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  • PXIe-7867, Kintex-7 160T FPGA, 18-Channel AO, 1 MS/s, PXI Multifunction Reconfigurable I/O Module

    785570-01 - NI

    Kintex-7 160T FPGA, 18-Channel AO, 1 MS/s, PXI Multifunction Reconfigurable I/O Module—The PXIe-7867 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of timing and synchronization. With 18 analog output channels connected directly to the FPGA, you can quickly design for applications that require precise timing such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe-7867 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe-7867 also includes peer-to-peer streaming for direct data transfer to other PXI Express modules.

  • PXIe-7847, Kintex-7 160T FPGA, 500 kS/s, DRAM PXI Multifunction Reconfigurable I/O Module

    784144-01 - NI

    Kintex-7 160T FPGA, 500 kS/s, DRAM PXI Multifunction Reconfigurable I/O Module—The PXIe‑7847 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe‑7847 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe‑7847 also includes peer-to-peer streaming for direct data transfer to other PXI Express modules.

  • PXI-6733, 16-Bit, 8-Channel, 1 MS/s PXI Analog Output Module

    778512-01 - NI

    16-Bit, 8-Channel, 1 MS/s PXI Analog Output Module—The PXI‑6733 is a high-speed analog output device designed to deliver simultaneous, multichannel updates for control and waveform output applications, such as stimulus-response tests (including acoustic distortion testing) and simulation (such as three-phase power simulation). In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24‑bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PXI‑6733 can replace several kinds of instruments, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators. You can control each data point for each channel to define common waveforms, such as square, sine, or sawtooth, as well as complex waveforms.

  • PXIe-7857, Kintex-7 160T FPGA, 1 MS/s, DRAM PXI Multifunction Reconfigurable I/O Module

    784146-01 - NI

    Kintex-7 160T FPGA, 1 MS/s, DRAM PXI Multifunction Reconfigurable I/O Module—The PXIe‑7857 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe‑7857 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe‑7856 also includes peer‑to‑peer streaming for direct data transfer to other PXI Express modules.

  • PXIe-7858, Kintex-7 325T FPGA, 1 MS/s, DRAM PXI Multifunction Reconfigurable I/O Module

    784147-01 - NI

    Kintex-7 325T FPGA, 1 MS/s, DRAM PXI Multifunction Reconfigurable I/O Module—The PXIe‑7858 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe‑7858 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe‑7856 also includes peer‑to‑peer streaming for direct data transfer to other PXI Express modules.

  • PXIe-7861, Kintex-7 160T FPGA, 16-Channel AI, 1 MS/s, PXI Multifunction Reconfigurable I/O Module

    786671-01 - NI

    PXIe, Kintex-7 160T FPGA, 16-Channel AI, 1 MS/s, PXI Multifunction Reconfigurable I/O Module - The PXIe-7861 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of timing and synchronization. With 16 analog input channels connected directly to a Kintex-7 160T FPGA, you have ample space to design applications that require precise timing such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe-7861 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe-7861 also includes peer-to-peer streaming for direct data transfer to other PXI Express modules.

  • PXIe-7856, Kintex-7 160T FPGA, 1 MS/s PXI Multifunction Reconfigurable I/O Module

    784145-01 - NI

    Kintex-7 160T FPGA, 1 MS/s PXI Multifunction Reconfigurable I/O Module—The PXIe‑7856 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe‑7856 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe‑7856 also includes peer‑to‑peer streaming for direct data transfer to other PXI Express modules.

  • Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card

    GX5296 - Marvin Test Solutions, Inc.

    The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • High Temperature Self-Supporting Furnace Extensometers (1200 C)

    Model 3448 - Jinan Testing Equipment IE Corporation

    Epsilon developed this unique high temperature extensometer for testing metals, ceramics, and composites at the high temperatures produced by furnaces and induction heating systems. A combination of features make these extensometers easier to use and better in performance than other similar high temperature extensometers.The units are held on the specimen by light, flexible ceramic fiber cords. These make the extensometer self-supporting on the specimen. No furnace mounting brackets are required. The side load on the test sample is greatly reduced because of the self-supporting design and light weight of the sensor. Most materials testing furnaces with a side cut-out for an extensometer will readily accept a Model 3448. For induction heating systems, a different ceramic cord placement allows the extensometer to easily pass between the coils.The combination of radiant heat shields and convection cooling fins allow this model to be used at specimen temperatures up to 1200℃ (2200°F) without any cooling. An optional tiny air fan does enhance stability at the highest temperatures and is recommended for the highest accuracy and for tests with small elongations. The fan comes with a magnetic base for support so it can be mounted at any convenient location near the extensometer. Fan cooling is not generally needed for induction heated systems. High purity alumina ceramic rods are used. These are available in lengths as required to fit your furnace. A spare set is included with every extensometer. Specify chisel, vee chisel or conical contact points as desired.Most units operate equally well in tension and compression. Thus tensile, compression and cyclic tests like low cycle fatigue can all be performed with a single unit.For vacuum furnaces, special models are available. Epsilon can also provide a radiant heat transfer cooled version. This requires that the extensometer module be surrounded by a water cooled enclosure with a front slot for the ceramic rods.

  • ±6 kV ANSI/ESDA/JEDEC HBM Test System

    HBM-TS10-A - High Power Pulse Instruments GmbH

    *±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C

  • Temperature And Humidity Chambers

    Dongguan Amade Instruments Technology Co., Ltd

    Temperature and humidity chamber is also referred to as climatic chamber, programmable temperature humidity chamber, constant environmental test chamber, constant humidity chamber, temperature and humidity controlled cabinet etc. It Is capable of simulating the range of temperature & humidity fluctuating from an extremely low value of -70℃ & 20% R.H to an exceeding high value 150℃ & 98% R.H which products may be exposed to in the natural environment. Constant temperature&humidity testing machine can be used to measure the resistance of specimens to withstanding extremely high temperature, low temperature, constant temperature, high humidity, low humidity or various programmed combinations. Applied to all materials and product which are sensitive to temperature and humidity, such as electronics, appliances, cell phones, communications, instruments, vehicles, plastics, metals, foods, chemical products, construction materials, medical products, aerospace components etc.

  • Solar Simulators

    TriSOL CPV - OAI

    Concentrating Photovoltaics (CPV) has the promise of producing solar cells with high cell efficiencies, which result in a reduction in the cost of operating a PV module. However, a CPV system requires the integration of CPV solar cells, modules and CPV optics into one efficient system. OAI’s focus is CPV cell testing methodology. The CPV cells can now be tested using OAI’s advanced standalone CPV Simulators for low dose and high dose configurations. The low dose CPV Solar Simulator provides exposure up to 50 Suns, whereas, the high dose CPV Solar Simulator provides exposure up to 1500 Suns. The low and high dose simulators provide exposure in varying Sun concentrations in various beam sizes from 1.5cm x 1.5cm to 7.5cm x 7.5cm, and may be configured with OAI’s I-V Test Systems.

  • EMP- EMI Solutions

    Salicon Nano Technology

    We have spread our business tentacles and are operating smoothly, through our DELHI NCR branches which are having facilities like Mechanical and Electronic Designs, Manufacturing, Integration and Testing for development and production activities. We have the In-house Environmental and EMI pre-compliance test facilities which guarantee better quality products.It is our pledge to serve the society with more efficient and qualitative output through our open mindedness and creative solutions. We continue with ardent hope that our products will definitely gather more and more momentum with the defence, the private industrial bigwigs and international companies as well. Growing the business tentacles in India, Concept Shapers are embarking upon the drive of expansion of the resources at its disposal. Our resources are our strength, be it human or the space. We firmly believe in the doctrine of ‘Engineering Innovative Concepts to configure a better tomorrow’.

  • 5 Digit Frequency Meter

    CS2-F - Chuan Sheng Electronics Co., Ltd.

    CS2-F Freqeuncy Meter is designed high accuracy measurement, display, control and communication (Modbus RTU mode) of pulse(Frequency) or AC Frequency.● The innovation feature is auto-range input from 0.01Hz~ 100KHz(~140KHz in option). The display resolution will be auto-changed to show the highest according to input frequency. They are also building in 4 Relay outputs, 3 External Control Inputs, 1 Analogue output and 1 RS485(Modbus RTU Mode) interface with versatile functions such as control, alarm, re-transmission and communication for a wide range of testing and machinery control applications. Please refer to the detail description on pages 2/33~7/33.There are not only controllers, but also an I/O interface in any system. ADtek built in difference ideal for External Control input and Relay output as like as I/O module of PLC. It’s very connivance to achieve remote monitoring and control by CS2 series.

  • Battery Capacity Testers|Discharge Testers

    IBEKO Power AB

    DV Power offers a wide range of battery capacity testers to meet specific customer needs. All of them are portable, powerful and most of all universal. Any battery string, such as lead-acid, lithium-ion, nickel-cadmium based and others, with voltages in the range of 0,9 – 800 V DC can be tested in an accurate, user-friendly way.The capacity test is carried out following the battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.BLU battery testers enable setting the discharge current up to 350 A, with 0,1 A resolution. If higher currents are required, several units can be connected in parallel, or BXL additional load units can be used. Discharge parameters can be monitored in real-time during the capacity test. Overall battery voltage, current, elapsed test time and capacity will be presented during the entire test on a touch screen display.

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