Showing results: 31 - 45 of 114 items found.
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MS 1111 -
Meltronics Systemtech
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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EE301-ISOL -
Executive Engineering
The EE301-ISOLATOR will completely isolate your electronic loads inputs & outputs signals plus ground returns from the main power input UUT (unit under test)... The module allows you to control the electronic load just as you would with any standard control signal. Input / Output & Power signals are fully isolated up to 350 VDC.
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Pilot 4D V8 -
SEICA SpA
The Pilot 4D V8 represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance: the highest test speed, low to medium volume, test coverage and flexibility, for prototyping, manufacturing, or repairing any type of board. Its vertical architecture is the optimum solution for probing both sides of the UUT simultaneously.
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40-192-012 -
Pickering Interfaces Ltd.
This PXI fault insertion switch uses solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test: Open-Circuit. Short-Circuit between UUT connections. Short-Circuit to external signals. Through relays on each channel enable signals to the UUT to be set open-circuit. Fault Insertion Buses allow any channel to be shorted to any other channel and also enable any channel to be connected to an external signal such as Power, Ignition or Ground to simulate fault conditions. The module is supplied with 2 fault buses.
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7505-K007 -
Chroma ATE Inc.
The Chroma 7505-K007 Thin Film Thickness Automated Optical Metrology System equipped with 3D sensor is suitable for Roll to Roll processing and thin film thickness measurement. The stage embedded with vacuum adsorption function, making soft UUT a flat surface.
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MS 1117 -
Meltronics Systemtech
This system is used to test COMED (Combined Map Electronic Display) IFU cards. This ATE checks the LRU Status and card status and identify faulty component in the individual UUT. On fault, this suggests the possible component failure as diagnostic report, for repairing the cards.
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Marvin Test Solutions, Inc.
With over 20 different chassis configurations, our Smart PXI chassis product line (3U chassis, 6U chassis, 3U/6U chassis) offers the most features, slot configurations, UUT interface options, system power, and embedded / external controller options in the industry.
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Marvin Test Solutions, Inc.
With over 20 different chassis configurations, our Smart PXI chassis product line (3U chassis, 6U chassis, 3U/6U chassis) offers the most features, slot configurations, UUT interface options, system power, and embedded / external controller options in the industry.
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Terotest Systems Ltd.
With over 20 different chassis configurations, our Smart PXI chassis product line (3U chassis, 6U chassis, 3U/6U chassis) offers the most features, slot configurations, UUT interface options, system power, and embedded / external controller options in the industry.
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GX6384 -
Marvin Test Solutions, Inc.
The GX6384 3U PXI multiplexer switch card provides users with the ability to switch and interface tester resources to multiple UUT connections. The card is available in three different configurations, supporting 32 x 2, 32 x 4, and 32 x6 switch configurations.
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50-190-201 -
Pickering Interfaces Ltd.
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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50-190-001 -
Pickering Interfaces Ltd.
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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50-190-101 -
Pickering Interfaces Ltd.
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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50-190-202 -
Pickering Interfaces Ltd.
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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50-190-102 -
Pickering Interfaces Ltd.
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.