Showing results: 421 - 427 of 427 items found.
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Teledyne DALSA
Teledyne DALSA is one of the world’s foremost pure-play MEMS foundries. We operate over 41,000 sq ft (3800m2) of clean rooms, 24/7, using both 150mm and 200mm wafers. Our comprehensive MEMS toolbox allows us to manufacture in high volume for a wide range of applications.Across many device types, from micro-mirrors for telecommunication, gyro sensors for game controllers, microfluidic devices for miniaturized medical systems, automotive pressure and inertial sensors for automobiles or microphones for smartphones, Teledyne DALSA has delivered high volume MEMS production for innovations that reduce both size and power consumption even as they increase performance.We are ISO/TS 16949 and ISO 14001 registered and RoHS compliant, well equipped and experienced to meet the demanding requirements of customers that serve all the main MEMS markets including consumer, automotive, industrial and biotech/medical.
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SystematIC
On basis of extensive experience in Hall Sensor readout and related intellectual property SystematIC has developed several customer-specific and application-specific Hall IC products.For isolated current sensing at DC and low frequencies the Hall sensing technique is a valuable technique. It allows full integration of the sensor elements (Hall plates) and the readout electronics in standard CMOS technology. SystematIC succeeded in combining the full integration with good accuracy parameters and high bandwidth. With a compact die containing magnetic field sensors and programmable readout amplifiers SystematIC contributed to the customers fully integrated current sensor product.SystematIC did the full integrated circuit development and supported in wafer and final test programming. As a result of cooperation with our customer a current-sensor-IC with low offset, high gain accuracy, low TC's and excellent isolation properties has been released for production.
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SE Series -
Angstrom Sun Technologies, Inc.
Spectroscopic Ellipsometer SE series are advanced models built by Angstrom Sun Technologies Inc. There are many more advantages over reflectometers due to its capability to acquire more set of polarization information at different incident angles spectroscopically. User can select two different data acquisition mode, scanning wavelength by wavelength detecting mode or array based fast detecting mode. Thanks for newly developed, mature array based detecting techniques, advanced data acquisition and processing algorithm, users are able to choose array based systems to have the same precision as scanning single element configurations. When a fast measurement is must, especially for real time in-situ measurement, mapping across big surface like wafers, array based configuration is always recommended. You are always welcome to discuss with us on your applications and we'll ensure the final configuration will meet your needs.
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Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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P200L or P300L -
The Micromanipulator Company
The Micromanipulator P300L 300mm semiautomatic probe station comes standard with features such as single-point ground and integrated thermal chuck plumbing. Built for reliability as well as precision, the P300L features leadscrew – leadnut stage and platen drives, a stainless steel platen with removable front wedge and high stability microscope bridge that supports all high resolution long-working distance microscopes.The P300L ‘s versatile controller supports USB and GPIB communications (configured with proper options). The stage X-Y and platen (Z) are motorized / programmable. Microscope motorized / programmable control is also an option. The system may be controlled via scripts and all popular parametric test analytical prober drivers. An indexing script with user GUI and a Labview VI is provided allowing use of the system right out of the box.Micromanipulator strives to ensure our semiautomatic systems are flexible so that applications like Magnetic sensitivity testing, Probe cards, mmW, Wafer & Board level testing. Once you have developed your testing plan we also have great relationships so we can move you into a fully automatic probe station if needed.Joystick control allows for easy and quick operation when programmability is not required. The joystick intuitively operates the station stage, platen, and microscope for systems so configured.The P300L may be configured with a local dry / shielded / dark environment “Top Hat” for low level or low temperature, frost free probing. Three temperature ranges are supported:Ambient (room temperature) to 300C0C to 300C-55C to 300CThe P300L is the station of choice for a high performance, full capability and cost-effective 300 mm semi-automatic probe station.
