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Showing results: 2791 - 2805 of 3582 items found.

  • Boundary Scan Test

    Test Coach Corporation

    Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.

  • Detector And FPA Testing

    Santa Barbara Infrared, Inc.

    The FPA Test Set (FPATS) interface to the detectors under test (DUT’s) is via a custom pedestal plate which provides both a conductive heat path to both the individual DUT’s as well as the field of view limiting aperture plate. This custom pedestal plate protrudes through the customer provided DUT interface printed circuit board (PCB) and makes physical contact with the rear of the DUT packages and the aperture plate when the FPATS is in the closed position. The pedestal plate is mounted to the ambient source plate and its temperature is actively driven by this subsystem.

  • PXI Simulation Modules For Sensor Simulation

    Pickering Interfaces Ltd.

    PXI simulation solutions for sensor simulation, including PXI Programmable Resistors—ideal for the simulation of resistive sensors and PXI Thermocouple Simulators—these provide multiple low-voltage sources ideal for simulating the operation of a thermocouple. Take a look below for all of our PXI Simulation Solutions, we also offer some of these in PCI format as well . All of our PXI simulation cards are supplied with comprehensive software drivers for Windows® XP/Vista/7/8, Lab Windows / CVI and LabView. The Pickering IVI drivers also fully support National Instruments' Switch Executive.

  • Headphone Test Fixture

    AECM206 - Audio Precision, Inc.

    IEC 60318-4-compliant accessory simplifies earbud and headphone measurement in lab and production environments. The AECM206 Headphone Test Fixture is a dense, robust fixture mounted on a resilient base to isolate ambient noise, which can adversely affect measurement integrity. Equally capable in both R&D and production test applications, it is well-suited for testing circum-aural, supra-aural and intra-concha headphones and earbuds. The AECM206’s high level of acoustic isolation also enables the measurement of noise-reduction performance of ANC (active noise canceling) headphones, as well as the evaluation of hearing protection ear muffs.

  • Pick and Place Test Handler

    Delta MATRiX - Cohu, Inc.

    Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.

  • Servo-Pneumatic Asphalt Testing System

    Atico Export

    All signal conditioning, as well as high-speed data acquisition and control functions are done by the unit and graphically interfaced through CATS, windows based software running on a standard PC. The system is capable of performing the full spectrum of HMA tests: dynamic complex modulus, flow number, flow time, indirect tension, beam flexural fatigue and resilient modulus. These tests are done with the appropriate testing modules. The different testing modules can be obtained after the initial system acquisition at the same discounted price. In addition, guarantees system upgrades in order to meet future standards .

  • Temporary Bonding andDebonding Systems

    EV Group

    Increased demand for applications based on thin wafers and thin microelectronic-substrates result in the need for processing and handling of thin- and ultra-thin substrates during the manufacturing step. Thin substrates in the area of IC manufacturing (like memory, CMOS, 3D-TSV integration or ChipCard applications), power devices (e.g. IGBTs), compound semiconductors (e.g. for high brightness LEDs or RF-power amplifiers), as well as emerging technologies that also involve thin or flexible substrates (MEMS; RFID-tags, flexible displays, etc.) require reliable handling and support techniques in order to ensure safe processing.

  • Develop - Simulate - Validate JTAG / IJTAG based IP

    NEBULA - Intellitech Corp.

    You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.

  • Standard High Speed D/A Converters

    Analog Devices Inc.

    Analog Devices digital-to-analog converter (DAC) portfolio provides solutions for your high speed and precision DAC applications. Thanks to complete data sheets and evaluation boards, as well as broad support among our clock and timing, RF, power management, and op amp portfolios, our DACs can help you reduce time to market and system design costs. A high speed range from 30 MSPS to multi-GSPS, 8- to 16-bit resolution, and a tiny package are just some of the features that make our industry-leading d/a converters stand out.

  • 4-20mA Current Loop D/A Converters

    Analog Devices Inc.

    ADI integrated solutions combine both the D/A converter and driver in one chip to provide the required output directly from the digital domain. Analog Devices’ portfolio of leading industrial D/A converters and drivers provides a range of programmable output ranges from standard 4 mA to 20 mA for current loop communication to ±10 V for actuator control. ADI industrial converters offer considerable control functionality and advanced on-chip diagnostics to maximize system uptime, as well as eliminate the need for costly calibration routines needed by some traditional discrete architectures.

  • Test Compliance

    MX CTS Series - AMETEK Programmable Power, Inc.

    A growing number of electronic products manufactured today have to meet international regulatory requirements for emissions and immunity. This is particularly true for products sold in the European community as well as a growing list of countries in the Far East. The California Instruments MXCTS System provides a cost-effective test solution aimed at verifying higher power product compliance to a number of AC and DC related harmonized test standards. The MXCTS system offers many of the same features and capabilities of the California Instruments CTS Series product line already in use at many EMC labs around the world.

  • Standard Digitizer

    725S Family - CAEN S.p.A.

    The 725S family is a digitizer capable of recording waveforms along with performing advanced algorithms for online digital pulse processing (DPP).  Utilizing DPP Firmware, users can acquire quantitative physical parameters (Integrated Charge, Pulse Shape Discrimination with very fine time resolution, Pulse Height Analysis) as well as read out waveforms with automatic pulse identification and baseline suppression on channel basis (Zero-Length Encoding and Dynamic Acquisition Window). The wide range of DPP algorithms supported by the 725S make it a “must-have” for any type of nuclear physics application.

  • Digitizer

    730S Family - CAEN S.p.A.

    The 730S family is a digitizer capable of recording waveforms along with performing advanced algorithms for online digital pulse processing (DPP).  Utilizing DPP Firmware, users can acquire quantitative physical parameters (Integrated Charge, Pulse Shape Discrimination with very fine time resolution, Pulse Height Analysis) as well as read out waveforms with automatic pulse identification and baseline suppression on channel basis (Zero-Length Encoding and Dynamic Acquisition Window). The wide range of DPP algorithms supported by the 730S family make it a “must-have” for any type of nuclear physics application.

  • Tapered Anechoic Chamber

    Cuming-Lehman Chambers

    It’s nearly impossible to perform VHF/UHF measurements in a rectangular chamber. In the 1960’s Emerson determined that tapering one end of an Anechoic Chamber would cause the chamber to act like an indoor ground reflection range.Tapered Chambers work very well at the lower frequencies. Their design forms a uniform illumination across the test region. The tapered end of the chamber forces the wall images close together forming a source antenna array. Tapered Chambers are usually a less expensive option compared to rectangular antenna measurement chambers or compact ranges.

  • One Core Loop Tester

    East Photonics, Inc.

    DAMUL is an innovative and portable optical power checker accompanying 1-core loop back function. DAMUL can check SFP TX and RX power level by simply inserting SFP into it. If you use UPM (Universal SFP-typed Power checker Module) optionally provided, DAMUL can measure optical power. Also, when using SPM (SFP-typed Power checker Module) optionally provided, DAMUL can identify 18 CWDM wavelengths as well as its power automatically. DAMUL provide users high productivity for optical power checking work on fiber optic systems such as WDM-PON.

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