Filter Results By:
Products
Applications
Manufacturers
-
product
Event Detectors
105/106 Series
The 105/106 Series Event Detectors are the most versatile Event Detectors in the product line. These Event Detectors monitor the electrical resistance of up to 128 simple continuity loops, each comprised of single or multiple specimens under test. Each test specimen is continuously monitored while a selectable DC sense current is passed through each channel test-loop; resistance changes exceeding the selected threshold are recorded as an event. Minimum Event Duration, Channel Current, and Threshold Voltage settings can all be independently configured. 105 and 106 Series instruments are electrically identical, with the difference simply that the 105 offers four, 32-channel board slots and the 106 offers only one. Thus the 128-105 is equivalent to four 32-106 Event Detectors.
-
product
GaAs pHEMT MMIC Power Amplifier, DC - 28 GHz
HMC994APM5E
The HMC994APM 5E is a GaAs pHEMT MMIC Distributed Wideband Power Amplifier which operates between DC and 28 GHz. The amplifier provides 15 dB of gain, +29 dBm of saturated output power, and 25% PAE from a +10V supply. With up to +38 dBm Output IP 3 the HMC994APM 5E is ideal for high linearity applications in military and space as well as test equipment where high order modulations are used. The HMC994APM 5E exhibits a positive gain slope from 2 to 20 GHz making it ideal for EW , ECM, and test equipment applications. The HMC994APM5E amplifier I/Os are internally matched to 50 Ohms and is packaged in a leadless QFN 5x5 mm surface mount package.
-
product
4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
-
product
Electrosurgical Insulation Defect Detector
MM513
McGan Technology’s MM513 electrosurgical insulation defect detector is a compact, hand held, battery operated unit that tests the integrity, such as pinholes, cracks or defects, of the insulation of electrosurgical instrument in order to prevent inadvertent tissue burns which may occur during electrosurgical instrument procedures. The integrity of the insulation of electrosurgical instruments can occur over time, through normal surgical use, through the accidental contact with a sharp instrument or the rubbing of the insulation to the point of abrading it. The insulation failure provides an alternate pathway for the current to leave the instrument’s electrode usually beyond the sight of the surgeon which will result in the unintended tissue burn. Using an electrosurgical test equipment maintenance program can greatly reduce the number of these inadvertent burns during electrosurgical procedures.
-
product
Functional Systems
PTE-100
The PTE-100 gives test personnel access to electrical signals for probing, voltage injection, isolation checks, voltage/current and time/frequency measurements, and it offers the ability to analyze hot and loaded circuits, verifying missing, corrupted or present valid signals. Furthermore, the PTE-100 offers the ability to make electrical verification activities more efficient, repeatable and safe, by introducing software controlled test sequences to reduce human errors and guide diagnostic resolution. Break Out Boxes are commonly made in-house and are often specific to a particular project. They are simply designed to multiplex connections between two units and use external instrumentation for signal injection or measurement. The end result is a multitude of tools, difficult to maintain, with limited transportability, providing costly and inefficient operations at the factory or in the field.
-
product
Universal Testing Systems up to 600 kN (135,000 lbf) Force Capacity
5980 Series
5980 Floor Model Testing Systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 100, 150, 250, 400 and 600 kN; and several variations are available to accommodate requirements for both extended travel and extra wide test space.
-
product
Microelectronics - Integrated Solutions
Teledyne e2v HiRel provides microelectronics packaging and products with a full range of packaging solutions from COTS to MIL-PRF-38534 compliant (Class H & K) qualifications. HiRel provides a one stop solution for your microelectronic assembly, evaluation, test and screening requirements. Our MCM packaging technology enable our customers to meet size, weight, power and cost (SWaPC) requirements without a sacrifice in performance. Our numerous certifications including AS9100, ISO 9001, and MIL-PRF-38534 Class H accreditation, all of which are integral factors in our company-wide initiative to deliver high-reliability microelectronic devices that meet our customers' stringent requirements. We are a DOD Trusted Source for Microelectronics Packaging, Assembly, and Test.
-
product
26.5 GHz Single-Mode Lightwave Component Analyzer
N4375E
The new N4375E single-Mode LCA is based on the latest 5222A series network analyzers with 2-port or 4-port configuration. This LCA is the ideal measurement solution for electro-optical components up 26.5GHz electro-optical components, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications. The N4375D is traceable to international standards and provides guaranteed specifications for electro-optical responsively S-parameter measurements in a turn-key solution. In combination with N4691B electronic calibration kit you get fastest setup of your test, so you can focus on developing your components. The new N4375D replaces the industry standard 8703A/B series and supports specified modulation frequencies up to 26.5 GHz at 1310nm and 1550nm source wavelength or individual wavelength with external optical input.
-
product
Next Generation Network Testing
UX400
The VeEX UX400 is the smallest multi-service transport test solution to offer test capabilities ranging from DS1/E1 all the way up to 6x 100G traffic generation, supporting the latest 100G/40G optical pluggable form factors (CFP4, CFP2, CFP, QSFP28, QSFP+, no adapters required). Its modular architecture allows for up to six independent test modules and up to twelve concurrent tests or combinations of tests, including legacy PDH/DSn, SDH/SONET, OTN, Ethernet, Fibre Channel, CPRI/OBSAI, C/DWDM spectrum analysis and more. The platform's software architecture has been developed so that multiple users or scripts are able to access and operate different test modules at the same time, maximizing the use of resources. A battery backup option is available for the portable UX400 platform. Test modules can also operate in a standard 19" rack – the UX400R, when portability or battery operation is not needed.
-
product
Debug Fixture
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
-
product
EBIRST Slave Mode Connection Cable
93-970-301
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
product
EBIRST 68-pin Male SCSI Termination Fixture
93-015-103
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
product
EBIRST 8-pin Male Power D-type Termination Fixture
93-012-103
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
product
Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
-
product
Digital (1kV up) H.V. Insulation Tester
6210A IN (Ranges: 0.5kV, 1kV, 2.5kV, 5kV)
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Four insulation test voltages.● Insulation resistance; auto ranging on all ranges.● Bargraph indicates test voltage; rise and decay can be observed during tests.● Visual and audible warning if external voltage is present.● Fully protected: crow bar.● Carry case.● EEPROM calibration.
-
product
Digital (1kV up) H.V. Insulation Tester
6211A IN (Ranges: 1kV, 2.5kV, 5kV, 10kV)
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Four insulation test voltages.● Insulation resistance; auto ranging on all ranges.● Bargraph indicates test voltage; rise and decay can be observed during tests.● Visual and audible warning if external voltage is present.● Fully protected: crow bar.● Carry case.● EEPROM calibration.
-
product
DPS & PMU
Analog Devices parametric measurement units (PMU) and device power supply (DPS) products provide a flexible range of voltage and current source/measurement capability to meet a wide range of cost-sensitive test application needs. The DPS will source currents to 1.2A and multiple devices can be ganged for even higher power applications.
-
product
Fault Simulation
Concurrent Fault Simulator
TurboFault combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs).
-
product
Logging Software
AMETEK Sensors, Test & Calibration
Our logging software works along with our XP2i gauges and ASM multi-scanners to create digital records of your tests. With the DataLoggerXP, you can record average or live pressure, as quick as once per second. Save the data files directly into industry standard spreadsheets, or as comma separated text files.
-
product
PC-Oscilloscopes
Offer a small, light, modern alternative to bulky benchtop devices. You can now fit a 10 MHz, 100 MS/s instrument easily in your laptop bag! They are perfect for engineers on the move; ideal for a wide range of applications including design, test, education, service, monitoring, fault finding, and repair.
-
product
Portable Manual Probing Station
Model W4.0 x L6.5
This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
-
product
Probe Card
Indexer™
The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.
-
product
Saluki CSA-M Series Signal Analyzer (Benchtop)
Saluki CSA-M series benchtop signal analyzer reaches the frequency from 100 kHz to up to 26.5 GHz with a maximum of 40 MHz analysis bandwidth. It can test signal power, frequency, phase, P-1, TOI, OBW, channel power, spurious, ACPR, CCDF, SEM, EVM, and other indicators.
-
product
SNMP Network Simulator
SimpleAgentPro
SimpleSoft's simulation tools enable management application vendors to develop, test, and demonstrate their applications without requiring real devices. SimpleAgentPro® is a SNMP Agent Simulator with an easy to use GUI that can simulate an entire network of LAN-WAN components made up of thousands of SNMPv1,SNMPv2C and SNMPv3 manageable devices.
-
product
TV generator PAL-SECAM-NTSC
TRF498
TV generator TRF-498 provide high quality test patterns and signals according to PAL, SECAM and NTSC. You can select from 64 standard patterns and 5 user configurable patterns in 4:3, 14:9 or 16:9 format (50 or 60 Hz, interlaced and non-interlaced mode).
-
product
Upconverters
Atlantic Microwave Converters are designed for Satcom test applications that offer a cost-effective solution for converting from L-band to all common Satcom uplink frequencies. All models incorporate fundamental frequency phase locked oscillators and double balanced mixers and can be remote mounted with DC supplied on the L-band RF input.
-
product
Vector Network Analyser
LA19-13-02
The LA19-13-02 is a PC-driven Vector Network Analyser suitable for measuring a wide range of devices from 3 MHz to 3 GHz with 100 Hz resolution. Its full s-parameter test set includes bias-Ts for biasing active devices. It is housed in a small lightweight package making it very portable.