Barth Electronics, Inc
Barth Electronics, Inc. is a high technology company specializing in designing and manufacturing “state of the art” sub-nanosecond high energy, pulse power instrumentation.
- 702-293-1576
- 702-293-7024
- beisales@barthelectronics.com
- 1589 Foothill Drive
Boulder City, NV 89005
United States
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Low Voltage Attenuator
2-20
Take advantage of excellent attenuators at a low price. These low voltage units have excellent microwave characteristics and are ideal as an inexpensive low voltage unit for use with our 142 series high voltage precision attenuators while still providing a very respectable and clean 20 ps output risetime.
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High Voltage Pulse Attenuators
Barth High Voltage Pulse Attenuators are matched impedance coaxial attenuators for use primarily in pulsed 50 ohm systems, or where occasional transients would damage ordinary units. The attenuator design closely matches the impedance around each resistor, to that resistor. These attenuators feature an input impedance very close to 50 ohms, with characteristics as good or better than most microwave attenuators. These units are ideal for use in nuclear and high energy experiments. Extensive testing during manufacturing insures very high reliability for single-shot experiments. A voltage coefficient of the resistive film of less than .0001 %/V allows low voltage calibration of most systems.
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ESD Device Testing
Barth Electronics, Inc. offers complete ESD Testing to the semiconductor industry. Nothing is outsourced – all testing is performed at our factory in Boulder City, Nevada.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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HMM+™ Tester
Model 4702
The Model 4702 HMM+™ is a completely new tester primarily intended for device level testing and produces a current waveform as specified in the IEC-61000-4-2, from a 50 ohm source impedance system.*This tester provides device level test data that allows users to evaluate the IEC current waveform protection level of their devices. We included failure identification by leakage current increases in the 4702 tester so precise pass/failure levels can be closely measured.*The 4702 HMM+™ provides a new and improved test connection method for making quantifiable and repeatable device level HMM measurements.*Convenient, precise, repeatable operation*Computer controlled for automated testing
