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Flat Flex Test Fixtures
Z-AXIS Flex Circuit Test Fixtures are used to connect flex circuits to test equipment. 20,000 plus cycles. Using the Z-Axis Elastomeric Connector Interposer, the connection to the OEM FFC connector becomes permanent and is thereby saved from over-use.
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Battery Module/Battery Pack Test
The battery test system CT3001B and CT3001D provide solutions for battery module/battery pack test with higher current/voltage. They can also be used in situations that batteries are charged/discharged at high rates. Different current/voltage range and channels numbers can be custom made based on the requirement.
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High Temperature Test System
129620A
Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Safety Chamber, Hydrostatic Test
9901HTX-72x24x12
The 6 ft wide by 2 ft deep Hydrostatic Test Safety Chamber, when combined with one of our pump systems, provides a complete hydrostatic test system for testing hose and assemblies or other components requiring pressure testing.
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Safety Chamber, Hydrostatic Test
9901HTX-36x36x15
The 3 ft wide by 3 ft deep Hydrostatic Test Safety Chamber, when combined with one of our pump systems, provides a complete hydrostatic test system for testing hose and assemblies or other components requiring pressure testing.
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Test Device for Bicycle Batteries
ATGF 1500/PBG
The ATGF 1500 is a multifunctional testing instrument for bicycle batteries and accompanying battery chargers. The easy to use ATGF 1500 is suitable for battery systems of Derby Cycle, Gazelle, Simplon and ZEG. est programs: Quick Test, Capacity Test, Recalibration.
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Off-Line Base Test Platforms
To configure your Base Test Platform, the following parts can be added to the 6TL-19 bare half-rack:– Test Rack Manager, to control the test station.– Power Distribution Unit.– Uninterruptible Power Supply– Industrial PC or NI PXI to control the platform– 19’’ Monitor and keyboard with trackball– VPC Mass Interconnect Receiver (6 or 12 slots)– YAV Modules– Accessories: Beacon, Air inlet Pneumatic kit…– Any 19’ Instrument
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MIPI Test Fixtures & Software
The UNH-IOL has been a contributing member of the MIPI Alliance since 2007 and tests all mobile devices looking for MIPI conformance and physical layer testing including C-PHY, D-PHY, DSI, and CSI-2. All UNH-IOL MIPI Test Fixtures and Tools are available to member and non-member companies. Below are just some of the MIPI Solutions we offer. For a full list please visit our MIPI Test Fixtures page.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Suspension Component Test Systems
Acoustic quality, vehicle dynamics and stability, and driver comfort play an increasingly important role in the development of new chassis and suspension systems – both passive and active. Noises in suspension components can cause customer dissatisfaction and lead to high warranty costs and are difficult to diagnose especially on historically-used, noisy hydraulic test rigs. The MB Suspension Component Test Rig (SCTR) enables dynamic simulation of real road excitations and synthesized waveforms, performing industry-standard Force-Velocity and Force-Displacement tests and low speed friction tests, and assessing other NVH and structure-borne noises for comprehensive performance characterization and sound and vibration analyses on a wide variety of chassis components.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Full test development environment
XJDeveloper
XJDeveloper is a graphical application that allows you to quickly and easily set up and run tests on your circuit. With XJDeveloper you can reduce your time to market by reusing your test scripts all the way through the product design process and then in manufacturing.
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Android Test Automation Framework
Selendroid
Selendroid is a test automation framework which drives off the UI of Android native and hybrid applications (apps) and the mobile web. Tests are written using the Selenium 2 client API - that's it! Full compatibility with the JSON Wire Protocol/Selenium 3 Ready.
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PCIe 4.0 Test Platform
PXP-400A
The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Electronic Test & Measurement Consulting
LXI Compliance Testing, Electronic test instrument design and Test system design. IEEE 488, SCPI command sets, Non ASCII command sets, LAN protocols, IVI driver design, Instrument architecture, Measurement throughput and speed optimization.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Digital and Analog Test Sets
Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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Eddy Current Test System
CIRCOGRAPH® Product Family
Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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ATE Test & Engineering Services
We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Electronic Test And Measurement Systems
Summaries, information, & tutorials about electronics test and measurement equipment & techniques.
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Line / Hood Test Equipment
The units will test any length, class, or style of hose in today's market.
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Built-in Performance Test Software
S93898B
The S93898B provides a simple interface to perform the network analyzer performance test.
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Research & Electronic Test Products
he CAL-AV Research & Electronic Test Product line includes Explosive Test Site Range Instrumentation, Illuminated Laser Warning Signs and Special Projects.. Firesets, CDU’s EDU’s, Delay generators, firing panels, and custom instruments. Fiber-optic and computer-control options.
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Capacitance And Tan Delta Test
Bushing Tap Adapter Kit
Bushing Tap Adapter Kit is designed to perform Capacitance and Tan Delta tests on power transformer bushings The kit can b e used with the following ISA Test Set STS 5000 TD 5000 STS 4000 TD 5000 TDX 5000.
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High Temperature Test Clip
- High temperature HT Parrot Test Clips PCS-HT , can be efficiently used at high temperature up to 160° Celsius. Plastic body is HT poly-amide.- High temperature HT Parrot Test Clips PCS-HT , can be used in ovens being connected with the silicone cables.
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Protective Relay Test Kit
PW460
PW460 Protective Relay Test Kit is the comprehensive protection relay testing equipment for all types of protective relays with high accuracy. This relay test kit has in-built output monitoring and recording function and supports testing IEC 61850 digital relay.
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Seaward HV Test Equipment
Experts in High-Voltage Test Equipment Seaward has been designing and manufacturing high-voltage test equipment for over 37 years and continues to innovate and bring the best instruments to the market. Choose from phasing sticks, safe discharge rods, voltage indicators and more.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.