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Showing results 4561 - 4575 of 4647 products found.

  • Pulse Adapter

    CV30P650 - Frothingham Electronics Corporation

    The CV30 P650 test station is currently the highest voltage pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. The CV30 P650 pulse adapter can produce a maximum current of 100A at up to 600V using exponential pulses up the 10/1000 waveform. The pulser is rated at 30KW from 300V to 650V. Voltage compliance at 100A is 600V. The station can also include all of the usual FEC200 tests in the same test program.

  • Gem Refractometer

    FuZhou Auyat Optoelectronic Technology Co.,Ltd.

    Gem tester refractive index is one of most important optical parameter. Gloss of gem can be estimated by the parameter. The kinds of gem can be precisely determined in accordance with the measured value of refractive index because every kind of gem has its inherent refractive. Besides, index of double refraction can be also measured. Through the parameter you can judge whether a gem is uniaxial or biaxial photopositive or photonegative. The gemological refractometer is characterized by small volume and less weight. It is easy to carry. It is a popular instrument used in jewelry market.

  • Post Silicon Validation Solutions

    Test Evolution Corporation

    Post-silicon validation (PSV) of first silicon tends to be an ad hoc process, stitching together protocol testers from various manufacturers to create test cases and debug issues. While IC’s are getting to market, the process is far from ideal. Leveraging the tools and methodology of pre-silicon verification into post-silicon validation is a key enabler to higher productivity. Test IP-based PSV is a paradigm shift from the way post-silicon validation is currently done. Individual protocol testers, scopes, miscellaneous equipment from various vendors, and on-chip logic are cobbled together in an attempt to create meaningful stimulus, response checking, and debugging.The problems with these ad hoc solutions:Protocol boxes from multiple vendors generally do not work together well. Each has its own driver software, programming model and debugging tools.Tool flows from pre-silicon to post-silicon to production and back are nonexistent. This makes writing tests challenging and thus generally limited in robustness. Also, debugging suspected problems is difficult across more than one interface.

  • Bluetooth Measurement Application, Multi-Touch UI

    N9081C - Keysight Technologies

    The Bluetooth measurement application is one in a common library of more than 25 measurement applications in the Keysight X-Series, an evolutionary approach to signal analysis that spans instrumentation, measurements and software. Transforming the X-Series signal analyzers into standard-based transmitter testers, the application provides fast, one-button RF conformance measurements to help you design, evaluate, and manufacture your Bluetooth RF transmitters. The measurement application satisfies the test conditions defined in the Bluetooth Core Specifications to help verify your Bluetooth design with confidence while supporting manufacturing with a single application covering Basic Rate, EDR and Low Energy technologies.

  • CANBUS OBD ECU Simlator

    mOByDic1610 - Ozen Elektronik Inc.

    The CAN BUS multiple ECU simulator provides a professional OBD development platform which allow the user to test the OBD functionality on the table. Simulates 4 differnt ECUs. reading VIN and suspended DTC is possible . Using 5 potensiometer , 5 live data can be changed and some fixed PID values are provided. Pressing DTC bouton the trouble codes are generated and the MIL LED is ON. Service 4 commands clear the DTCs and the MIL LED. Connection to the tester is provided via a J1962 female OBD port . it needs an external 12 V power supply . More information you can get from the corresponding chipset datasheet.

  • Battery test series

    Wuhan NANR Electric Co,. Ltd

    DC system comprehensive test instrument meet the state relevant requirement of the dc power supply operation and maintenance regulations, it was developed and researched according to many years of research results and experiences in field operation, and also was comprehensive domestic and foreign advanced technology. The device can realize the inspection and test in different capacity of the charger and battery capacity, and also can accurately test the voltage regulation accuracy, precision of steady flow, the ripple coefficient, the efficiency value, ac input value 1-25 harmonic and discharge capacity of substation dc power supply system, at the same time, it is equipped with dc power comprehensive tester data analysis software, can variously analysis the measurement data uploaded to the computer.

  • DIELECTRIMETER

    SEFELEC

    A DIELECTRIMETER IS A COMBINATION OF 2 EQUIPMENTS DEDICATED FOR 2 FUNCTIONS - a megohmmeter, made to measure insulation resistance, high resistances - a hipot tester to make a high voltage test (also called dielectric strength test, hipot test, hi-pot test, breakdown test or flash test) The dielectrimeter can do automatically and successively those 2 above tests, as hipot then megohm, megohm then hipot, or megohm then hipot then megohm again. This last test is the ideal one, which ensures that the high voltage test has not been damaging anything on the device under test.

  • Copper Test Solution

    DSX CableAnalyzer™ Series - Fluke Networks

    The DSX CableAnalyzer Series copper test solution enables testing and certification of twisted pair cabling for up to 40 Gigabit Ethernet deployments and will handle any cabling system whether it is a Cat 5e, 6, 6A, 8 or Class FA and I/II. Certifying a cable is one part of a process that starts with system design and ends with system acceptance. The faster that process goes, the more profitable you'll be. Unfortunately, there are a lot of things that slow the process down setting up the tester incorrectly, testing to the wrong limits, waiting for skilled technicians to analyze and troubleshoot failures, misinterpretation of results, and producing test reports that customers cannot understand.

  • Current Loop

    FUSE BUDDY - Electronic Specialties Inc.

    *Blowing fuses? Get the Fuse Buddy. *Can test circuit current up to 20 Amps. *Clever design allows for easy connection into fuse sockets. *Four models, Fuse Buddy Tester and Fuse Buddy DMM Adapter, for both Mini & ATC fuses *Fuse Buddy ends are molded into the shape of the fuse itself. *During testing the fuse is removed and replaced into the Fuse Buddy. This way, the circuit being tested maintains fuse protection. *The Fuse Buddy stays put and won’t fall out of the socket, like test probes do. *Can even be used to test for parasitic drains!

  • DC Ground Fault Locator

    SAT-JD200 - Shaanxi Aitelong Technology Co., Ltd

    SAT-JD200 DC Ground Fault Locator is applicable for any voltage in DC system, provided high accuracy clamp, to process multiple signals efficiently and increase detecting range and anti-interference capacity, to display the insulation level of the tested circuit branch in the forms of insulation index and wave, to indicate the relative ground point direction of the testing point. The users can customize an equipment with a proper insulation alarm threshold value within the insulation alarm threshold value limit according to requirement, only need to correspond the clamp meter gear with the measuring range on the tester so as to accomplish the direct ground testing or insulation level analysis.

  • Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

    GX5295 - Marvin Test Solutions, Inc.

    The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • Ferroelectric Test System

    LCII - Radiant Technologies, Inc.

    Precision LC II is an affordable Ferroelectric Tester for research labs. This system offers 5Khz at 9.9V and also comes in a built in 10V, 30V, 100V, and 200V option. This unit can also be expanded to 10kV for bulk ceramic testing. Vision Software is provided with the LCII Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choose from.

  • Discrete Semiconductor Test System

    201 Series - SemiTek International

    The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required. Under program control, the 201.net tests a growing number of devices including: * Diodes / Zeners * Bipolar Transistors * Field Effect Transistors * Arrays * MOSFET * MOSFET Depletion * Optocouplers * JFet / JFet NO * Mechanical Relays * Sidac * Triac / SCRs * IGBT

  • Electron Beam Array Test

    AKT® - Applied Materials, Inc.

    The AKT Electron Beam Array Test (EBT) system provides dynamic pixel and TFT characterization and functional tests of flat panel matrix in mass production. With minimal mechanical motion and field proven AKT PECVD systems technology, the AKT EBT TFT array tester realizes high-throughput, high-reliability, low scheduled down time and low running cost. The AKT-15K EBT, AKT-25K EBT and AKT-40K EBT feature fast, large area beam positioning, multi e-beams testing in parallel, high-throughput yields especially with larger size TFT-LCD displays for flat panel television.

  • Equipment Level Intergration

    TechSAT GmbH

    Integration and verification on equipment level remain a time-consuming challenge because the technological and normative requirements are extensive. To meet this challenge, we offer our customers the MAYA family, an ADS2-based technology platform based on which equipment-specific test systems can be quickly supplied. The MAYA family allows us to utilize the worldwide proven technology of our large-scale test benches also in compact and modular desktop systems with equipment-specific interfaces and breakout panels. This design keeps preparation and training of equipment developers or testers short so they can quickly start working on the target system.