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TEST MANAGEMENT JIRA
QARAJ
QARA – Test Management for JIRA (QARAJ) is an add-on that is used with JIRA to enhance its test management capabilities. It can also be used with QARA Enterprise to track projects and bugs on the same platform, without the need to switch to JIRA. The add-on is available for download on the Atlassian Marketplace.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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Plug-in Test Systems
FAME is the innovative, modular plug-in test system for measuring and testing tasks in protection technology for medium-voltage and high-voltage switchgear. The plug-in test system combines complex switching operations for testing the function of current transformers and voltage transducers, as well as tripping and signal contacts.
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Shock Test Systems
Sanwood Environmental Chambers Co ., Ltd.
Is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and collision test, can perform conventional half-sine wave, post-peak sawtooth wave, square wave and other waveform shock tests.
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ATE Test Systems
IQ’s test systems are designed to meet the requirements of lean production, with a critical attention to the requirements of your production environment. These systems provide high flexibility, exceptional measurement accuracy, fast test speeds, with a small footprint for seamless integration into your manufacturing floor.
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Climatic Test Chamber
HIACC Engineering & Services Pvt. Ltd.
Optimised heating & cooling system offers higher performance & energy efficiency. The test chamber can be customised suiting to different test standards. It comes with larger viewing window, ports for live specimen testing, visual alarm system, improved mobility and smaller footprint.
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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Radio Test Set
CMA180
With its frequency range from 100 kHz to 3 GHz, the R&S®CMA180 is ideal for testing all common analog and digital radio systems. Input levels up to 150 W are no problem for the R&S®CMA180. The flexible internal switching capabilities for the audio and RF paths make the R&S®CMA180 suitable for a wide range of test requirements. Users can configure the internal generators, external audio sources, filters and measurements according to the given application. In the predefined test scenarios for receiver, transmitter and duplex tests, the RF and audio paths are preconfigured. This saves time and eliminates configuration errors for standard test cases.
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TOV Test System
Shanghai Guantu Technology Co., Ltd.
1. Safety protection: traffic light indication status, emergency stop and interlocking of the test product door2. Equipped with a computer, set the TOV power supply parameters through the software interface, and automatically test3. Equipped with alarm function, equipped with emergency brake switch, equipped with safety cover and door switch4. The computer interface displays real-time voltage and current data5. Automatically draw voltage and current waveforms, and can save the waveforms as BMP format pictures, which is convenient for editing experiment reports.6. Automatically record test time, test current, test voltage, etc., and save the recorded data to files7. Installation method: cabinet installation.
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Meter Test Switches
TESCO introduced the original Meter Test Switch in the early 1920’s. Today, TESCO’s line of Test Switches has been redesigned with the intention to combine the best features of tried and proven switching methods with improvements in materials and construction. All of the current carrying parts are bright tin plated to prevent corrosion. Good operating contact is assured on periodic meter tests, even when the switch has been idle for long periods of time in an unfavorable atmosphere.
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S500 Test Solution
The S500 Bench Test Equipment (BTE) is customized to test the Line Replaceable Unit (LRU) to determine the faulty Lowest Level Replaceable Unit (LLRU). Once a faulty LLRU is discovered, a separate application program specifically designed for the LLRU is executed to further isolate the fault.
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Test Type Packages
ProCalV5
ProCalV5 Test Type Packages are designed to support advanced paperless functionality with comprehensive testing and maintenance routines for a full range of complex systems and devices. All Test Type Packages shown below are already built and can be supplied as add-ons to your existing ProCalV5 installation.
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Automated Test Equipment
Our multidisciplinary approach allows us to create functional testers and automated test equipment for a variety of industries. AB Controls provides customized automated test equipment solutions for a wide range of products and instruments including: electronics, laser, electromechanical, optical, semiconductor and chemical.
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Automated Test Equipment
ATE
Frontier Electronic Systems Corp.
The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.
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Manual Test Stands
The Chatillon manual test stands are easy-to-use solutions for force measurement applications.
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Partial Discharge Test
INDIPORT
For medium voltage switchgear - partial discharge test in a few minutes - without shutdown.
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USB Test Hardware
Test stations with USB hardwareHardware control of adapters with USB-I / OFlash and microprocessor programmer
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Bench-top Test Jig
CMF Series
Robust test jig, using a cam-operated horizontal probe plate - self customisation.
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Test Thorn Probe
CX-41
Shenzhen Chuangxin Instruments Co., Ltd.
Test Thorn Probe For testing accessibility in appliances with visibly glowing heating elements.
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Bump Test Machine
Labtone Test Equipment Co., LTD
Bump test systems for electrical products repeating impact testing during transportation
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Dust Test Chamber
CX-SC56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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Automotive Test Platform
ETS-800
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Battery Test Packages
Explorer Technology Group (ETG)
ETG offers a full range of battery test kits which speed and simplify the process of collecting battery test data . This data can then be downloaded and analyzed with the included Winmeter 5.1 Battery Analysis Software, enabling the user to quickly identify batteries that are likely to require preventative maintenance.
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Telecom Test Access
Networked Communication Solutions, LLC
Handheld T1/E1 trouble shooting tool provides the test access capability of a cross-connect panel (DSX), in a small, convenient, handheld package. It saves time often wasted while deciphering test connections on network equipment and simplifies the patch cable selection required for maintenance and installation.
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Universal Test Set
UTS
The Universal Test Set (UTS) is a portable, battery-powered, programmable, ruggedized radio frequency test set designed to validate improvised explosive device (IED) jamming equipment. Our unit is intended to provide an in-field confidence testing for warfighters employing IED jammers prior to departure.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Test System Robotics
With the ever increasing need to provide a fast return on investment of your test solution investment, robot's are becoming more widely accepted as a means of reducing your testing costs. Not only can they be programmed for fast product test, they don't have the normal issues associated with human capital.