Showing results: 406 - 420 of 485 items found.
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FISCHERSCOPE X-RAY/XULM -
Helmut Fischer AG
Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)
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Piranha4 Polarization -
Teledyne DALSA
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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NC-60F/RS-1300N -
NAPSON Corp.
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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LittleFoot Series -
n&k Technology, Inc.
The n&k LittleFoot-CD, and LittleFoot-CD450 are DUV-Vis-NIR scatterometers/thin film metrology systems, based on polarized reflectance measurements (Rs and Rp) from 190nm to 1000nm, with microspot technology. The systems in the LittleFoot-CD Series determine thickness, n and k spectra from 190nm-1000nm of thin films, as well as depths, CDs, and profiles of trenches and contact holes.
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Elcometer Limited
For numerous products, such as paint, ink, varnishes, glue and cosmetics, the reliability of many laboratory tests is directly related to the quality and consistency of the samples. Any measurements made on coatings for the purpose of describing their physical properties (drying time, elasticity, abrasion, gloss, colour, shade, etc.) are made on the basis of uniform and comparable samples with precisely controlled thickness.
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Inolytix
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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CRESBOX -
NAPSON Corp.
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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StructureScan Mini XT -
Geophysical Survey Systems, Inc.
The StructureScan Mini XT is GSSI’s newest generation of our very popular all-in-one GPR systems. The StructureScan Mini XT offers a 2.7 GHz antenna for superior target resolution and can reach depths of 20 inches (50 cm). Ideal for locating rebar, conduits, post-tension cables, voids, and real time determination of concrete slab thickness.
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Hanatek Instruments
The Hanatek FST Film Shrink Tester is used to measure the effect of temperature on plastic films. The application of heat causes certain plastic films to rapidly contract; this effect can be used to seal and pack many items from food to consumer goods. The shrink effect is due to internal forces locked into the film during manufacture being released by heating, it is also known as linear thermal shrink or free shrink. The amount of shrinkage is dependent on the film type, thickness and sealing temperature. Testing the percentage shrink of a film ensures that it is suitable for a particular packaging application and establishes the correct temperature for that application.
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Rhopoint Instruments
The Hanatek FST Film Shrink Tester is used to measure the effect of temperature on plastic films. The application of heat causes certain plastic films to rapidly contract; this effect can be used to seal and pack many items from food to consumer goods. The shrink effect is due to internal forces locked into the film during manufacture being released by heating, it is also known as linear thermal shrink or free shrink. The amount of shrinkage is dependent on the film type, thickness and sealing temperature. Testing the percentage shrink of a film ensures that it is suitable for a particular packaging application and establishes the correct temperature for that application.
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KPM Analytics
Process RF (radio frequency) analyzers using penetrating radio waves to determine the moisture content across a full sample thickness. Single point, array and hand-held analyzers provide a variety of sampling options from fully integrated in-process moisture profiling to at-line quality control. RF analyzers are widely used in gypsum, panel board, and other industrial processes.
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NOVOTEST ED-3D -
NovoTest
NOVOTEST ED-3D Pinhole Detector was designed for rapid non-destructive testing of the continuity of coating (e.g. porosity of film) with thickness up to 500mkm according to ASTM G62-A.Pinhole Detector is designed for testing the porosity of partially painted places and other discontinuities of protective dielectric coatings on metal products by putting low voltage through a sponge which is soaked in a liquid electrolyte with high penetrating properties.
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TS9000 Family -
Advantest Corp.
The TS9000 series leverages Advantest's industry-leading terahertz analysis technology and expertise amassed over our decades as a global leader in semiconductor test equipment. This system provides a new high-speed, high-precision solution for measurement and analysis tasks including IC chip mold thickness and IC package / printed board wiring quality, which existing methods cannot measure adequately.
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FilmTek 6000 PAR-SE -
Scientific Computing International
Production-proven metrology system for film thickness, refractive index and stress measurement for a broad range of film layers at the 1x nm design node and beyond. Accommodates 200 or 300 mm wafer metrology. Combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry with a wide spectral range to meet the challenging demands associated with multi-patterning and other leading-edge device fabrication techniques.
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SONOSCAN T -
SONOTEC GmbH
The ergonomic dual element probes for Non-Destructive Testing from the SONOSCAN Series comply with the DIN EN 12668-2 Standard and can be used to test metals, plastics and ceramics for imperfections such as cracks, inclusions, blowholes and other discontinuities. The transmitter-receiver probes manufactured in Germany are powerful, robust ultrasonic transducers which are compatible with the ultrasonic flaw detector SONOSCREEN ST10 or the thickness gauge SONOWALL 70.
