Showing results: 226 - 240 of 427 items found.
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Ismeca NY32W -
LTX-Credence
32-position turret platform for semiconductors on film-frame wafer media, providing highest inspection yield. Integrating innovative hardware and software technologies such as intelligent features that enables extended autonomous operation and productivity.
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EC-80 -
NAPSON Corp.
*Easy operation and compact design*Auto-measurement start by inserting a wafer under the probe*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range
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VLSI Standards, Inc.
The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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PVE300 -
Industrial Vision Technology Pte Ltd.
Solar Cell Multi-function SR/QE Testing System is specially designed for Photovoltaic Industry to characterize the Optical Performance of Raw material, process wafer, finished solar cell, as well as small Module.
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SPS 2600, SPS 2800, and SPS 12000 Series -
MicroXact, Inc.
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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VLSI Standards, Inc.
Resistivity Standards are bare silicon wafers available in 3 in, 8 in and 12 in sizes. The silicon is p-type (Boron) doped to nominal resistivity values, from 0.002 ohm.cm to 75 ohm.cm as available on the 3" model.
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Recif Technologies Inc.
Through its SMART and COMPACT automated equipments, RECIF Technologies proposes a complete offer for wafers/substrates atmospheric handling, and provide IC manufacturers with innovative and configurable solutions responding to wafers and frames handling requirements.
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NSX -
Onto Innovation
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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OHSP-660T Series -
Hangzhou Hopoo Optoelectronics Technology Co., Ltd
full-spectrum transmittance measuring instrument (TSM) can measure a very wide range of products, such as: glass lenses, automotive insulation paper, construction insulation paper, glass, lampshades, filters, wafers, LED diffusers, etc...
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CFM25S120-T -
ELMA Electronic, Inc.
AC/DC power supply with 25 W from Cincon | input ranges 90 - 264 VAC | output 12 V | operates in temperature from -30 to +70 °C | class II | wafer version
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CFM25S360-T -
ELMA Electronic, Inc.
AC/DC power supply with 25 W from Cincon | input ranges 90 - 264 VAC | output 36 V | operates in temperature from -30 to +70 °C | class II | wafer version
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Model 646 -
TREK, INC.
Trek’s Model 646 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Model 646 incorporates Trek technology which has demonstrated increases in efficiency and throughput equal to three times that of other supplies. Virtual elimination of sticky wafer and wafer popping issues ensures better control over particle contamination. Given the versatility and performance of the Model 646, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.
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Model 645 -
TREK, INC.
Trek’s Model 645 software-driven Electrostatic Chuck Supply offers an array of features that provide significant benefits while accommodating a variety of demanding applications. Documented use shows that customers have seen increases in efficiency and throughput equal to three times that of other supplies. Additionally, the Model 645 virtually eliminates sticky wafer and wafer popping issues, thus ensuring better control over particle contamination. Given the versatility and performance of the Model 645, it can be used in multiple unique tools/processes, thus eliminating the need to specify a new supply for each unique tool/process in a facility.
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VIXEL-320 -
California Scientific, Inc.
s a wet oxidation system intended for the fabrication of Vertical Cavity Surface Emitting Lasers. It is an atmospheric-pressure oxidation system with in-situ monitoring of oxide aperture formation. It accommodates single wafers of up to 150mm (6? in diameter.