![In-Circuit Testing and Test Engineering](https://d27wgn5g4t3wja.cloudfront.net/img/a0020dcc-baf1-a825-225a-e3792e8dde7c/150297.png)
In-Circuit Testing and Test Engineering
GenRad 2287 - Datest
3560 Hybrid Test Nodes
Windows Interface
Total GenRad 227X Migration Capability
20 Mhz Clock, Sync, and Trigger, 5 Mhz data rates
Vector Test for VLSI, PLCC’s & ASICS
Test Express Vectorless Testing
Multiple Chain Boundary Scan
Analog Functional Test Module