Filter Results By:
Products
Applications
Manufacturers
Zener Diode
current flow from cathode to anode reverses when zener voltage reached.
See Also: Diode, Laser Diode, Diode Test, Photodiode
- Scientific Test, Inc.
product
Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
-
product
Atlas ZEN Zener Diode Analyser
ZEN50
The Atlas ZEN is ideal for testing Zener diodes (including avalanche diodes), transient suppressors, LEDs and LED strings.
-
product
Semiconductor Discrete Test Systems
QT-4000 Series
Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc.
-
product
Signal Interface
Our signal interface products provide signal conversion and electrical isolation between sensors and other field devices and a control circuit. Intrinsic safety modules add Zener diodes, which limit the amount of electrical energy on intrinsically safe circuits.
-
product
Diode Tester
FEC VF40CM
Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
-
product
Shunt Regulators
These are the standard reference voltage source widely used by the feedback circuits of switching power supplies. Compared to the Zener diode, which is a discrete product, a shunt regulator has much better voltage precision because voltage control is carried out as an IC.
-
product
Programmable Parametric Tester For Discrete Semiconductors
IST-8800
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
-
product
Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
product
Shunt Voltage References
Analog Devices offers a broad line of shunt precision voltage references that combine excellent accuracy and temperature stability with low noise and small packages. These devices operate in a manner that is functionally equivalent to a Zener diode. The bias current must be set higher than the sum of the maximum quiescent current of the voltage reference and the maximum expected load current. Since shunt voltage references are typically biased with a resistor, the voltage reference can operate on a wide range of input voltages.
-
product
Capacitor Leakage Current/IR Meter
TH2689A
Changzhou Tonghui Electronic Co., Ltd.
TH 2689/TH2689A provides max. test voltage: 800v/500v, charge current: 0.5mA─500.0mA( if >100V, the max. power 50W can limit). It is mainly applied in capacitance leakage current, insulation resistance and aluminum electrolysis capacitance anode foil pressure test. Also it can be applied in the confirmation of annihilator, zener diode, neonbulb .etc and leakage current test. Standard Handler interface, stable and rapid test, to reach the sorting effect
-
product
Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
-
product
Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
-
product
Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
