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  • System-Level Interconnect Solution For ScanExpress Boundary-Scan Tools

    ScanExpress Merge - Corelis, Inc.

    Combine Multiple Assembly Test Files Corelis ScanExpress Merge, a member of the ScanExpress suite of boundaryscan test tools, is a software application designed to import and join test files for multiple independent assemblies and assist in configuration of a combined test procedure.Using completed ScanExpress TPG test files and module interconnection data, ScanExpress Merge quickly combines combined test plan files for system testing with minimal user effort.

  • 100 MHz 32-CH High-Speed Digital I/O Card

    PCIe-7360 - ADLINK Technology Inc.

    ADLINK's PCIe-7360 is a high-speed digital I/O board with 32-CH bi-directional parallel I/O lines. Data rate up to 400 MB/s is available through the x4 PCI Express® interface. Clock rate can support up to 100 MHz internal clock or 200 MHz external clock, ideally suiting applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.

  • Test Fixtures

    MG Products

    Because of the miniaturization of modern electronics , it is important to ensure quality and care with electrical testing. Reliable electrical contact between the test equipment and the testobject (UUT , Unit Under Test) is essential. Specifically for these tests MG Products has developed a series of linear test adapters ( textfixtures ) the MG series. The reliability and accuracy of a contact test adapter is strongly determined by the mechanical construction. Therefore MG Products uses solid aluminum parts.

  • Video Test Generator

    802BT - Teledyne LeCroy quantumdata

    The 802BT is our multi-media video signal generator for testing CRTs, flat panels, projectors and TVs including HDTV. The 802BT is optimal for DTV, digital and analog displays and allows production and engineering users to create the most complex test images. You get the flexibility required to meet a tough production budget with the wide range of outputs the 802BT offers. And a PCMCIA slot makes it easy to copy one generator to another.

  • Software

    TFT Test Systems - Materials Development Corporation

    Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.

  • Thermal Resistance Spectroradiometeric System for LED

    TRS-1000 - Lisun Electronics Inc.

    Thermal parameter is the key index to evaluate the quality of LED. Different temperature will have significant different effects on optical parameters, color parameters, electricity parameters and life of LED. Therefore, design and control of the thermal dissipation are the most important thing for the manufacturers and users. Referring to the relative international standard, TRS-1000 could conduct integration testing on optic, color, electricity and thermal, meanwhile record the changing curve of the parameters at real time.

  • Turbidity / Chlorine

    Sper Scientific

    Turbidity (undissolved solids) is an important measure of water quality in environmental testing, wastewater, petrochemical, beverage industry, and electroplating. Water chlorination is the process of adding chlorine (Cl2) to water as a method of water purification to make it fit for human consumption as drinking water. Sper Scientific offers Turbidity and Chlorine meters that meet the EPA method 330.5 for waste water and standard method 4500-CI G for drinking water and the ISO 7027 standards.

  • UV-A LED Panel Flood Lamps

    PowerMAX™ 365 Series - Spectronics Corp

    PowerMAX 365 Series flood lamps feature a panel of 16 powerful UV-A (365 nm) LEDs specially engineered for non-destructive testing applications. These versatile, stationary light sources can be installed overhead or in-line, and can be ganged together to provide an even wider coverage area. UV-A LED panel flood lamps are also available in two standard-intensity models that are designed for NDT inspection applications requiring limited UV-A output.

  • Transformer Analyzer

    505 - Radian Research, Inc.

    The UTEC 505 Transformer Analyzer is designed for testing current transformers (CT) and potential transformers (PT) without interruption of the customer’s service. This instrument measures CT admittance, CT ratio, CT primary-to-secondary phase angle and the voltage, current and phase angle of the service. With the ‘Burden CT/PT Option’, it determines the CT secondary burden capability, the regulation of the PT and its secondary burden capability and provides for CT core demagnetization.

  • Veracode Analysis Center

    Veracode

    Innovating through software holds many promises, but it can also create some major operational headaches. Without a holistic approach to application security, teams often lose valuable time onboarding, learning, and managing multiple AppSec tools that don't “play well” together. Various testing methods, metrics, and dashboards provide incomplete views of activity, and security teams often struggle to maintain control and understand overall risk.

  • Software Test Framework for LabVIEW

    VI Tester - JKI

    VI Tester is a software test framework for LabVIEW that allows software developers to test their LabVIEW code (VIs). Software testing is a critical component of agile development and test driven development processes and is also critical for validating software functionality. VI Tester is based on the industry standard xUnit software test architecture that is used in many other programming languages. This architecture is very flexible and powerful, but also very easy for beginners to learn.

  • Logic Analyzer Probe

    FS2520 - FuturePlus Systems

    The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.

  • Image Sensor Test System

    IP750 - Teradyne, Inc.

    Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.

  • Matrix Switches

    SMX-4XXX (Matrix Switches) - AMETEK VTI Instruments

    The VTI SMX-4xxx Series of matrix cards deliver exceptional performance and reliability by implementing extensive signal path shielding, isolation and built-in health monitoring. Available models with software configurable switch subsystems increase flexibility and help control costs by allowing a single module to be used for different testing requirements. Embedded virtual schematic control further simplifies setup and debugging, allowing all relays to be engaged independent of application software.

  • Antenna Test Chamber

    Comtest Engineering bv

    Comtest provides Antenna test ranges fully covered with microwave absorbers for both near-field and far-field measurements. Because we always strive for new solutions, our R&D department developed our ‘Javelin Tip’ polystyrene absorbers. The enhanced material composition and altered shape, lead to improved performance and cleaner working space, enabling you to make high precision antenna testing fast, reliable, and worry-free.

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