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UUT

assures a constituent's interoperability in a system.

See Also: Unit Under Test, DUT, System Under Test


Showing results: 106 - 114 of 114 items found.

  • PXI 5A Fault Insertion Switch 5-Channel

    40-196-101 - Pickering Interfaces Ltd.

    The 40-196 is a 10 Channel 5A Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Shorting relays on each channel enable UUT signals to be subjected to external user applied fault conditions or to be shorted to the adjacent signal in the same channel. Relays in line with the signal allow open circuit conditions to be simulated on either side or both sides of a channel signal pair. The switching topology of the 40-196 allows channels to be interconnected so that complex fault insertion systems can be constructed.

  • PXI 5A Fault Insertion Switch 10-Channel

    40-196-001 - Pickering Interfaces Ltd.

    The 40-196 is a 10 Channel 5A Fault Insertion Switch, primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert different fault conditions between the test fixture and the equipment under test: Open-Circuit, Short-Circuit between signal pairs, Short-Circuit between signal pairs and user applied fault conditions e.g. Power or GND. Shorting relays on each channel enable UUT signals to be subjected to external user applied fault conditions or to be shorted to the adjacent signal in the same channel. Relays in line with the signal allow open circuit conditions to be simulated on either side or both sides of a channel signal pair. The switching topology of the 40-196 allows channels to be interconnected so that complex fault insertion systems can be constructed.

  • OLED Lifetime Test System

    58131 - Chroma ATE Inc.

    The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.

  • Solar ATE

    MS 1534 - Meltronics Systemtech

    The Inverterless ATE is an automatic test equipment which is used to test the all functional and various test conditions of Inverterless Solar Unit. This ATE shall be a GO/NOGO Tester for Inverterless Solar Unit. All production units can be tested with this ATE for functional testing and clearance. This ATE reduces the man effort for quality checks and detects the failure units. The Inverterless ATE can check the UUT with minimum user interactions. It shall test and generate test report in PDF format for the conducted tests with necessary data. The ATE operates on 230V AC power. The ATE has In-Built AC-DC converter which provides 12V DC for operate the unit. Also it has additional AC-DC converter to simulate solar power to the Inverterless units. The main objective of the ATE is to test the Inverterless S in all possible test scenarios without external test equipments and less user interactions.

  • 3-Phase AC Power Source

    61700 series - Chroma ATE Inc.

    The Chroma Programmable AC Power Source model 61700 series delivers pure, 5-wire, 3-phase AC power. Unlike the traditional 3-phase AC power source, it includes low power rating models at very low cost. Users can program voltage and frequency, measure the critical characteristics of the output on its LCD display. It delivers the right solution to simulate all kinds of input condition of UUT to be utilized in R&D and QA. It is also suitable for commercial applications from laboratory testing to mass productions. The 61700 supplies the output voltage from 0 to 300VAC and it can be set individually for each phase. Users also can set the phase angle from 0? to 360?. These kinds of function make the 61700 series can simulate unbalance 3-phase power. Because of the wide output frequency from 15 to 1200Hz, it is suitable for avionics, marine and military application. The AC+DC mode extends the output function to simulate abnormal situation when power line contains DC offset.

  • Display Color Analyzer

    Model 7123 - Chroma ATE Inc.

    Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station

  • LED Power Driver ATS

    8491 - Chroma ATE Inc.

    1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series

  • Cost-Effective ATE System

    PRO RACK ATE - Qmax Test Technologies Pvt. Ltd.

    Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.

  • Combination Board Tester

    ATE QT2256-640 PXI - Qmax Test Technologies Pvt. Ltd.

    Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.

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