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Combined Map Display Unit & Interface Unit Tester (COMED)
MS 1117 - Meltronics Systemtech
This system is used to test COMED (Combined Map Electronic Display) IFU cards. This ATE checks the LRU Status and card status and identify faulty component in the individual UUT. On fault, this suggests the possible component failure as diagnostic report, for repairing the cards.
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Break In Break Out Box
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Engine Simulator
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Interface And Load Box
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Mission Data Programmer
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Power Bus
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SCT IFCC Self Test Box
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Single Channel Tester
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UNA Programmer
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WCS Simulator
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9U ATE Rack
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