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Waveform

a plot of amplitude over time.

See Also: Sine Wave, Square Wave, Oscilloscopes


Showing results: 1216 - 1230 of 1232 items found.

  • HV AC Voltage Test Systems

    Fivestar HV Testing Equipment Co., Ltd.

    FSHV offers three different types of AC voltage test systems, the conventional type is AC test transformer design, mainly for testing objects of medium & low capacitance products, particularly for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load is inductive (like inductive voltage transformers). Another is AC resonant test systems, according to series resonance circuit XL=XC (2πfL=1/2πfC), by setting F frequency of power supply or L inductance of reactor, generate a pure sinusoidal waveform of the test voltage, and the required input power is only 1/Q. Variable frequency type operates in a frequency range from 20Hz to 300Hz, ideal for field commissioning test of power cables and GIS/GIL. Variable inductance type outputs continuous AC voltage of power frequency (50/60Hz), mainly for factory testing of high and ultra-high voltage cables, power transformers, GIS, etc.

  • Lightning Current Generator

    Shanghai Guantu Technology Co., Ltd.

    The lightning wave impulse current generator is an impulse current generator that generates a simulated lightning current waveform . Its working process is as follows: first, the transformer charges the capacitor bank through the silicon pile, when the charging voltage reaches a predetermined value, the spark gap is triggered, and the capacitor is discharged through the total inductance and total resistance of the circuit. When the resistance is greater than or equal to the critical damping value, a unidirectional impulse current wave is generated in the circuit. When the resistance is less than the critical damping value, an oscillating impulse current wave is generated. The magnitude of the impact current amplitude is related to the circuit parameters. When the capacitance value and charging voltage are the same, the smaller the inductance value, the greater the current amplitude. In order to obtain as much current as possible, a pulse capacitor with a small inductance value is usually selected, and the total length of the connecting line should be as short as possible when arranging the main capacitor, so that the total loop inductance value can be reduced as much as possible.

  • High Voltage 50 Ω Pulse Generator

    TLP-8010A - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/HMM testing*Fast 50 Ω high voltage pulse output with typical 300 ps rise time*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω-configuration*High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 300 ps to 50 ns*1 built-in pulse width: 100 ns*Optional external pulse width extensions 5/10/50/100/200/500 ns using an external pulse width extender TLP-8012A5*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components

  • Electrodynamic Vibration Generator System

    LVD-100KG - Lisun Electronics Inc.

    • Vibration table size: 500*500mm (Other size can be designed) • Vibration: 0~5mm (Adjustable range P-P). Vibration waveform: sine wave (half wave and full wave). Acceleration speed: 0~20g (Adjustable) • Maximum test load Capacity: 100kg • Accuracy: Frequency can be displayed to 0.01 Hz. Precision 0.1 Hz. • Sweep Frequency function (1~600Hz): (Upper frequency, Lower frequency, Time range) It can set real standard arbitrarily to sweep frequency back and forth • Programmable Function (1~600Hz): It can set each segment in 15 segments arbitrarily (frequency/amplitude/time/acceleration), and it can be recycled • Frequency doubling function (1~600Hz): 15 segments multiplied-increase: 1)Low to high frequency 2)High to low frequency 3)Low to high and then to low frequency, it can be recycled • Logarithmic function (1~600Hz), 3 modes of logarithm/can be recycled: 1)Lower to upper frequency 2)Upper to lower frequency 3)Lower to upper and then to lower frequency • Measuring instrument: To display amplitude, acceleration speed and the maximum acceleration speed.

  • Audio Test Software

    Soft Hearts LLC

    1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)

  • 16-Bit Multi-Function With A/D, D/A And Digital I/O Channels CPCI Cards

    GX3232 Series - Marvin Test Solutions, Inc.

    The GX3232 is a multi-channel 16-bit, analog input and output cPCI module, supporting 32 single-ended or 16 differential input channels and four analog output channels. The inputs can be software configured for differential or single-end operation and are sequentially scanned with a maximum aggregate scan rate of 300 kS/s. Three input ranges are software-selectable: ±10 V, ±5 V or ±2.5 V. Optionally, the GX3232 is available with a high voltage input configuration and supports three ranges: ±60 V, ±30 V and ±15 V. The high voltage configuration supports 16 single-ended or 8 differential input channels for high voltage and 16 single-ended or 8 differential inputs for low voltage measurement. Four analog output channels provide software-selectable output ranges of ±2.5 V, ±5 V or ±10 V. The outputs can be updated either synchronously or asynchronously and support waveform generation. Each output can be clocked at rates up to 300 kS/s. A 16-bit digital I/O port is also provided, which supports 16 bidirectional data lines. Note that when used with a TS-700 system only 8 of these digital I/O lines are available at the test system's receiver interface.

  • High Voltage 50 Ω Pulse Generator

    TLP-12010A - High Power Pulse Instruments GmbH

    - High pulse output current up to ±120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical 300 ps rise time- Wafer, package and system level TLP and HMM testing- 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 digital programmable pulse rise times out of: 300 ps to 50 ns (optional)- 1 built-in pulse width: 100 ns- Optional external pulse width extensions from 5 ns to 500 ns using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient software for system control and waveform data management- The software can control automatic probers for fast measurements of complete wafers- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface

  • Basic Power Supply - 80 W Max Output Power

    NGA100 - Rohde & Schwarz GmbH & Co. KG

    The R&S®NGA100 DC power supplies are linear, compact and easy to use in diverse scenarios. All models have excellent readback accuracy with a low-current range for demanding measurements. Data logging, arbitrary waveforms, built-in statistics and remote sensing features make the instruments ideal for various bench applications, such as:- R&D;- Creating IoT low power designs - Manufacturing- Education- General purpose use casesEquipped with a number of different remote interfaces, including USB and Ethernet, R&S®NGA100 DC power supplies are also great for automated tests. The channel fusion feature extends voltage and current range. Get up to 200 V with the R&S®NGA142 in serial mode and up to 12 A with the R&S®NGA102 in parallel mode. Advanced protection functions keep devices connected and power supplies safe.Choose the DC power supply for your use case by selecting the base unit and necessary options in our online configurator. This makes the procedure easy and fully price transparent for fast processing of your order request by our authorized distribution partners. Click "configure and quote" to start your configuration.

  • HBM Verification Tester

    HBM-VT - High Power Pulse Instruments GmbH

    - HBM pulse generator verification tester according ANSI/ESDA/JEDEC JS-001 up to ±10kV- To be used in HBM test and qualification labs for regular pulse generator specification compliance test in order to fulfill lab audit and certification requirements- Fully automatic compliance test and verification of HBM pulse generators regarding ANSI/ESDA/JEDEC JS-001 normative standard at 3 different load conditions: Short Circuit, 500 Ω, and a reference diode at VBR=15 V reverse breakdown voltage, including DC test- Parameter evaluation and verification of the transient HBM current waveforms: Peak Current, Rise Time, Decay Time, Maximum Ringing Current- Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, 8010C, HBM-TS10-A hardware systems in combination with HBM-S1-B (6kV) pulse generators (upgrade on request)- Fully automatic test report generation (PDF)- Electrically floating (no fixed system ground): The HBM loads, current sensor output, USB control interface and the enclosure are electrically floating. There is no limiting system ground which may introduce common-mode interference induced HBM current measurement errors.- Isolated industrial full-speed USB control interface- Isolated power supply derived from USB port- Compact size 126mm x 82.5mm x 44.5mm

  • High Voltage 50 Ω Pulse Generator

    TLP-8010C - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components

  • Ultrasonic Flaw Detector

    MFD800C - Mitech Co., LTD.

    MFD800C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed main product. Unique design, sophisticated manufacturing, convenient operation, powerful function, It takes many advantages in one unit. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module,it can work more than 8 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating way in one body, customer with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.

  • Ultrasonic Flaw Detector

    MFD660C - Mitech Co., LTD.

    MFD660C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed premium product, has a lot of advantages like unique design, sophisticated manufacturing, convenient operation, powerful function. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module, it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways in one body, customers with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.

  • Non Destructive Testing (NDT)

    Keighley Laboratories LTD

    NDT covers a wide group of testing techniques used to evaluate the properties of a material, part, product, weld or system without causing damage. NDT carried out at KLL includes:Liquid Penetrant Testing (LPT) is used for the detection of surface breaking discontinuities on magnetic and non-magnetic metallic materials.Fluorescent and colour contrast penetrants are available to be used in the following methods:-Water washableSolvent removablePost emulsifiableMagnetic Particle Inspection (MT/MPI) is used for the detection of surface breaking and slightly sub-surface (up to 2mm) discontinuities.Bench type crack detectors and portable units are employed producing various waveforms (i.e. A.C, HWDC and induced magnetic flow) to give both circular and longitudinal magnetism.On-site testing is carried out using electro magnetic yokes and permanent magnets producing induced magnetic flow.Ultrasonic Flaw Detection (UT), also known as Ultrasonic Inspection, is used for the detection of volumetric discontinuities in ferrous and non-ferrous products (forgings and castings etc.), and welds in magnetic and non-magnetic materials.UT is capable of penetrating metals, dependent on the material characteristics, up to 10m in length.Some thickness and depth checks can also be carried out using ultrasound.Radiography services are available through sub-contract booked in advance. Notice is required for on-site work.Personnel are available at short notice for in-house or on-site work in the UK and overseas.All inspectors undertaking non destructive testing (LPT, MT/MPI and UT) are qualified to, and meet a minimum of, PCN Level 2.PCN Level 3 supervision is available in-house for LPT, MT/MPI, UT offering consultancy services including procedure writing and commentary, auditing of techniques and Level 3 Supervisor cover.We can assist clients in product qualification, material testing, quality assurance and audit programmes.

  • 120 A High Voltage 50 Ω Pulse Generator

    TLP-12010C - High Power Pulse Instruments GmbH

    - High pulse output current up to 120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)- Wafer, package and system level TLP, VF-TLP and HMM testing- Up to 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)- 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)- The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)- Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient sofware for system control and waveform data management- The sofware can control automatic probers for fast measurements of complete wafers- Combines TLP-12010A and TLP-4010C into one system- Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface

  • COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM

    CVRT-S16 - Vasavi Electronics

    CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.

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