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UHV
voltage from 1000 to 1600 kV.
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System for UHV Temperature Programmed Desorption (TPD) Studies
TPD Workstation
The Hiden TPD Workstation is a complete experimental system for UHV temperature programmed desorption (TPD) studies. The triple filter mass analyser is configured with a cooled shroud giving the analyser optimum sensitivity with minimum background contributions to desorption products from the sample. A fast sample load lock with sample transfer mechanism is included to provide for rapid sample change. The TPD Workstation features a multiport UHV chamber with heated sample stage coupled to a high precision triple filter analyser with digital pulse ion counting detector for ultimate sensitivity and time resolution.
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Ultra High Vacuum
UHV
Our range of UHV magnet systems for x-ray beamline applications offers the highest performance specifications currently available combined with an unparalleled degree of flexibility ensuring that the system is tailored precisely to the requirements of the user facility.
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Scanning Tunneling Microscope for Ultra High Vacuum
STM
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Electromagnets
Our means of simulation and our knowledge allow us to manufacture a custom electromagnet according to 5 criteria:Air gapMaximum fieldHomogeneitySpeed of field variationMechanical constraints (Optical access, UHV, bulk, mass, etc.)
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Highly Sensitive, Thermoelectrically Cooled Cameras Utilize Back-Illuminated CCDs Without Antireflective Coating for Direct Detection of X-Rays
PIXIS-XO
Teledyne Princeton Instruments
PIXIS-XO highly sensitive, thermoelectrically cooled cameras utilize various back-illuminated CCDs without antireflective coating for direct detection of x-rays. A rotatable ConFlat flange with a high-vacuum-seal design make these cameras well suited for UHV applications.
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Vacuum Pump
DP-03
The XIA Model DP-03 differential pumps provide a cost effective, windowless, direct, line-of-sight transition between an ultra-high vacuum (UHV) region (< 1 x 10-9 Torr) and a high vacuum (HV) region (< 1 x 10-6 Torr).
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Ultra-High Vacuum
KP Technology offer a range of Kelvin Probes that work under ultra-high vacuum conditions, choose from single-point or scanning probes to add to your existing vacuum chamber, customize the UHV corner cube or consider the newest addition to the range, the Ф4 ultra-high vacuum scanning Kelvin Probe system.
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X-Ray Cameras for Soft X-Ray, VUV, and EUV Applications
SOPHIA® XO
Teledyne Princeton Instruments
SOPHIA® XO offers high-sensitivity (>95% QE) and high-speed for the widest range of VUV and x-ray detection, with thermoelectric cooling up to -90℃ and high frame rates. With a rotatable, industry-standard CF flange and high-vacuum seal design the software-selectable gains and readout speeds make this camera well suited for UHV applications.
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Flanges, Fittings, Adapters & Hardware
Huntington Mechanical Labs, Inc.
Flanges, Fittings, Adapters and Hardware make up the basic building blocks, along with Chambers, of a HV or UHV system. All components here are Huntington’s standard OEM manufactured products that meet or exceed all industry standards. All products are manufactured in the U.S.A. at our plant to achieve the highest levels of quality our customers demand.
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Cluster Series Systems
The quadrupole analyser is a precision assembled triple mass filter with unique, independently driven RF only secondary filter stages preceding and following the primary mass filter. A UHV low profile electron impact ioniser with twin oxide coated iridium filaments and a pulse ion counting single channel electron multiplier detector are included as standard. A Faraday detector option extends the dynamic range to 5 x 1010.
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Scanning Probe Microscopy
SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Ultra-High Vacuum CVD Process System
Model UHV-CVD-5000
ur Ultra-High Vacuum CVD system is utilized for multi-wafer processing of doped and intrinsic high quality epitaxial films, including materials such as Silicon Germanium.End products include SiGe components (RF & microwave devices, amplifiers, switches, discrete HBTs, and low noise MMICs) utilized in wireless communications applications such as cellular phones, pagers, local area networks, telemetry and sensors.
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Stainless Steel Bell Jar Chambers
MDC stainless steel bell jars are designed for use with MDC baseplates, base wells and feedthrough collars. A dovetail groove in the jar's base flange holds a Viton elastomer gasket, which makes the vacuum seal with one of the forementioned components. All stainless steel bell jars are fitted with a four inch view diameter Pyrex viewport. All vacuum welds are internal and provide UHV compatibility. For added convenience, all bell jars are fitted with a hoist or lift-ring that is welded to the chamber's domed top.
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Vacuum Quality Monitor Systems
The 835 VQM is a mass spectrometer that operates from UHV to 10-5 Torr and accurately measures the gases in the vacuum chamber. The 835 VQM Differential Pump System delivers the advantages of the 835 VQM at higher pressures. The VQM system consists of an autoresonant ion trap mass spectrometer gauge, a VQM Controller and VQM Viewer software that that converts raw data into actionable information. The system is ratiometric, meaning that it determines the ratio of each gas to other gases in a vacuum chamber. It is usually coupled with a total pressure gauge to provide partial pressures of each gas as indication of the quality of the vacuum in the chamber.
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Ion Pumps & Controllers
Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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Power Device Analyzer / Curve Tracer
B1505A
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
