

    785479-01 - NI

    Non-Enclosed, ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The sbRIO‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the sbRIO‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.

  • NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module

    780159-02 - NI

    300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.

  • NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module

    780159-01 - NI

    300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.

  • Thermal Shock Chambers

    Cincinnati Sub-Zero Products

    We provide a large selection of thermal shock chambers to accommodate various types of product testing. Thermal Shock Chambers perform tailored environmental stress screening of component and board electronic assemblies. Our unique chamber design transfers product between two extreme temperature-controlled chambers, passing equal volumes of high velocity conditioned air over the product and resulting in rapid product temperature changes. The induced thermal stresses can reveal hidden manufacturing defects in electronic sub-assemblies and other components by the expansion and contraction of critical parts.

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