Function Tester with Low Number of Channels
UTP 6010 RF - NOFFZ Computer Technik GmbH
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.
The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).
Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.