Showing results: 316 - 330 of 485 items found.
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MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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FDI-01 -
Jinan Leading Instruments Co., Ltd.
FDI-01 Falling Dart Impact Testeris applicable in the impact result and energy measurement of the falling dartfrom a certain height against plastic films and sheets with a thickness less than1mm, whichwould result in 50% tested specimen failure.
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Guangzhou Biaoji Packaging Equipment Co., Ltd.
Packaging Material testing including OTR barrier, COF, lamination bond strength, material analysis, physical properties, tear strength , tensile strength, puncture, slip, blocking, scuffing, film thickness variation, WVTR and so on..
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Panasonic Industrial Devices Sales Company of America
When your application calls for the precision measurement of dimensions such as thickness, diameter, and height, Panasonic has the solution. Panasonic high-quality Laser Displacement, Inductive Displacement and Collimated Beam Sensors provide high-speed and accurate measurement solutions.
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FilmTek 2000M TSV -
Scientific Computing International
Advanced semiconductor packaging metrology system providing an unmatched combination of speed, accuracy, and precision for high-throughput measurements of resist thickness, through silicon vias (TSVs), Cu-pillars, bumps, redistribution layer (RDL) and other packaging processes.
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122 -
Elcometer Limited
Elcometer 122 Testex® Tape consists of foam with a non-compressible backing. The foam side is rubbed into the surface providing a permanent mould of the peak-to-valley profile. The profile of the surface can then be measured using the Elcometer 124 Thickness Gauge.
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Elcometer Limited
A covermeter, or rebar locator, is a gauge that measures the thickness of concrete cover over steel reinforcement bars and metal pipes. The covermeter can tell you the depth of the rebar, the location and orientation of reinforcement bar (rebar) and determine the diameter of the rebar.
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Nano-View Co. Ltd.
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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MEET International Ltd.
*Stud Depth (2x4 inches stud) : upto 0.5 inch (12mm) thickness of drywall*Low battery indication*Auto Calibration*Multi-level indication*Multi-audible sound*World's Smallest Stud Detector*Accurate, quick and easy to use
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SF4B-C -
Panasonic Industrial Devices Sales Company of America
The Panasonic SF4B-C Compact Safety Light Curtains, with a thickness of only 20 x 27.4mm, come with an ultra-light housing. The combination of a plastic body with a metal inner frame is designed to minimize weight while at the same time increasing the toughness.
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PH-LE -
HenergySolar
The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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CCS -
Sciences et Techniques Industrielles de la Lumière
CCS controllers allow high precision measurements without contact and without risk of damaging the parts.Among the various advantages of CCS controllers is the measurement of distance and thickness at very high resolution on all types of surfaces and materials, including reflective surfaces.
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ALS Co., Ltd
Grid electrode is produced by the deposition of the platinum, gold or carbon onto the quartz glass. The dimension of the glass is 8 x 27 mm, with a 1 mm of the thickness, and the grid line is 100 m width with a distance of the 150 m between lines.
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Elcometer Limited
The kit provides all the tools required for the on-site inspection of a coating, including surface profile, dewpoint, relative humidity, both wet and dry film thickness and also adhesive testing.Measurement parameters include:Surface inspectionSurface profileSurface contaminationClimatic conditionsCoating thicknessAdhesion
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SR Series -
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer (SR) series are relative low cost and easy to use tools. To enusre accurate measurement on spectra, a long working distance and also adjustable working distance set up are professionaly desgined and considered. Since reflection spectra measurments require to use known reference to calibrate light intensity, it is hard to image user could get accurate spectra without optimizing signal step during such calibration because reference thickness is different from sample substrate's thickness in most of cases. Adjusting power output to lamp is our another consideration in ensuring a good measurement by reducing non-linearity effect of the detector