Showing results: 7921 - 7935 of 8450 items found.
-
PZ2121A -
Keysight Technologies
The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
-
ATS3000A -
Astronics Corporation
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
-
326 -
STAR-Dundee
The SpaceWire Brick Mk3 is a USB 3.0 (also works with USB 2.0 and USB 1.1) to SpaceWire interface device that is suitable for use in all stages of SpaceWire equipment development: initial SpaceWire evaluation, instrument simulation, control system simulation, unit testing, integration support, and EGSE. The SpaceWire Brick Mk3 provides two SpaceWire interfaces, support for high speed data transfer, the capability to inject various types of errors on demand, the ability to transmit and receive time-codes and act as a time-code master, and comes complete with highly optimised host software for low latency transmission of SpaceWire packets directly to and from the host PC.
-
66311B -
Keysight Technologies
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66311B mobile communications DC source provides fast transient, exceptional sourcing, and precision measurement.
-
LXinstruments GmbH
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
-
784192-01 -
NI
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
-
784191-01 -
NI
4 TB, 6-Drive, PXI Data Storage Module - The HDD‑8261 in-chassis PXI Express high-speed data storage module features an onboard PCI Express SATA controller. The module fits into a PXI Express chassis, and it occupies only three PXI slots. With the HDD‑8261, you can choose between hard-disk drives (HDDs) or solid-state drives (SSDs) for increased ruggedness. It is ideal for field testing or signal recording applications. You can use this module to not only stream high-speed data, but also to easily move data between multiple test setups or supplement the PXI system controller’s storage capacity.
-
215 -
Elcometer Limited
Memory stores up to 260,000 readingsIdeal for testing for powder or liquid coatings in batch or conveyor ovensVariable measurement interval, date, time, °C / °FHigh temperature resistant teflon coated probe cables are easy to clean after each runQuick display shows maximum temperature, Cure-Index figure and pass/fail for each probeMeasure up to 6 different temperatures at one timeIdeal in situations where powder coated thickness is inconsistentStart and stop logging at a pre-set temperatureLarge menu-driven display for easy operationPrint full colour report directly to any HP printerUSB data output to ElcoMaster® software and combine with other key inspection measurements
-
ScanDIMM -
Corelis, Inc.
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
-
Shanghai Beha Electronics Co., Ltd.
*This is a variable high voltage insulation tester from 500V to 15kV in 500V steps.*The is menu driven and uses Dynamic Current Auto ranging technology.*It has a Bar-Graph which displays the voltage stressing the insulation while the test is in progress and the voltage decay during the automatic discharge of the tested circuit.*The top line of the display shows the elapsed time at the start of the test. Digital readout of the total time will remain displayed even after testing has ceased.*A 4-digit display (2000 counts) is showing the actual insulation resistance.*This instrument displays a voltage warning and sounds when AC or DC is present before injecting the test voltage.
-
Siama Systems, Inc.
GENEM-C is a high-capacity network infrastructure testing software application for network equipment manufacturers, data centers, service provider telco cloud and 5G backhaul. It runs on the PROVA-C hardware appliance that is built on BittWare. GENEM-C allows you to verify, monitor and troubleshoot Ethernet/IP network equipment and data center applications to ensure network services can accommodate the demands of your customers. Ideal for QA test, Service Providers migrating to a DevOps model can use GENEM to validate service turn-up and modifications in the production network. GENEM is equally at home in a lab environment. It bundles wire-rate traffic generation and analysis capabilities with a network emulator and packet capture/replay function in a single software license.
-
FLIR ADK™ -
Teledyne FLIR
The FLIR ADK is a cost-effective way to develop the next generation of automotive thermal vision for advanced driver assistance systems (ADAS) and autonomous vehicles (AV). Thermal infrared cameras are the best sensor technology for pedestrian detection and provide the critical data needed to improve automated decision making in vehicle safety functions including automatic emergency braking (AEB). The ADK’s rugged, IP67 rated enclosure incorporates a heated window for all-weather driving. With the GMSL, USB, and FBD-Link interfaces and drivers available form Teledyne FLIR, installation and testing is plug-and-play easy. Interested in a thermal vision enhancement system for today’s vehicles, please see PathFindIR II.
-
Sample Technology
Aiming at the problem of PI, Shengbo Technology carefully studied the root cause of the problem. Through the loop analysis and noise analysis of power supply and automatic control, it provided targeted solutions for frequency response analyzer and power supply rejection ratio (PSRR) analysis . In addition, we also have a professional technical application support team in the field of power electronics testing. We can customize and develop the corresponding system software for customers so that it can be applied to PC / Servo / Telecom power supplies, adapters and chargers, and backlights. Inverter, LED drivers, ballasts for energy-saving lamps (Ballast), and even UPS, PV Inverter, electric vehicle chargers, AC and DC motors, etc.
-
A.H.Systems, Inc.
For many years most standards called for the use of a half-wave dipole antenna set for frequencies above 80 MHz. However, to reduce test time, broadband antennas such as the biconical antenna and log periodic antennas began to be accepted. Broadband antennas, compared to half wave dipoles, reduce test time because the technician did not have to stop the test to adjust the dipole antenna for each frequency. A.H. Systems'' 7 models of Biconical Antennas operate efficiently over the frequency range of 20 MHz to 18 GHz. Suitable for FCC, MIL-STD, VDE, TEMPEST, and immunity testing, each Biconical antenna will provide reliable, repeatable measurements.
-
IDPS750 -
Salland Engineering
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
